会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明申请
    • Processes and systems for laser crystallization processing of film regions on a substrate utilizing a line-type beam, and structures of such film regions
    • 使用线型光束的衬底上的膜区域的激光结晶处理的工艺和系统,以及这些膜区域的结构
    • US20070010104A1
    • 2007-01-11
    • US11373772
    • 2006-03-09
    • James ImPaul van der Wilt
    • James ImPaul van der Wilt
    • H01L21/00
    • H01L21/02686C30B13/24C30B35/00G21K5/02G21K5/10H01L21/02678H01L21/2026H01L27/1285H01L27/1296H01L29/04
    • Process and system for processing a thin film sample, as well as at least one portion of the thin film structure are provided. Irradiation beam pulses can be shaped to define at least one line-type beam pulse, which includes a leading portion, a top portion and a trailing portion, in which at least one part has an intensity sufficient to at least partially melt a film sample. Irradiating a first portion of the film sample to at least partially melt the first portion, and allowing the first portion to resolidify and crystallize to form an approximately uniform area therein. After the irradiation of the first portion of the film sample, irradiating a second portion using a second one of the line-type beam pulses to at least partially melt the second portion, and allowing the second portion to resolidify and crystallize to form an approximately uniform area therein. A section of the first portion impacted by the top portion of the first one of the line-type beam pulses is prevented from being irradiated by trailing portion of the second one of the line-type beam pulses.
    • 提供了用于处理薄膜样品的方法和系统,以及薄膜结构的至少一部分。 辐射束脉冲可以被成形为限定至少一个线型束脉冲,其包括前导部分,顶部部分和尾部部分,其中至少一个部分具有足以至少部分地熔化膜样品的强度。 辐射薄膜样品的第一部分以至少部分地熔化第一部分,并允许第一部分重新凝固并结晶以在其中形成大致均匀的区域。 在照射第一部分薄膜样品之后,使用第二种线型束脉冲照射第二部分以至少部分地熔化第二部分,并允许第二部分重新凝固并结晶以形成近似均匀的 区域。 由第一线路型光束脉冲的顶部部分影响的第一部分的一部分被第二线路型光束脉冲的后部部分照射。
    • 3. 发明申请
    • Method and system for facilitating bi-directional growth
    • 促进双向增长的方法和系统
    • US20070010074A1
    • 2007-01-11
    • US11372161
    • 2006-03-09
    • James Im
    • James Im
    • H01L21/36B23K26/08
    • H01L21/02686H01L21/02532H01L21/0268H01L21/02691H01L27/1285H01L27/1296H01L29/04
    • A method and system for processing at least one portion of a thin film sample on a substrate, with such portion of the film sample having a first boundary and a second boundary. One or more first areas of the film sample are successively irradiated by first beamlets of an irradiation beam pulse so that the first areas are melted throughout their thickness and allowed to re-solidify and crystallize thereby having grains grown therein. Thereafter, one or more second areas of the film sample are irradiated by second beamlets so that the second areas are melted throughout their thickness. At least two of the second areas partially overlap a particular area of the re-solidified and crystallized first areas such that the grains provided in the particular area grow into each of the at least two second areas upon re-solidification thereof.
    • 一种用于在衬底上处理薄膜样品的至少一部分的方法和系统,其中膜样品的这些部分具有第一边界和第二边界。 膜样品的一个或多个第一区域被照射束脉冲的第一子束连续地照射,使得第一区域在其整个厚度上熔化并使其再固化和结晶,从而使晶粒生长在其中。 此后,膜样品的一个或多个第二区域被第二子束照射,使得第二区域在其厚度上熔化。 第二区域中的至少两个部分地与再固化和结晶的第一区域的特定区域重叠,使得在特定区域中提供的颗粒在其再固化时生长到至少两个第二区域中的每一个中。
    • 4. 发明申请
    • Process and system for laser crystallization processing of film regions on a substrate to provide substantial uniformity within arears in such regions and edge areas thereof, and a structure of film regions
    • 用于基板上的膜区域的激光结晶处理的工艺和系统,以在这些区域和边缘区域内的区域内提供基本的均匀性,以及膜区域的结构
    • US20060060130A1
    • 2006-03-23
    • US10525283
    • 2003-08-19
    • James Im
    • James Im
    • C03B13/06H01L21/324
    • H01L21/02686B23K26/066B23K26/067G03F7/70041G03F7/70725H01L21/02678H01L21/2026H01L21/268H01L27/1285H01L27/1296H01L29/78675
    • A process and system for processing a thin film sample, as well as the thin film structure are provided. In particular, a beam generator can be controlled to emit successive irradiation beam pulses at a predetermined repetition rate. Each irradiation beam pulse may be masked to define a first plurality of beamlets and a second plurality of beamlets. The first and second plurality of beamlets of each of the irradiation pulses being provided for impinging the film sample and having an intensity which is sufficient to at least partially melt irradiated portions of the section of the film sample. A particular portion of the section of the film sample is irradiated with the first beamlets of a first pulse of the irradiated beam pulses to melt first areas of the particular portion, the first areas being at least partially melted, leaving first unirradiated regions between respective adjacent ones of the first areas, and being allowed to resolidify and crystallize. After the irradiation of the particular portion with the first beamlets, the particular portion is again irradiated with the second beamlets of a second pulse of the irradiated beam pulses to melt second areas of the particular portion, the second areas being at least partially melted, leaving second unirradiated regions between respective adjacent ones of the second areas, and being allowed to resolidify and crystallize. The first irradiated and re-solidified areas and the second irradiated and re-solidified areas are intermingled with one another within the section of the film sample. In addition, the first areas correspond to first pixels, and the second areas correspond to second pixels.
    • 提供了一种用于处理薄膜样品的方法和系统,以及薄膜结构。 特别地,可以控制光束发生器以预定的重复率发射连续的照射光束脉冲。 每个照射束脉冲可以被掩蔽以限定第一多个子束和第二多个子束。 每个照射脉冲的第一和第二多个子束被提供用于冲击薄膜样品并且具有足以至少部分地熔化薄膜样品部分的照射部分的强度。 用所述照射束脉冲的第一脉冲的第一子束照射所述膜样品的所述部分的特定部分,以熔化所述特定部分的第一区域,所述第一区域至少部分地熔化,从而在相邻的相邻区域之间留下第一未照射区域 第一个地区,被允许重新确定和结晶。 在用第一子束照射特定部分之后,特定部分再次用照射束脉冲的第二脉冲的第二子束照射以熔化特定部分的第二区域,第二区域至少部分地熔化,留下 在相邻的相邻的第二区域之间的第二未照射区域,并被允许再凝固和结晶。 第一次照射和再固化的区域以及第二次照射和再固化的区域在膜样品的部分内彼此混合。 此外,第一区域对应于第一像素,第二区域对应于第二像素。
    • 5. 发明申请
    • Single scan irradiation for crystallization of thin films
    • 单扫描辐射用于薄膜结晶
    • US20050235903A1
    • 2005-10-27
    • US10944350
    • 2004-09-17
    • James ImPaul van der Wilt
    • James ImPaul van der Wilt
    • C30B1/00C30B3/00C30B5/00C30B13/24G03F7/20H01L20060101
    • C30B35/00B23K26/066C30B13/24C30B28/08G03F7/70041G03F7/70725Y10S117/90Y10T117/10Y10T117/1008
    • A method of processing a polycrystalline film on a substrate includes generating a plurality of laser beam pulses, positioning the film on a support capable of movement in at least one direction, directing the plurality of laser beam pulses through a mask to generate patterned laser beams; each of said beams having a length l′, a width w′ and a spacing between adjacent beams d′, irradiating a region of the film with the patterned beams, said beams having an intensity that is sufficient to melt an irradiated portion of the film to induce crystallization of the irradiated portion of the film, wherein the film region is irradiated n times; and after irradiation of each film portion, translating either the film or the mask, or both, a distance in the x- and y-directions, where the distance of translation in the y-direction is in the range of about 1′/n-δ, where δ is a value selected to form overlapping the beamlets from the one irradiation step to the next, and where the distance of translation in the x-direction is selected such that the film is moved a distance of about λ′ after n irradiations, where λ′=w′+d′.
    • 在衬底上处理多晶膜的方法包括产生多个激光束脉冲,将膜定位在能够在至少一个方向上移动的支撑件上,将多个激光束脉冲引导通过掩模以产生图案化的激光束; 每个所述光束具有长度l',宽度w'和相邻光束d'之间的间隔,用图案化光束照射膜的区域,所述光束具有足以熔化膜的照射部分的强度 以引起膜的照射部分的结晶,其中膜区域被照射n次; 并且在每个胶片部分照射之后,将胶片或掩模或两者都平移在x方向和y方向上的距离,其中在y方向上的平移距离在约1'/ n -delta,其中delta是选择以形成从一个照射步骤到下一个照射步骤的子束重叠的值,并且其中选择x方向上的平移距离使得膜在n之后移动约λ'的距离 辐射,其中λ'= w'+ d'。
    • 9. 发明申请
    • Single-shot semiconductor processing system and method having various irradiation patterns
    • 具有各种照射图案的单次半导体处理系统和方法
    • US20060040512A1
    • 2006-02-23
    • US10524809
    • 2003-08-19
    • James Im
    • James Im
    • H01L21/20H01L21/324H01L21/84
    • H01L21/02686B23K26/066H01L21/02H01L21/02422H01L21/02532H01L21/02675H01L21/02678H01L21/2026H01L21/324H01L27/1285H01L27/1296Y10T117/10Y10T117/1088
    • High throughput systems and processes for recrystallizing thin film semiconductors that have been deposited at low temperatures on a substrate are provided. A thin film semiconductor workpiece is irradiated with a laser beam to melt and recrystallize target areas of the surface exposed to the laser beam. The laser beam is shaped into one or more beamlets using patterning masks. The mask patterns have suitable dimensions and orientations to pattern the laser beam radiation so that the areas targeted by the beamlets have dimensions and orientations that are conducive to semiconductor recrystallization. The workpiece is mechanically translated along linear paths relative to the laser beam to process the entire surface of the work piece at high speeds. Position sensitive triggering of a laser can be used generate laser beam pulses to melt and recrystallize semiconductor material at precise locations on the surface of the workpiece while it is translated on a motorized stage.
    • 提供了在低温下沉积在衬底上的用于重结晶薄膜半导体的高通量系统和工艺。 用激光束照射薄膜半导体工件以熔化暴露于激光束的表面的目标区域的再结晶。 使用图案掩模将激光束成形为一个或多个子束。 掩模图案具有适当的尺寸和取向以对激光束辐射进行图案化,使得由子束靶向的区域具有有利于半导体重结晶的尺寸和取向。 工件沿着相对于激光束的线性路径被机械平移,以高速处理工件的整个表面。 可以使用位置敏感的激光触发来产生激光束脉冲,以在半导体材料在电动平台上平移时在工件表面上的精确位置处熔融和重结晶半导体材料。