会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明申请
    • ILLUMINATION SYSTEM OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
    • 微波投影曝光装置的照明系统
    • WO2012089224A1
    • 2012-07-05
    • PCT/EP2010/007953
    • 2010-12-28
    • CARL ZEISS SMT GMBHPATRA, MichaelBIELING, StigDEGÜNTHER, MarkusSCHLESENER, FrankSCHWAB, Markus
    • PATRA, MichaelBIELING, StigDEGÜNTHER, MarkusSCHLESENER, FrankSCHWAB, Markus
    • G03F7/20
    • G03F7/70158G03F7/70058
    • An illumination system of a microlithographic projection exposure apparatus (10) comprises a light source (30), which is configured to produce a projection light beam (34), and a first and a second diffractive optical element (42, 44; 242, 244) arranged between the light source (30) and a pupil plane (84). The diffractive effect produced by each diffractive optical element depends on the position of a light field (110) that is irradiated by the projection light beam (34) on the diffractive optical elements (42, 44; 242, 244). A displacement mechanism (54, 64) changes the mutual spatial arrangement of the diffractive optical elements. In at least one of the mutual spatial arrangements, which can be obtained with the help of the displacement mechanism (54, 64), the light field (110) extends both over the first and the second diffractive optical element (42, 44; 242, 244). This makes it possible to produce in a simple manner continuously variable illumination settings.
    • 微光刻投影曝光装置(10)的照明系统包括被配置为产生投影光束(34)的光源(30)和第一和第二衍射光学元件(42,44; 242,244) )布置在光源(30)和光瞳平面(84)之间。 由每个衍射光学元件产生的衍射效应取决于由投影光束(34)照射在衍射光学元件(42,44; 242,244)上的光场(110)的位置。 位移机构(54,64)改变衍射光学元件的相互空间布置。 在借助位移机构(54,64)可获得的相互空间布置中的至少一个中,光场(110)在第一和第二衍射光学元件(42,44; 242)之上延伸 ,244)。 这使得可以以简单的方式生产连续可变的照明设置。
    • 7. 发明申请
    • ILLUMINATION SYSTEM OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
    • 微波投影曝光装置的照明系统
    • WO2012034571A1
    • 2012-03-22
    • PCT/EP2010/005628
    • 2010-09-14
    • CARL ZEISS SMT GMBHSCHWAB, MarkusPATRA, Michael
    • SCHWAB, MarkusPATRA, Michael
    • G03F7/20
    • G03F7/70116G03F7/70075
    • An illumination system of a microlithographic projection exposure apparatus comprises a dividing array (36; 136; 236) of optical elements (70a, 70b; 170a, 170b; 270). Each optical element has a positive optical power and produces a converging light beam (LBa, LBb). A spatial light modulator (38) is arranged between the dividing array (36; 136; 236) and a surface (76) and is configured to vary an irradiance distribution in the surface (78). The modulator comprises an array (40) of mirrors each being configured to deflect a converging light beam (LBa, LBb) produced by the associated optical element by a deflection angle that is variable in response to a control signal. Each mirror directs the deflected light beam towards the surface (76) where the deflected light beam produces a light spot (78a, 78b, 78c). At least two optical elements (70a, 70b; 170a, 170b; 270) of the dividing array (36; 136; 236) have different optical properties so that the spot sizes of the light spots are different.
    • 微光刻投影曝光装置的照明系统包括光学元件(70a,70b; 170a,170b; 270)的分割阵列(36; 136; 236)。 每个光学元件具有正光焦度并产生会聚光束(LBa,LBb)。 空间光调制器(38)布置在分隔阵列(36; 136; 236)和表面(76)之间,并被配置为改变表面(78)中的辐照度分布。 调制器包括一组反射镜阵列(40),每个镜子被配置为使由相关联的光学元件产生的会聚光束(LBa,LBb)偏转响应于控制信号而变化的偏转角。 每个反射镜将偏转的光束引向偏转的光束产生光斑(78a,78b,78c)的表面(76)。 分隔阵列(36; 136; 236)的至少两个光学元件(70a,70b; 170a,170b; 270)具有不同的光学特性,使得光点的光斑尺寸不同。
    • 8. 发明申请
    • ILLUMINATION SYSTEM OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
    • 微波投影曝光装置的照明系统
    • WO2012028158A1
    • 2012-03-08
    • PCT/EP2010/005317
    • 2010-08-30
    • CARL ZEISS SMT GMBHPATRA, MichaelSCHWAB, Markus
    • PATRA, MichaelSCHWAB, Markus
    • G03F7/20
    • G03F7/70191G03F7/70091G03F7/70116
    • An illumination system of a microlithographic projection exposure apparatus (10) comprises an optical integrator (52; 152) that includes an array (54c; 154b) of optical raster elements (56; 156). A condenser (72) superimposes the light beams associated with the optical raster elements in a common field plane (71). A modulator (62; 162; 262) modifies a field dependency of an angular irradiance distribution in an illuminated field. Units (60; 160; 260) of the modulator are associated with one of the light beams and are arranged at a position in front of the condenser (72) such that only the associated light beam impinges on a single modulator unit (60). The units are furthermore configured to variably redistribute, without blocking any light, a spatial and/or an angular irradiance distribution of the associated light beams. A control device (66) controls the modulator units (60; 160; 260) if it receives an input command that the field dependency of the angular irradiance distribution in the mask plane (78) shall be modified.
    • 微光刻投影曝光装置(10)的照明系统包括光学积分器(52; 152),其包括光栅元件(56; 156)的阵列(54c; 154b)。 冷凝器(72)将与光栅元件相关联的光束叠加在公共场平面(71)中。 调制器(62; 162; 262)修改照明场中的角度辐照度分布的场依赖性。 调制器的单元(60; 160; 260)与一个光束相关联并且被布置在聚光器(72)的前面的位置处,使得仅相关联的光束撞击在单个调制器单元(60)上。 这些单元还被配置为可变地重新分布相关联的光束的空间和/或角度辐照度分布,而不阻挡任何光。 如果调制器单元(60; 160; 260)接收到必须修改掩模平面(78)中角度辐照度分布的场依赖性的输入命令,则控制装置(66)控制调制器单元(60; 160; 260)。
    • 9. 发明申请
    • ILLUMINATION SYSTEM COMPRISING A FOURIER OPTICAL SYSTEM
    • 包含四光系统的照明系统
    • WO2009135586A1
    • 2009-11-12
    • PCT/EP2009/002824
    • 2009-04-17
    • CARL ZEISS SMT AGSCHWAB, MarkusLAYH, MichaelDEGUENTHER, MarkusHOEGELE, Artur
    • SCHWAB, MarkusLAYH, MichaelDEGUENTHER, MarkusHOEGELE, Artur
    • G03F7/20
    • G03F7/70116G03F7/70075
    • An illumination system (190) for a microlithography projection exposure apparatus (100) for illuminating an illumination field (165) with the light from a primary light source (102) has a variably adjustable pupil shaping unit (150) for receiving light from the primary light source (102) and for generating a variably adjustable two-dimensional intensity distribution in a pupil shaping surface (110) of the illumination system. The pupil shaping unit (150) has a Fourier optical system (500) for converting an entrance beam bundle (105) entering through an entrance plane of the Fourier optical system into an exit beam bundle exiting from an exit plane of the Fourier optical system. The Fourier optical system has a focal length f FOS and a structural length L measured between an entrance-side first system surface and an exit-side last system surface along an optical axis and the condition (L/f FOS )
    • 用于利用来自主光源(102)的光照射照明场(165)的微光刻投影曝光设备(100)的照明系统(190)具有可变调节的瞳孔成形单元(150),用于接收来自主光源 光源(102)并且用于在照明系统的光瞳成形表面(110)中产生可变地调节的二维强度分布。 瞳孔成形单元(150)具有傅立叶光学系统(500),用于将通过傅立叶光学系统的入射面进入的入射光束束(105)转换成从傅立叶光学系统的出射平面离开的出射光束束。 傅立叶光学系统具有焦距fFOS和沿着光轴在入射侧第一系统表面和出射侧最后系统表面之间测量的结构长度L,并且条件(L / fFOS)<1/6成立。