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    • 1. 发明申请
    • ILLUMINATION SYSTEM OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
    • 微波投影曝光装置的照明系统
    • WO2009090007A3
    • 2009-09-24
    • PCT/EP2009000049
    • 2009-01-08
    • ZEISS CARL SMT AGHOEGELE ARTUR
    • HOEGELE ARTUR
    • G03F7/20
    • G03F7/70191G03F7/70066
    • An illumination system of a microlithographic projection exposure apparatus (10) has a pupil plane (54), an object plane (62) and a mask plane (68) in which a mask (16) to be illuminated can be arranged. The illumination system has an optical system (170; 270; 370) consisting of a condenser (60; 160; 260; 360) that produces a Fourier relationship between the pupil plane (54) and the object plane (62). The system further has a field stop objective (66; 166; 266; 366) that optically conjugates the object plane (62) to the mask plane (68). According to the invention the optical system (170; 270; 370) has a negative Petzval sum with an absolute value of less than 0.0032 1/mm and preferably of less than 0.0026 1/mm. This ensures small telecentricity errors and a good pole balance.
    • 微光刻投影曝光装置(10)的照明系统具有瞳孔平面(54),物平面(62)和掩模平面(68),可以布置要被照射的掩模(16)。 所述照明系统具有由在所述瞳孔平面(54)和所述物体平面(62)之间产生傅立叶关系的冷凝器(60; 160; 260; 360)组成的光学系统(170; 270; 370)。 系统还具有将物平面(62)与掩模平面(68)光学共轭的场停止物镜(66; 166; 266; 366)。 根据本发明,光学系统(170; 270; 370)具有绝对值小于0.00321 / mm,优选小于0.0026l / mm的负Petzval和。 这确保了小的远心误差和良好的极平衡。
    • 8. 发明申请
    • ILLUMINATION SYSTEM COMPRISING A FOURIER OPTICAL SYSTEM
    • 包含四光系统的照明系统
    • WO2009135586A1
    • 2009-11-12
    • PCT/EP2009/002824
    • 2009-04-17
    • CARL ZEISS SMT AGSCHWAB, MarkusLAYH, MichaelDEGUENTHER, MarkusHOEGELE, Artur
    • SCHWAB, MarkusLAYH, MichaelDEGUENTHER, MarkusHOEGELE, Artur
    • G03F7/20
    • G03F7/70116G03F7/70075
    • An illumination system (190) for a microlithography projection exposure apparatus (100) for illuminating an illumination field (165) with the light from a primary light source (102) has a variably adjustable pupil shaping unit (150) for receiving light from the primary light source (102) and for generating a variably adjustable two-dimensional intensity distribution in a pupil shaping surface (110) of the illumination system. The pupil shaping unit (150) has a Fourier optical system (500) for converting an entrance beam bundle (105) entering through an entrance plane of the Fourier optical system into an exit beam bundle exiting from an exit plane of the Fourier optical system. The Fourier optical system has a focal length f FOS and a structural length L measured between an entrance-side first system surface and an exit-side last system surface along an optical axis and the condition (L/f FOS )
    • 用于利用来自主光源(102)的光照射照明场(165)的微光刻投影曝光设备(100)的照明系统(190)具有可变调节的瞳孔成形单元(150),用于接收来自主光源 光源(102)并且用于在照明系统的光瞳成形表面(110)中产生可变地调节的二维强度分布。 瞳孔成形单元(150)具有傅立叶光学系统(500),用于将通过傅立叶光学系统的入射面进入的入射光束束(105)转换成从傅立叶光学系统的出射平面离开的出射光束束。 傅立叶光学系统具有焦距fFOS和沿着光轴在入射侧第一系统表面和出射侧最后系统表面之间测量的结构长度L,并且条件(L / fFOS)<1/6成立。