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    • 4. 发明授权
    • Photoelectric device and method of producing the same
    • 光电器件及其制造方法
    • US4394749A
    • 1983-07-19
    • US154999
    • 1980-05-30
    • Toshihisa TsukadaYukio TakasakiTadaaki HiraiToru BajiHideaki YamamotoYasuo TanakaEiichi MaruyamaSachio Ishioka
    • Toshihisa TsukadaYukio TakasakiTadaaki HiraiToru BajiHideaki YamamotoYasuo TanakaEiichi MaruyamaSachio Ishioka
    • H01L27/146G11C13/00
    • H01L27/14665
    • A photoelectric device having at least a predetermined impurity region which is disposed in a semiconductor substrate, and a photoelectric conversion portion which is constructed by stacking an electrode layer lying in contact with at least a part of the impurity region, a photoconductive material layer overlying the electrode layer, and a transparent electrode overlying the photoconductive material layer, characterized in that the photoconductive material layer is made of an amorphous chalcogenide material which principally contains Se, is disclosed. It is very favorable that the photoelectric conversion material layer made of the amorphous material principally containing Se is partially doped with Te so as to enhance its sensitivity. The amorphous chalcogenide material is very useful in the following point. In the course of forming, or after having formed, at least one photoconductive layer on a semiconductor body whose surface is uneven, a heat treatment is performed at a temperature of at least the softening point of the photoconductor so as to flatten the layer, whereby discontinuous parts of the photoconductor ascribable to the uneven surface of the semiconductor body can be avoided.
    • 具有至少设置在半导体衬底中的预定杂质区域的光电器件和通过堆叠与至少一部分杂质区域接触的电极层构成的光电转换部分,覆盖 电极层和覆盖光导材料层的透明电极,其特征在于,所述光导材料层由主要包含Se的无定形硫族化物材料制成。 非常有利的是,由主要含有Se的非晶体材料制成的光电转换材料层部分地掺杂有Te以提高其灵敏度。 无定形硫族化物材料在以下方面非常有用。 在形成表面不均匀的半导体本体上形成或形成至少一个光电导层的过程中,至少在光电导体的软化点的温度下进行热处理以使层平坦化,由此 可以避免归因于半导体本体的不平坦表面的感光体的不连续部分。
    • 9. 发明授权
    • Solid-state imaging device
    • 固态成像装置
    • US4405935A
    • 1983-09-20
    • US227679
    • 1981-01-23
    • Toru BajiNorio KoikeToshihisa TsukadaIwao TakemotoHideaki YamamotoYukio Takasaki
    • Toru BajiNorio KoikeToshihisa TsukadaIwao TakemotoHideaki YamamotoYukio Takasaki
    • H01L27/146H04N5/335H04N5/359H04N5/369H04N5/374H01L27/14
    • H01L27/14672
    • Disclosed is a solid-state imaging device having a semiconductor integrated circuit in which a plurality of switching elements for selecting positions of picture elements and scanners for turning "on" and "off" the switching elements in time sequence are disposed on an identical substrate, a photoconductive film which is disposed on the integrated circuit and which is connected to one end of each of the switching elements, and a light transmitting electrode which is disposed on the photoconductive film, characterized at least in that a breakdown voltage of a junction formed between the semiconductor substrate and an impurity region which has a conductivity type opposite to that of the semiconductor substrate and which stores therein carriers attendant upon incidence of light is made smaller than a breakdown voltage between the storing first impurity region of said each switching element and a second impurity region thereof which forms a signal leading-out portion.
    • 公开了一种具有半导体集成电路的固态成像装置,其中用于选择用于按时间顺序将开关元件“接通”和“关闭”的图像元素和扫描器的位置的多个开关元件设置在相同的基板上, 设置在所述集成电路上并连接到每个所述开关元件的一端的光电导膜和设置在所述光电导膜上的透光电极,其特征在于,至少形成在所述光电导膜之间形成的结的击穿电压, 所述半导体衬底和具有与所述半导体衬底的导电类型相反的导电类型并且存储在入射时伴随的载流子的杂质区域被制成小于所述每个开关元件的所述存储第一杂质区域与所述第二开关元件的存储第一杂质区域之间的击穿电压 其形成信号导出部分的杂质区域。