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    • 1. 发明授权
    • Method and system for efficiently storing and viewing data in a database
    • 在数据库中高效地存储和查看数据的方法和系统
    • US06286007B1
    • 2001-09-04
    • US09170901
    • 1998-10-13
    • Clinton Frederick MillerPaul Gerard Villarrubia
    • Clinton Frederick MillerPaul Gerard Villarrubia
    • G06F900
    • G06F17/30958Y10S707/99936Y10S707/99942
    • A method and system are disclosed for efficiently storing and viewing data in a database. Data is stored in a nested data model which includes a plurality of nodes. A plurality of edges connect the plurality of nodes. Each edge has a unique edge name. A plurality of instances of data objects are associated with the nested data model. Each instance is associated with one of the edges such that the instance is also associated with that edge's name. An instance ordinal is associated with each instance which represents the number of times the edge associated with each instance is encountered during a traversal of the nested data model. The data stored utilizing the nested data model is accessed utilizing the instance ordinal and edge name associated with each of the plurality of instances, such that the data is accessed as being flat without flattening the nested data model.
    • 公开了一种用于在数据库中有效地存储和查看数据的方法和系统。 数据被存储在包括多个节点的嵌套数据模型中。 多个边缘连接多个节点。 每个边缘都有一个独特的边缘名称。 数据对象的多个实例与嵌套数据模型相关联。 每个实例与其中一个边缘相关联,使得实例也与该边缘的名称相关联。 实例序数与每个实例相关联,表示在遍历嵌套数据模型期间遇到与每个实例相关联的边的次数。 使用嵌套数据模型存储的数据使用与多个实例中的每个实例相关联的实例序数和边缘名称被访问,使得数据被访问为平坦而不使嵌套数据模型变平。
    • 6. 发明授权
    • Clustering techniques for faster and better placement of VLSI circuits
    • 用于更快更好地布置VLSI电路的聚类技术
    • US07296252B2
    • 2007-11-13
    • US10996293
    • 2004-11-22
    • Charles Jay AlpertGi-Joon NamSherief Mohamed RedaPaul Gerard Villarrubia
    • Charles Jay AlpertGi-Joon NamSherief Mohamed RedaPaul Gerard Villarrubia
    • G06F17/50G06F9/45
    • G06F17/5072G06F17/50
    • A placement technique for designing a layout of an integrated circuit by calculating clustering scores for different pairs of objects in the layout based on connections of two objects in a given pair and the sizes of the two objects, then grouping at least one of the pairs of objects into a cluster based on the clustering scores, partitioning the objects as clustered and ungrouping the cluster after partitioning. The pair of objects having the highest clustering score are grouped into the cluster, and the clustering score is directly proportional to the total weight of connections between the two objects in the respective pair. The clustering scores are preferably inserted in a binary heap to identify the highest clustering score. After grouping, the clustering score for any neighboring object of a clustered object is marked to indicate that the clustering score is invalid and must be recalculated. The calculating and grouping are then repeated iteratively based on the previous clustered layout. Cluster growth can be controlled indirectly, or controlled directly by imposing an upper bound on cluster size.
    • 一种用于通过基于给定对中的两个对象的连接和两个对象的大小的布局来计算布局中的不同对对象的聚类分数来设计集成电路的布局的布局技术,然后将至少一个对 对象基于聚类分数进入群集,将对象分区为群集,并在分区后取消分组群集。 具有最高聚类分数的一对对象被分组到聚类中,并且聚类分数与相应对中的两个对象之间的连接的总权重成正比。 聚类分数优选插入二进制堆中以识别最高聚类分数。 分组后,将聚类对象的任何邻近对象的聚类分数标记为表示聚类分数无效并且必须重新计算。 然后基于先前的聚类布局迭代地重复计算和分组。 群集增长可以间接控制,也可以通过对群集大小施加上限直接控制。
    • 7. 发明授权
    • Method and system for performing timing analysis on an integrated circuit design
    • 用于对集成电路设计进行定时分析的方法和系统
    • US06230302B1
    • 2001-05-08
    • US09119271
    • 1998-07-20
    • Carol Ivash GabeleStephen Thomas QuayPaul Gerard VillarrubiaParsotam Trikam PatelAlexander Koos Spencer
    • Carol Ivash GabeleStephen Thomas QuayPaul Gerard VillarrubiaParsotam Trikam PatelAlexander Koos Spencer
    • G06F1750
    • G06F17/5031
    • A method and system for performing timing analysis on an integrated circuit design are disclosed. It is always advantageous to be able to conveniently perform a timing analysis on the entire IC design at any stage of the design process in order to gain more accurate timing information about the design. However, at an early stage of the design process, the available physical circuit data are often incomplete, not to mention these preliminary data are usually of a lower quality as far as capability of providing an accurate RC delay and capacitance estimation is concerned. To make the best usage of the preliminary data, the present disclosure describes a method of performing a fleeting timing analysis that can be very useful during an early floor planning stage of the design process when there is no opportunity to buffer or widen any exceptionally long interconnect wires within the IC circuit design. As a result, much faster design turn-around time may be achieved because buffer insertion need not be run for every new pass of the physical circuit design data.
    • 公开了一种用于对集成电路设计进行定时分析的方法和系统。 能够方便地在设计过程的任何阶段对整个IC设计进行时序分析,以便获得关于设计的更准确的时序信息。 然而,在设计过程的早期阶段,可用的物理电路数据通常是不完整的,更不用说,就提供准确的RC延迟和电容估计的能力而言,这些初步数据通常质量较差。 为了最佳地利用初步数据,本公开描述了一种执行短暂定时分析的方法,其在设计过程的早期楼层规划阶段非常有用,当不存在缓冲或加宽任何特别长的互连 电线内IC电路设计。 因此,可以实现更快的设计周转时间,因为不需要为物理电路设计数据的每个新的通过运行缓冲器插入。
    • 8. 发明授权
    • Method and system for performing parasitic capacitance estimations on
interconnect data within an integrated circuit
    • 用于对集成电路内的互连数据执行寄生电容估计的方法和系统
    • US5838582A
    • 1998-11-17
    • US726720
    • 1996-10-07
    • Sharad MehrotraPaul Gerard Villarrubia
    • Sharad MehrotraPaul Gerard Villarrubia
    • G06F17/50
    • G06F17/5081
    • A method and system for providing parasitic capacitance estimation on interconnect data for an integrated circuit is disclosed. An integrated circuit typically includes a substrate layer and several metal layers. In accordance with the method and system of the present invention, a center wire within one of the several metal layers is first identified. Then, a first capacitance value between a first wire and the center wire as well as a second capacitance value between a second wire and the center wire are determined. The first wire, the second wire, and the center wire are in the same metal layer. Next, a third capacitance value between a third wire and the center wire is determined. This third wire is in a metal layer located directly beneath the center wire. Finally, a fourth capacitance value between a fourth wire and the center wire is determined. The fourth wire is in a metal layer located directly above the center wire. If there are more than one wire within the metal layer directly above the center wire, the fourth capacitance value is distributed among all these wires. By so doing, the total parasitic capacitance for the center wire can be estimated by utilizing the first capacitance value, the second capacitance value, the third capacitance value, and the fourth capacitance value or the distributed fourth capacitance values.
    • 公开了一种用于为集成电路的互连数据提供寄生电容估计的方法和系统。 集成电路通常包括基底层和几个金属层。 根据本发明的方法和系统,首先确定几个金属层之一内的中心线。 然后,确定第一线和中心线之间的第一电容值以及第二线和中心线之间的第二电容值。 第一线,第二线和中心线在相同的金属层中。 接下来,确定第三线和中心线之间的第三电容值。 该第三根导线位于中心线正下方的金属层中。 最后,确定第四线和中心线之间的第四电容值。 第四根导线位于中心线正上方的金属层中。 如果在中心线正上方的金属层内存在多根线,则第四电容值分布在所有这些线之间。 通过这样做,可以通过利用第一电​​容值,第二电容值,第三电容值和第四电容值或分布的第四电容值来估计中心线的总寄生电容。
    • 9. 发明授权
    • Stability metrics for placement to quantify the stability of placement algorithms
    • 放置的稳定性指标来量化放置算法的稳定性
    • US07073144B2
    • 2006-07-04
    • US10825148
    • 2004-04-15
    • Charles Jay AlpertGi-Joon NamPaul Gerard VillarrubiaMehmet Can Yildiz
    • Charles Jay AlpertGi-Joon NamPaul Gerard VillarrubiaMehmet Can Yildiz
    • G06F17/50
    • G06F17/5072
    • A method of assessing the stability of a placement tool used in designing the physical layout of an integrated circuit chip, by constructing different layouts of cells using the placement tool with different sets of input parameters, and calculating a stability value based on the movement of respective cell locations between the layouts. The stability value can be normalized based on cell locations in a random placement. One stability metric measures absolute movement of individual cells in the layouts, weighted by cell area. The cell movements can be squared in calculating the stability value. Another stability metric measures the relative movement of cells with respect to their nets. Shifting of cells and symmetric reversal of cells about a net center does not contribute to this relative movement, but spreading of cells and rotation of cells with respect to the net center does contribute to the relative movement. Relative cell movements can again be squared in calculating the stability value. Many different layouts can be designed using the same placement tool with a range of different input parameters and different movement metrics to build a collection of comparative values that can be used to identify stability characteristics for that tool.
    • 一种评估用于设计集成电路芯片的物理布局的放置工具的稳定性的方法,通过使用具有不同输入参数集合的放置工具构造不同的单元布局,以及基于相应的运动来计算稳定性值 单元格位置之间的布局。 稳定性值可以根据随机位置中的单元格位置进行归一化。 一个稳定度度量衡量单元格在布局中的绝对运动,由单元格区域加权。 在计算稳定性值时,单元格移动可以平方。 另一个稳定度量度衡量细胞相对于网的相对运动。 细胞的移位和细胞对网络中心的对称反转对这种相对运动没有贡献,但是细胞的扩散和细胞的相对于网络中心的旋转确实有助于相对运动。 在计算稳定性值时,相对单元移动可以再次平方。 可以使用具有一系列不同输入参数和不同运动度量的相同放置工具来设计许多不同的布局,以构建可用于识别该工具的稳定性特征的比较值集合。