会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Organic compositions
    • 有机成分
    • US07060204B2
    • 2006-06-13
    • US10404047
    • 2003-04-02
    • Bo LiNancy IwamotoBoris KorolevPaul G. ApenKreisler LauJohn G. SikoniaAnanth NamanAmauel GebrebrhanNassrin SleimanRuslan Zherebin
    • Bo LiNancy IwamotoBoris KorolevPaul G. ApenKreisler LauJohn G. SikoniaAnanth NamanAmauel GebrebrhanNassrin SleimanRuslan Zherebin
    • H01B1/12C08J9/38C08J9/00
    • H01L21/02126C08G61/02C08L65/00H01L21/02203H01L21/02282H01L21/31695H05K1/0313
    • The present invention provides a composition comprising: (a) dielectric material; and (b) porogen comprising at least two fused aromatic rings wherein each of the fused aromatic rings has at least one alkyl substituent thereon and a bond exists between at least two of the alkyl substituents on adjacent aromatic rings. Preferably, the dielectric material is a composition comprising (a) thermosetting component comprising (1) optionally monomer of Formula I as set forth below and (2) at least one oligomer or polymer of Formula II as set forth below where Q, G, h, I, I, and w are as set forth below and (b) porogen. Preferably, the porogen is selected from the group consisting of unfunctionalized polyacenaphthylene homopolymer, functionalized polyacenaphthylene homopolymer, polyacenaphthylene copolymer, polynorbornene, polycaprolactone, poly(2-vinylnaphthalene), vinyl anthracene, polystyrene, polystyrene derivatives, polysiloxane, polyester, polyether, polyacrylate, aliphatic polycarbonate, polysulfone, polylactide, and blends thereof. The present compositions are particularly useful as dielectric substrate material in microchips, multichip modules, laminated circuit boards, and printed wiring boards.
    • 本发明提供一种组合物,其包含:(a)电介质材料; 和(b)包含至少两个稠合芳环的致孔剂,其中每个稠合芳环在其上具有至少一个烷基取代基,并且在相邻芳环上的至少两个烷基取代基之间存在键。 优选地,电介质材料是包含(a)热固性组分的组合物,其包含(1)如下所述的任选的式I的单体和(2)至少一种如下所述的式II的低聚物或聚合物,其中Q,G,h ,I,I和w如下所述,(b)致孔剂。 优选地,致孔剂选自非官能化聚苊烯均聚物,官能化聚苊烯均聚物,聚苊烯共聚物,聚降冰片烯,聚己内酯,聚(2-乙烯基萘),乙烯基蒽,聚苯乙烯,聚苯乙烯衍生物,聚硅氧烷,聚酯,聚醚,聚丙烯酸酯,脂族 聚碳酸酯,聚砜,聚丙交酯及其共混物。 本发明的组合物特别可用作微芯片,多芯片模块,层叠电路板和印刷线路板中的介电基板材料。
    • 8. 发明申请
    • Repairing damage to low-k dielectric materials using silylating agents
    • 使用硅烷化剂修复对低k电介质材料的损坏
    • US20050095840A1
    • 2005-05-05
    • US10940682
    • 2004-09-15
    • Anil BhanapTeresa RamosNancy IwamotoRoger LeungAnanth Naman
    • Anil BhanapTeresa RamosNancy IwamotoRoger LeungAnanth Naman
    • H01L21/4763
    • H01L21/31058H01L21/02203H01L21/02216H01L21/02282H01L21/3122H01L21/76801
    • A method for restoring hydrophobicity to the surfaces of organosilicate glass dielectric films which have been subjected to an etchant or ashing treatment. These films are used as insulating materials in the manufacture of integrated circuits to ensure low and stable dielectric properties in these films. The method deters the formation of stress-induced voids in these films. An organosilicate glass dielectric film is patterned to form vias and trenches by subjecting it to an etchant or ashing reagent in such a way as to remove at least a portion of previously existing carbon containing moieties and reduce hydrophobicity of said organosilicate glass dielectric film. The vias and trenches are thereafter filled with a metal and subjected to an annealing treatment. After the film is subjected to the etchant or ashing reagent, but before being subjected to an annealing treatment, the film is contacted with a toughening agent composition to restore some of the carbon containing moieties and increase the hydrophobicity of the organosilicate glass dielectric film.
    • 用于恢复已进行蚀刻剂或灰化处理的有机硅酸盐玻璃介电膜表面的疏水性的方法。 这些膜在集成电路的制造中用作绝缘材料,以确保这些膜中的低和稳定的介电性能。 该方法阻止了这些膜中应力诱发的空隙的形成。 通过使有机硅酸盐玻璃电介质膜经受蚀刻剂或灰化试剂以形成通孔和沟槽,以除去至少一部分先前存在的含碳部分并降低所述有机硅酸盐玻璃电介质膜的疏水性。 之后通过通孔和沟槽填充金属并进行退火处理。 在将薄膜进行蚀刻剂或灰化试剂之后,但在进行退火处理之前,使膜与增韧剂组合物接触以还原一些含碳部分并增加有机硅酸盐玻璃电介质膜的疏水性。
    • 9. 发明授权
    • Repairing damage to low-k dielectric materials using silylating agents
    • 使用硅烷化剂修复对低k电介质材料的损坏
    • US07709371B2
    • 2010-05-04
    • US10940682
    • 2004-09-15
    • Anil S. BhanapTeresa A. RamosNancy IwamotoRoger Y. LeungAnanth Naman
    • Anil S. BhanapTeresa A. RamosNancy IwamotoRoger Y. LeungAnanth Naman
    • H01L21/4763H01L21/302H01L21/31
    • H01L21/31058H01L21/02203H01L21/02216H01L21/02282H01L21/3122H01L21/76801
    • A method for restoring hydrophobicity to the surfaces of organosilicate glass dielectric films which have been subjected to an etchant or ashing treatment. These films are used as insulating materials in the manufacture of integrated circuits to ensure low and stable dielectric properties in these films. The method deters the formation of stress-induced voids in these films. An organosilicate glass dielectric film is patterned to form vias and trenches by subjecting it to an etchant or ashing reagent in such a way as to remove at least a portion of previously existing carbon containing moieties and reduce hydrophobicity of said organosilicate glass dielectric film. The vias and trenches are thereafter filled with a metal and subjected to an annealing treatment. After the film is subjected to the etchant or ashing reagent, but before being subjected to an annealing treatment, the film is contacted with a toughening agent composition to restore some of the carbon containing moieties and increase the hydrophobicity of the organosilicate glass dielectric film.
    • 用于恢复已进行蚀刻剂或灰化处理的有机硅酸盐玻璃介电膜表面的疏水性的方法。 这些膜在集成电路的制造中用作绝缘材料,以确保这些膜中的低和稳定的介电性能。 该方法阻止了这些膜中应力诱发的空隙的形成。 通过使有机硅酸盐玻璃电介质膜经受蚀刻剂或灰化试剂以形成通孔和沟槽,以除去至少一部分先前存在的含碳部分并降低所述有机硅酸盐玻璃电介质膜的疏水性。 之后通过通孔和沟槽填充金属并进行退火处理。 在将薄膜进行蚀刻剂或灰化试剂之后,但在进行退火处理之前,使薄膜与增韧剂组合物接触以还原一些含碳部分并增加有机硅酸盐玻璃电介质薄膜的疏水性。