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    • 1. 发明专利
    • Detection element and detector using the same
    • 检测元件和使用它的检测器
    • JP2009079960A
    • 2009-04-16
    • JP2007248433
    • 2007-09-26
    • Mizuho Morita瑞穂 森田
    • MORITA MIZUHOHIROKANE TAKAAKI
    • G01N27/04G01N15/14G01N21/64G01N27/22
    • G01N27/07G01N15/1031G01N15/1056G01N2015/0065G01N2015/0088
    • PROBLEM TO BE SOLVED: To provide a detection element capable of being enhanced in sensitivity. SOLUTION: The detection element 10 includes substrates 1 and 4, insulating members 2 and 3, a support 5 and electrodes 6 and 7. The insulating member 2 is formed on one main surface of the substrate 1 and has a recess and the insulating member 3 is formed so as to be in contact with the insulating member 2 and the substrate 4. The substrate 4 is formed on one main surface of the support 5 and the electrode 6 is formed on the surface opposite to the surface on which the insulating member 2 of the substrate 1 is formed, and the electrode 7 is formed on the surface 5A, side surface 5B and back 5C of the support 5 so as to be connected to the substrate 4. As a result, the detection element 10 includes the gap part 8 surrounded by the insulating members 2 and 3. Further, the substrate 1 is bonded to the substrate 4 through the insulating members 2 and 3 and the support 5 (quartz). Then, the current flowing through the substrates 1 and 4 when voltage is applied across the electrodes 6 and 7 is measured and the detection target entering the gap part 8 is detected or analyzed. COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:提供能够提高灵敏度的检测元件。 检测元件10包括基板1和4,绝缘构件2和3,支撑件5和电极6和7.绝缘构件2形成在基板1的一个主表面上并具有凹部 绝缘构件3形成为与绝缘构件2和基板4接触。基板4形成在支撑件5的一个主表面上,并且电极6形成在与其上的表面相对的表面上 形成基板1的绝缘构件2,并且将电极7形成在支撑体5的表面5A,侧面5B和背面5C上,从而与基板4连接。结果,检测元件10包括 间隙部分8被绝缘构件2和3包围。此外,基板1通过绝缘构件2和3以及支撑件5(石英)结合到基板4。 然后,测量在跨电极6和7施加电压时流过基板1和4的电流,并且检测或分析进入间隙部分8的检测目标。 版权所有(C)2009,JPO&INPIT
    • 2. 发明专利
    • Detection device
    • 检测装置
    • JP2003315296A
    • 2003-11-06
    • JP2002121228
    • 2002-04-23
    • Mizuho Morita瑞穂 森田
    • MORITA MIZUHO
    • G01L21/00G01N15/12G01N27/02G01N27/04G01N27/22G01N27/416
    • PROBLEM TO BE SOLVED: To provide a detection device with a high sensitivity capable of detecting, with a high sensitivity, a detection object smaller in size than a detection object which a conventional art has targeted. SOLUTION: The detection device is provided with a first conductive base body, an insulative body connected with the first conductive body, a second conductive base body connected with the insulative body insulatively from the first conductive base body, and a detection section with a gap provided between the first base body and the second base body. The distance between the first body and the second body is prescribed by the thickness of the insulative body. COPYRIGHT: (C)2004,JPO
    • 要解决的问题:为了提供具有高灵敏度的检测装置,能够以高灵敏度检测尺寸小于常规技术所针对的检测对象的检测对象。 解决方案:检测装置设置有第一导电基体,与第一导电体连接的绝缘体,与绝缘体绝缘地从第一导电性基体连接的第二导电性基体,以及具有 设置在第一基体和第二基体之间的间隙。 第一主体和第二主体之间的距离由绝缘体的厚度规定。 版权所有(C)2004,JPO
    • 4. 发明申请
    • ETCHING METHOD AND METHOD FOR PERFORMING SURFACE PROCESSING ON SOLID MATERIAL FOR SOLAR CELL
    • 用于对太阳能电池进行固体表面处理的蚀刻方法和方法
    • US20140234198A1
    • 2014-08-21
    • US14237948
    • 2012-08-10
    • Mizuho MoritaJunichi UchikoshiKentaro TsukamotoTakabumi NagaiKenji Adachi
    • Mizuho MoritaJunichi UchikoshiKentaro TsukamotoTakabumi NagaiKenji Adachi
    • H01L31/0236H01L31/18
    • H01L31/02366H01L31/02363H01L31/18Y02E10/50
    • Provided is an etching method including: (1) bringing a material containing at least one organic compound having an N—F bond into contact with the surface of a solid material; and (2) a step of heating the solid material; whereby etching can be performed safely and in a simple manner, at a higher etching rate, without the use of a high-environmental-load gas that causes global warming or highly reactive and toxic fluorine gas or hydrofluoric acid. The etching method may further include: (3) a step of exposing the solid material to light from the side of the material containing at least one organic compound having an N—F bond; and (4) a step of removing the material containing at least one organic compound having an N—F bond together with the residue remained between said material and the solid material. In particular, performing heating at a high temperature and applying light irradiation make it possible to form inverted pyramid-shaped recesses that are suitable for applying light-trapping and/or anti-reflection processing to the surface of the solid material for a solar cell.
    • 提供一种蚀刻方法,包括:(1)使含有至少一种具有N-F键的有机化合物的材料与固体材料的表面接触; 和(2)加热固体材料的步骤; 从而能够以更高的蚀刻速度安全地且以简单的方式执行蚀刻,而不使用引起全球变暖的高环境负荷气体或高反应性和有毒的氟气或氢氟酸。 蚀刻方法可以进一步包括:(3)将固体材料从含有至少一种具有N-F键的有机化合物的材料侧暴露于光的步骤; 和(4)除去含有至少一种具有N-F键的有机化合物的材料与残留物在所述材料和固体材料之间的步骤。 特别是,在高温下进行加热并施加光照射使得可以形成适于对太阳能电池的固体材料的表面进行光捕获和/或抗反射处理的倒棱锥形凹部。
    • 5. 发明授权
    • Detection device and detection system using the same
    • 检测装置和检测系统使用相同
    • US08421485B2
    • 2013-04-16
    • US12665431
    • 2007-12-13
    • Mizuho MoritaTakaaki Hirokane
    • Mizuho MoritaTakaaki Hirokane
    • G01R27/08
    • G01N27/07G01N15/1031G01N15/1056G01N2015/0065G01N2015/0088
    • A particle detection device (10) included substrates (1, 4), insulating members (2, 3), supporting member (5), and electrodes (6, 7). The insulating member (2) is provided on a principal surface of the substrate (1) and has a recess. The insulating member (3) is provided so as to make contact with the insulating member (3) and the substrate (4). The substrate (4) is formed on a principal surface of the supporting member (5). The electrode (6) is formed on a surface, which is opposite to the surface where the insulating member (2) is formed, of the substrate (1). The electrode (7) is formed on the surface (5A), the side surface (5B), and the rear surface (5C) of the supporting member (5) so as to be connected to the substrate (4). Accordingly, the detection device 10 includes a gap (8) surrounded by the insulating members (2, 3). The substrate (1) is connected to the substrate (4) with the insulating members (2, 3) and the supporting member (5) (quartz). In one embodiment, the insulating member (3) consist of quantum dots. Detection of the particles is either optically or electrically.
    • 颗粒检测装置(10)包括基板(1,4),绝缘构件(2,3),支撑构件(5)和电极(6,7)。 绝缘构件(2)设置在基板(1)的主表面上并具有凹部。 绝缘构件(3)设置成与绝缘构件(3)和基板(4)接触。 基板(4)形成在支撑部件(5)的主表面上。 电极(6)形成在与基板(1)的形成有绝缘部件(2)的表面相反的表面上。 电极(7)形成在支撑部件(5)的表面(5A),侧面(5B)和后表面(5C)上,以与基板(4)连接。 因此,检测装置10包括由绝缘构件(2,3)包围的间隙(8)。 基板(1)通过绝缘构件(2,3)和支撑构件(5)(石英)与基板(4)连接。 在一个实施例中,绝缘构件(3)由量子点组成。 颗粒的光学或电学检测。
    • 6. 发明申请
    • DETECTION DEVICE AND DETECTION SYSTEM USING THE SAME
    • 检测装置和使用该检测装置的检测系统
    • US20100201383A1
    • 2010-08-12
    • US12665431
    • 2007-12-13
    • Mizuho MoritaTakaaki Hirokane
    • Mizuho MoritaTakaaki Hirokane
    • H01L29/66H01J40/14G01R27/08
    • G01N27/07G01N15/1031G01N15/1056G01N2015/0065G01N2015/0088
    • A particle detection device (10) included substrates (1, 4), insulating members (2, 3), supporting member (5), and electrodes (6, 7). The insulating member (2) is provided on a principal surface of the substrate (1) and has a recess. The insulating member (3) is provided so as to make contact with the insulating member (3) and the substrate (4). The substrate (4) is formed on a principal surface of the supporting member (5). The electrode (6) is formed on a surface, which is opposite to the surface where the insulating member (2) is formed, of the substrate (1). The electrode (7) is formed on the surface (5A), the side surface (5B), and the rear surface (5C) of the supporting member (5) so as to be connected to the substrate (4). Accordingly, the detection device 10 includes a gap (8) surrounded by the insulating members (2, 3). The substrate (1) is connected to the substrate (4) with the insulating members (2, 3) and the supporting member (5) (quartz). In one embodiment, the insulating member (3) consist of quantum dots. Detection of the particles is either optically or electrically.
    • 颗粒检测装置(10)包括基板(1,4),绝缘构件(2,3),支撑构件(5)和电极(6,7)。 绝缘构件(2)设置在基板(1)的主表面上并具有凹部。 绝缘构件(3)设置成与绝缘构件(3)和基板(4)接触。 基板(4)形成在支撑部件(5)的主表面上。 电极(6)形成在与基板(1)的形成有绝缘部件(2)的表面相反的表面上。 电极(7)形成在支撑部件(5)的表面(5A),侧面(5B)和后表面(5C)上,以与基板(4)连接。 因此,检测装置10包括由绝缘构件(2,3)包围的间隙(8)。 基板(1)通过绝缘构件(2,3)和支撑构件(5)(石英)与基板(4)连接。 在一个实施例中,绝缘构件(3)由量子点组成。 颗粒的光学或电学检测。
    • 9. 发明授权
    • Method of forming oxide film
    • 形成氧化膜的方法
    • US5360768A
    • 1994-11-01
    • US784434
    • 1991-11-06
    • Tadahiro OhmiMizuho Morita
    • Tadahiro OhmiMizuho Morita
    • H01L21/316H01G21/316
    • H01L21/31683H01L21/31654Y10S438/903
    • The present invention relates to a method of forming an oxide film comprising;a first step to form an oxide film on the surface of a substrate by bringing a solution containing oxygen and/or oxygen-containing molecule in contact with the surface of said substrate, and a second step to strengthen bond between oxygen and atoms constituting the surface of said substrate in said oxide film by the thermal treatment of said oxide film at a temperature higher than 20.degree. C. in vapor phase of oxygen, oxygen-containing molecule, inert gas alone, or a mixture of two or more of them.
    • PCT No.PCT / JP90 / 00581 Sec。 371日期1991年11月6日 102(e)日期1991年11月6日PCT提交1990年5月7日PCT公布。 出版物WO90 / 13911 日期:1990年11月15日。本发明涉及形成氧化膜的方法。 通过使含有氧和/或含氧分子的溶液与所述衬底的表面接触而在衬底的表面上形成氧化膜的第一步骤,以及加强构成表面的氧和原子之间的键的第二步骤 通过在氧气,含氧分子,单独的惰性气体或其两种或更多种的混合物的气相中在高于20℃的温度下热处理所述氧化物膜,在所述氧化物膜中的所述衬底。