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    • 3. 发明授权
    • Integrated circuit flip-flops that utilize master and slave latched sense amplifiers
    • 集成电路触发器,利用主和从锁存读出放大器
    • US06573775B2
    • 2003-06-03
    • US10010847
    • 2001-12-05
    • David J. Pilling
    • David J. Pilling
    • H03K3289
    • H03K3/356139H03K3/356191H03K5/00006
    • Flip-flops include a master stage and a slave stage. The master stage is responsive to a first clock signal and has a first pair of differential inputs and a first pair of differential outputs. The slave stage is responsive to a second clock signal and has a second pair of differential inputs coupled to the first pair of differential outputs and a second pair of differential outputs from which true and complementary outputs (Q, QB) of the flip-flop are derived. If the flip-flop is a D-type flip-flop, the first pair of differential inputs receive true and complementary data signals (DATA, DATAB). If the flip-flop is a set-reset (S-R) flip-flop, the first pair of differential inputs receive set and reset signals (SET, RESET).
    • 触发器包括主站和从站。 主级响应于第一时钟信号并且具有第一对差分输入和第一对差分输出。 从站级响应于第二时钟信号并且具有耦合到第一对差分输出的第二对差分输入和第二对差分输出,触发器的真实和互补输出(Q,QB)从该第二对差分输出 派生。 如果触发器是D型触发器,则第一对差分输入端接收真实和互补的数据信号(DATA,DATAB)。 如果触发器是置位(S-R)触发器,则第一对差分输入端接收置位和复位信号(SET,RESET)。
    • 4. 发明授权
    • Circuits for improving the reliablity of antifuses in integrated circuits
    • 用于提高集成电路中反熔丝可靠性的电路
    • US5680360A
    • 1997-10-21
    • US473039
    • 1995-06-06
    • David J. PillingRaymond M. ChuSik K. Lui
    • David J. PillingRaymond M. ChuSik K. Lui
    • G11C17/18G11C17/16
    • G11C17/18
    • A circuit improves the reliability of antifuses in certain types of systems by substantially eliminating the continuous undesirable applications of voltages across antifuse terminals. To accomplish this, an antifuse has applied across its two terminals a "reading" or "evaluation" voltage as required by the system operation for a single read or evaluation clock period (typically 5 ns to 30 ns in duration). The signal describing the state of the antifuse is then stored in a latch, register, or other suitable structure for subsequent sampling. In this manner, a low read current flows in the antifuse in response to the standard chip operating voltage for only a short period of time such as a single clock cycle. Thus, continuous voltages across the two terminals of the antifuse are avoided and an unprogrammed antifuse is not inadvertently programmed and a programmed antifuse is not inadvertently converted back to its high impedance state (i.e. "unprogrammed"). In another embodiment, a multiplexer coupled to a terminal of the antifuse switches the terminal of the antifuse to a programming voltage node when the antifuse is selected for programming and to a reference voltage source when the antifuse is not selected for programming. The multiplexer prevents undesired voltages from being applied across the antifuse while other antifuses are being programmed. The two embodiments discussed may be used in conjunction with each other or separately.
    • 电路通过基本消除反熔丝端子上的电压的连续不期望的应用来提高某些类型系统中反熔丝的可靠性。 为了实现这一点,反熔丝在其两个端子上施加了对于单个读取或评估时钟周期(通常为5ns至30ns的持续时间)的系统操作所需的“读取”或“评估”电压。 然后将描述反熔丝的状态的信号存储在锁存器,寄存器或其他合适的结构中,用于随后的采样。 以这种方式,仅在短时间段(例如单个时钟周期)内,低反向电流响应于标准芯片工作电压而流过反熔丝。 因此,避免了反熔丝两端的连续电压,并且不会无意地编程未编程的反熔丝,并且编程的反熔丝不会无意中转换回其高阻抗状态(即“未编程”)。 在另一个实施例中,当反熔丝被选择用于编程时,耦合到反熔丝的端子的多路复用器将反熔丝的端子切换到编程电压节点,并且当反熔丝未被选择用于编程时,将其转换为参考电压源。 多路复用器防止在反熔丝跨越反熔丝而施加不需要的电压,而其他反熔丝被编程。 所讨论的两个实施例可以彼此结合使用或分开使用。
    • 8. 发明授权
    • Circuits for improving the reliability of antifuses in integrated
circuits
    • 用于提高集成电路中反熔丝可靠性的电路
    • US5838624A
    • 1998-11-17
    • US850902
    • 1997-05-02
    • David J. PillingRaymond M. ChuSik K. Lui
    • David J. PillingRaymond M. ChuSik K. Lui
    • G11C17/18G11C17/16
    • G11C17/18
    • A circuit improves the reliability of antifuses in certain types of systems by substantially eliminating the continuous undesirable applications of voltages across antifuse terminals. To accomplish this, an antifuse has applied across its two terminals a "reading" or "evaluation" voltage as required by the system operation for a single read or evaluation clock period (typically 5 ns to 30 ns in duration). The signal describing the state of the antifuse is then stored in a latch, register, or other suitable structure for subsequent sampling. In this manner, a low read current flows in the antifuse in response to the standard chip operating voltage for only a short period of time such as a single clock cycle. Thus, continuous voltages across the two terminals of the antifuse are avoided and an unprogrammed antifuse is not inadvertently programmed and a programmed antifuse is not inadvertently converted back to its high impedance state (i.e. "unprogrammed"). In another embodiment, a multiplexer coupled to a terminal of the antifuse switches the terminal of the antifuse to a programming voltage node when the antifuse is selected for programming and to a reference voltage source when the antifuse is not selected for programming. The multiplexer prevents undesired voltages from being applied across the antifuse while other antifuses are being programmed. The two embodiments discussed may be used in conjunction with each other or separately.
    • 电路通过基本消除反熔丝端子上的电压的连续不期望的应用来提高某些类型系统中反熔丝的可靠性。 为了实现这一点,反熔丝在其两个端子上施加了对于单个读取或评估时钟周期(通常为5ns至30ns的持续时间)的系统操作所需的“读取”或“评估”电压。 然后将描述反熔丝的状态的信号存储在锁存器,寄存器或其他合适的结构中,用于随后的采样。 以这种方式,仅在短时间段(例如单个时钟周期)内,低反向电流响应于标准芯片工作电压而流过反熔丝。 因此,避免了反熔丝两端的连续电压,并且不会无意地编程未编程的反熔丝,并且编程的反熔丝不会无意中转换回其高阻抗状态(即“未编程”)。 在另一个实施例中,当反熔丝被选择用于编程时,耦合到反熔丝的端子的多路复用器将反熔丝的端子切换到编程电压节点,并且当反熔丝未被选择用于编程时,将其转换为参考电压源。 多路复用器防止在反熔丝跨越反熔丝而施加不需要的电压,而其他反熔丝被编程。 所讨论的两个实施例可以彼此结合使用或分开使用。