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    • 24. 发明授权
    • Motor with aerodynamic pressure bearing mechanism
    • 电机带气动压力承载机构
    • US08449189B2
    • 2013-05-28
    • US12451665
    • 2008-05-21
    • Akiyoshi TakahashiToshiya Uchida
    • Akiyoshi TakahashiToshiya Uchida
    • F16C32/06
    • F16C17/10F16C17/026F16C17/045F16C33/1015
    • In a gas dynamic pressure bearing mechanism (1) for smoothing rotary motion of a shaft (10) by feeding gas to the bearing clearance between the shaft (10) and a fixed sleeve (20) for supporting the shaft (10) through a herring bone groove (10a), the herring bone groove (10a) is provided in the shaft (10) such that pressure distribution generated in the bearing clearance moves at a high speed. The herring bone groove (10a) consists of N grooves such that N minimal pressure values appearing alternately with maximal pressure values at the positions where the maximal pressure values of dynamic pressure variation appear in the bearing clearance when the shaft (10) rotates have such an interval as it becomes lower than the condensation pressure value.
    • 在用于通过将气体输送到轴(10)和用于通过鲱鱼支撑轴(10)的固定套筒(20)之间的轴承间隙的方法来平滑轴(10)的旋转运动的气体动压轴承机构(1) 骨槽(10a),在轴(10)中设置有珩骨槽(10a),使得在轴承间隙中产生的压力分布高速移动。 鲱鱼骨槽(10a)由N个沟槽组成,使得当轴(10)旋转时在轴承间隙中出现动态压力变化的最大压力值的位置处交替具有最大压力值的N个最小压力值具有这样的 间隔,因为它变得低于冷凝压力值。
    • 25. 发明申请
    • Memory device, memory controller and memory system
    • 内存设备,内存控制器和内存系统
    • US20080151677A1
    • 2008-06-26
    • US11698286
    • 2007-01-26
    • Takahiko SatoToshiya UchidaTatsuya KandaTetsuo MiyamotoSatoru ShirakawaYoshinobu YamamotoTatsushi OtsukaHidenaga TakahashiMasanori KuritaShinnosuke KamataAyako Sato
    • Takahiko SatoToshiya UchidaTatsuya KandaTetsuo MiyamotoSatoru ShirakawaYoshinobu YamamotoTatsushi OtsukaHidenaga TakahashiMasanori KuritaShinnosuke KamataAyako Sato
    • G11C8/12
    • G11C11/4087G09G5/393G09G5/395G11C8/12
    • An image memory, image memory system, and memory controller that are capable of efficiently accessing a rectangular area of two-dimensionally arrayed data are provided. The memory device has: a memory cell array that has a plurality of memory unit areas, each of which is selected by addresses; a plurality of input/output terminals; and an input/output unit provided between the memory cell array and the plurality of input/output terminals. Each of the memory unit areas stores therein data of a plurality of bytes or bits corresponding to the plurality of input/output terminals respectively, and the memory cell array and the input/output unit access a plurality of bytes or bits stored in a first memory unit area corresponding to the input address and in a second memory unit area adjacent to the first memory unit on the basis of the input address and combination information of the bytes or bits in response to a first operation code, and then, from the plurality of bytes or bits within the accessed first and second memory unit areas, associate a combination of the plurality of bytes or bits based on the combination information, with the plurality of input/output terminals.
    • 提供能够有效地访问二维排列数据的矩形区域的图像存储器,图像存储器系统和存储器控制器。 存储装置具有:具有多个存储单元区域的存储单元阵列,每个存储单元区域由地址选择; 多个输入/输出端子; 以及设置在存储单元阵列和多个输入/输出端子之间的输入/输出单元。 每个存储单元区域分别存储与多个输入/输出端子相对应的多个字节或位的数据,并且存储单元阵列和输入/输出单元访问存储在第一存储器中的多个字节或位 基于与第一操作码相对应的字节或比特的输入地址和组合信息,与第一存储器单元相邻的第二存储器单元区域中的对应于输入地址的单位区域和与第一存储器单元相邻的第二存储单元区域中, 在所访问的第一和第二存储器单元区域内的字节或比特,基于组合信息将多个字节或比特的组合与多个输入/输出终端相关联。
    • 26. 发明申请
    • Semiconductor memory, system, testing method for system
    • 半导体存储器,系统,系统测试方法
    • US20080104458A1
    • 2008-05-01
    • US11907996
    • 2007-10-19
    • Toshiya Uchida
    • Toshiya Uchida
    • G06F11/277
    • G11C29/36G11C2029/0401G11C2029/3602
    • A plurality of test patterns generated by a test pattern generator is output from a first memory chip to test a second memory chip, which is of a different type from the first memory chip and mounted in the same package. Therefore, when different types of memory chips are mounted in the same package, the memory chip is tested even no terminal of the memory chip is connected to an external terminal of a system. Since there is no need to form any useless terminal in the system, system cost is reduced. Since a testing apparatus generating complicated test patterns is made unnecessary, test cost is reduced. The test pattern generator is constructed using nonvolatile logic and therefore, tests can be carried out without preparing test patterns in advance. Consequently, a user who purchases the first and second memory chips to construct a system can also carry out tests easily.
    • 从第一存储器芯片输出由测试图形发生器产生的多个测试图案,以测试与第一存储器芯片不同类型并安装在相同封装中的第二存储器芯片。 因此,当不同类型的存储器芯片安装在相同的封装中时,即使没有存储器芯片的端子连接到系统的外部端子,也对存储器芯片进行测试。 由于不需要在系统中形成无用的终端,所以系统成本降低。 由于不需要产生复杂的测试图案的测试装置,所以测试成本降低。 使用非易失性逻辑构造测试图形生成器,因此可以在不预先准备测试图案的情况下进行测试。 因此,购买第一和第二存储器芯片以构建系统的用户也可以容易地进行测试。
    • 29. 发明授权
    • Input/output interfacing circuit, input/output interface, and semiconductor device having input/out interfacing circuit
    • 输入/输出接口电路,输入/输出接口和具有输入/输出接口电路的半导体器件
    • US06876225B2
    • 2005-04-05
    • US10178559
    • 2002-06-25
    • Yoshimasa YagishitaToshiya Uchida
    • Yoshimasa YagishitaToshiya Uchida
    • G06F3/00H03K19/00H03K19/0175H03K19/20H03K17/16
    • H03K19/0002H03K19/017509
    • The current generating unit in the transmitter generates output currents in accordance with a plurality of logic values. The reference current generating unit in the receiver generates a plurality of reference currents. The current comparing units in the receiver respectively compares reference currents with output current from the transmitter and restores the logic values. That is, the current is varied in correspondence with the logic values that are transmitted from the transmitter to the receiver, wherein the logic values are restored in the receiver according to a difference in the current value. Forming a plurality of current comparing units in the receiver makes it possible to easily compare the values of the output current from the transmitter and a plurality of reference currents. Therefore, the number of multi-valued bits can be easily increased so as to construct a high bit-rate multi-valued input/output interface.
    • 发射机中的电流产生单元根据多个逻辑值产生输出电流。 接收器中的参考电流产生单元产生多个参考电流。 接收器中的当前比较单元分别将参考电流与来自发射器的输出电流进行比较,并恢复逻辑值。 也就是说,电流根据从发射机发送到接收机的逻辑值而变化,其中根据当前值的差异在接收机中恢复逻辑值。 在接收机中形成多个电流比较单元使得可以容易地比较来自发射器的输出电流和多个参考电流的值。 因此,可以容易地增加多值比特的数量,以便构成高比特率多值输入/输出接口。
    • 30. 发明授权
    • Input/output interfacing circuit, input/output interface, and semiconductor device having input/out interfacing circuit
    • 输入/输出接口电路,输入/输出接口和具有输入/输出接口电路的半导体器件
    • US06696859B2
    • 2004-02-24
    • US10178519
    • 2002-06-25
    • Yoshimasa YagishitaToshiya Uchida
    • Yoshimasa YagishitaToshiya Uchida
    • H03K190175
    • H03K19/0002H03K19/017509
    • The current generating unit in the transmitter generates output currents in accordance with a plurality of logic values. The reference current generating unit in the receiver generates a plurality of reference currents. The current comparing units in the receiver respectively compares reference currents with output current from the transmitter and restores the logic values. That is, the current is varied in correspondence with the logic values that are transmitted from the transmitter to the receiver, wherein the logic values are restored in the receiver according to a difference in the current value. Forming a plurality of current comparing units in the receiver makes it possible to easily compare the values of the output current from the transmitter and a plurality of reference currents. Therefore, the number of multi-valued bits can be easily increased so as to construct a high bit-rate multi-valued input/output interface.
    • 发射机中的电流产生单元根据多个逻辑值产生输出电流。 接收器中的参考电流产生单元产生多个参考电流。 接收器中的当前比较单元分别将参考电流与来自发射器的输出电流进行比较,并恢复逻辑值。 也就是说,电流根据从发射机发送到接收机的逻辑值而变化,其中根据当前值的差异在接收机中恢复逻辑值。 在接收机中形成多个电流比较单元使得可以容易地比较来自发射器的输出电流和多个参考电流的值。 因此,可以容易地增加多值比特的数量,以便构成高比特率多值输入/输出接口。