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    • 15. 发明授权
    • Semiconductor memory device having error correction function for data reading during refresh operation
    • 具有用于刷新操作期间的数据读取的纠错功能的半导体存储器件
    • US06535452B2
    • 2003-03-18
    • US10097621
    • 2002-03-15
    • Masaki OkudaToshiya Uchida
    • Masaki OkudaToshiya Uchida
    • G11C800
    • G06F11/1032G11C7/1006G11C11/406G11C11/4096G11C2207/002G11C2207/065G11C2207/108
    • A semiconductor memory device includes a plurality of memory blocks, each of which is refreshed independently of one another, m (m>1) data pins, each of which continuously receives or outputs n (n>1) data pieces, a conversion circuit which converts data of each of the data pins between parallel data and serial data, m×n data bus lines on which the n data pieces are expanded in parallel with respect to each of the m data pins, m address selection lines which are connected to m respective blocks of the memory blocks corresponding to the m respective data pins, and are simultaneously activated, the activation of any one of the address selection lines connecting the data bus lines to a corresponding one of the m respective blocks and resulting in the n data pieces being input/output to/from the corresponding one of the m respective blocks.
    • 一种半导体存储器件包括多个存储块,每个存储块彼此独立地刷新,m(m> 1)个数据引脚,每个存储块连续地接收或输出n(n> 1)个数据段,转换电路 在并行数据和串行数据之间转换每个数据引脚的数据,相对于每个m个数据引脚并行扩展n个数据段的m×n数据总线,连接到m个相应块的m个地址选择线 的对应于各个数据引脚的存储器块,并且同时被激活,将数据总线线路中的任何一个地址选择线激活到相应的m个块中的相应一个,并且导致n个数据段被输入 /输出到相应的m个相应块中的一个。
    • 18. 发明授权
    • Memory device
    • 内存设备
    • US6104659A
    • 2000-08-15
    • US338599
    • 1999-06-23
    • Yoshimasa YagishitaToshiya UchidaMasaki Okuda
    • Yoshimasa YagishitaToshiya UchidaMasaki Okuda
    • G11C11/413G05F1/00G11C5/14G11C11/401G11C11/406G11C11/407G11C7/00
    • G11C5/143G11C5/147
    • A memory device comprises: a plurality of banks each of which includes an array of memory cells; and at least a first and a second internal power generator, provided for each of the plurality of banks, for generating an internal power source voltage which differs from a voltage supplied by an external power source. If the internal common power source voltage in the memory device is lower than the first voltage when the power is on, the first and the second internal power generators in a plurality of banks are activated so as to rapidly raise the common internal power source voltage. When the common internal power source voltage in the memory device is higher than the first voltage and lower than the second voltage, the second internal power generators in the banks are activated to compensate for a drop in the internal power source voltage, which is caused by current leakage. When the internal power source voltage in a bank in the activated state is lower than the third voltage, the first and the second internal power generators in the corresponding bank are activated and satisfactorily drive the internal power source voltage in the bank so as to operate the memory device at a high speed.
    • 存储器件包括:多个存储体,每个存储体包括存储器单元的阵列; 以及为多个组中的每一个提供的至少第一和第二内部发电机,用于产生不同于由外部电源提供的电压的内部电源电压。 如果在电源接通时存储器件内部的公共电源电压低于第一电压,则多个组中的第一和第二内部发电机被激活,以便迅速提高公共内部电源电压。 当存储器件中的公共内部电源电压高于第一电压并低于第二电压时,该组中的第二内部发电机被激活以补偿内部电源电压的下降,这是由 电流泄漏。 当处于激活状态的组中的内部电源电压低于第三电压时,相应组中的第一和第二内部发电机被激活并令人满意地驱动组中的内部电源电压,以便操作 高速存储设备。