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    • 15. 发明授权
    • Method and materials for patterning a neutral surface
    • 用于图案化中性面的方法和材料
    • US07790350B2
    • 2010-09-07
    • US11882163
    • 2007-07-30
    • Gregory BreytaMatthew E. Colburn
    • Gregory BreytaMatthew E. Colburn
    • G03F7/00G03F7/004
    • H01L21/31144B82Y10/00H01L21/7682
    • A self assembly step for the manufacture of an electronic component comprising, e.g., a semiconductor chip or semiconductor array or wafer comprises forming a block copolymer film placed on a random copolymer film substrate operatively associated with the electronic component and the block copolymer film wherein the surface energy of the random copolymer film is tailored by use of a photolithographic or chemical process prior to the self assembly step. By prior deterministic control over regional surface properties of the random copolymer film, domains of the block copolymer film form only in predefined areas. This approach offers simplified processing and a precise control of regions where domain formation occurs. Selective removal of some of the domains allows for further processing of the electronic component.
    • 用于制造包括例如半导体芯片或半导体阵列或晶片的电子部件的自组装步骤包括形成位于与电子部件和嵌段共聚物膜操作相关的无规共聚物膜基材上的嵌段共聚物膜,其中表面 在自组装步骤之前,通过使用光刻或化学方法来调整无规共聚物膜的能量。 通过对无规共聚物膜的区域表面性质的先前确定性控制,嵌段共聚物膜的畴仅形成在预定区域中。 这种方法提供简化的处理和精确控制域形成发生的区域。 某些域的选择性删除允许进一步处理电子元件。
    • 17. 发明授权
    • Photoresists for visible light imaging
    • 用于可见光成像的光致抗蚀剂
    • US07354692B2
    • 2008-04-08
    • US11125971
    • 2005-05-09
    • Gregory BreytaDaniel Joseph DawsonCarl E. LarsonGregory Michael Wallraff
    • Gregory BreytaDaniel Joseph DawsonCarl E. LarsonGregory Michael Wallraff
    • G03F7/031G03F7/038G03F7/039
    • G03F7/0392G03F7/001G03F7/031G03F7/2004Y10S430/115Y10S430/127
    • A class of lithographic photoresist combinations is disclosed which is suitable for use with visible light and does not require a post-exposure bake step. The disclosed photoresists are preferably chemical amplification photoresists and contain a photosensitizer having the structure of formula (I): where Ar1 and Ar2 are independently selected from monocyclic aryl and monocyclic heteroaryl, R1 and R2 may be the same or different, and have the structure —X—R3 where X is O or S and R3 is C1-C6 hydrocarbyl or heteroatom-containing C1-C6 hydrocarbyl, and R4 and R5 are independently selected from the group consisting of hydrogen and —X—R3, or, if ortho to each other, may be taken together to form a five- or six-membered aromatic ring, with the proviso that any heteroatom contained within Ar1, Ar2, or R3 is O or S. The use of the disclosed photoresists, particularly for the manufacture of holographic diffraction gratings, is also disclosed.
    • 公开了一类光刻抗蚀剂组合物,其适用于可见光并且不需要曝光后烘烤步骤。 所公开的光致抗蚀剂优选是化学放大光致抗蚀剂,并含有具有式(I)结构的光敏剂:其中Ar 1和Ar 2独立地选自单环芳基和单环杂芳基 R 1和R 2可以相同或不同,并且具有结构-XR 3,其中X是O或S,R“ SUP> 3是C 1 -C 6烃基或含杂原子的C 1 -C 6 N >烃基,R 4和R 5独立地选自氢和-XR 3 O 3,或者如果各自的邻位 另一个可以一起形成五元或六元芳环,条件是含有Ar 1,Ar 2或R 0的任何杂原子 > 3 是O或S.还公开了所公开的光致抗蚀剂的使用,特别是用于制造全息衍射光栅。