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    • 3. 发明申请
    • OPTICAL ELEMENT MODULE WITH IMAGING ERROR AND POSITION CORRECTION
    • 具有成像误差和位置校正的光学元件模块
    • WO2008122626A3
    • 2009-01-15
    • PCT/EP2008054154
    • 2008-04-07
    • ZEISS CARL SMT AGGELLRICH BERNHARDKUGLER JENSLIMBACH GUIDO
    • GELLRICH BERNHARDKUGLER JENSLIMBACH GUIDO
    • G03F7/20G02B7/02
    • G03F7/70825G02B7/023G02B27/0068G03F7/70258
    • There is provided an optical element module (106) comprising an optical element (107) and a support structure (108) supporting the optical element, the support structure comprising a first holding structure (109), an intermediate structure (110) and a second holding structure (111). The first holding structure (109) contacts the optical element (107) and is adapted to adjustably introduce defined deformations into the optical element. The intermediate structure (110) supports the first holding structure (109) while the second holding structure (111) supports the intermediate structure (110) and is adapted to adjust the -position of the intermediate structure. The optical element module is used 'in microlithography systems for compensating aberrations. The holding structures are arranged Kinematically in series. Also provided is an optical element module wherein the first holding structure is adapted to adjust the position and the second is adapted to adjustably introduce deformations. Further provided is an optical element module wherein one of the deformation or position adjustment is omitted.
    • 提供了一种包括光学元件(107)和支撑光学元件的支撑结构(108)的光学元件模块(106),该支撑结构包括第一保持结构(109),中间结构(110)和第二 保持结构(111)。 第一保持结构(109)接触光学元件(107)并且适于将限定的变形引入到光学元件中。 中间结构(110)支撑第一保持结构(109),而第二保持结构(111)支撑中间结构(110)并且适于调节中间结构的位置。 光学元件模块用于微光学系统中用于补偿像差。 保持结构以运动学方式排列。 还提供了一种光学元件模块,其中第一保持结构适于调节位置,第二保持结构适于可调节地引入变形。 还提供了一种光学元件模块,其中省略了变形或位置调整之一。
    • 6. 发明申请
    • MICROLITHOGRAPHIC PROJECTION EXPOSURE SYSTEM, AND METHOD FOR INTRODUCING AN IMMERSION LIQUID INTO AN IMMERSION CHAMBER
    • 微光刻投射曝光装置和方法,用于引入浸渍于液浸ROOM
    • WO2005015315A2
    • 2005-02-17
    • PCT/EP2004007456
    • 2004-07-08
    • ZEISS CARL SMT AGGELLRICH BERNHARDREISINGER GERDSCHMEREK DIETERKUGLER JENS
    • GELLRICH BERNHARDREISINGER GERDSCHMEREK DIETERKUGLER JENS
    • G03F7/20
    • G03F7/70341
    • The invention relates to a projection exposure system for microlithography, said system comprising an illumination device for generating a projection light, and a projection objective comprising a plurality of optical elements such as lenses (L5) and enabling a reticle that can be arranged in an object plane of the projection objective to be imaged onto a light-sensitive surface (26) that can be arranged in an image plane of the projection objective and is applied to a carrier (30). The inventive system is also provided with an immersion device between an image-side last optical element (L5) of the projection objective and the light-sensitive surface (26), for introducing an immersion liquid (34) into an immersion chamber (50). Said immersion device comprises means (44; 66) which can prevent the appearance of gas bubbles (48) in the immersion liquid (34), affecting the imaging quality, and/or can remove existing gas bubbles (48). Said means can be, for example, an ultrasound source (66) or a degasifier (44).
    • 用于微光刻的投射曝光系统包括一个照明装置,用于产生投射光,并且具有多个光学元件,例如一个投影透镜例如 透镜(L5),其可以在投射物镜的物面被布置成与可以在掩模版被设置在所述投影透镜的像面和在载体(30)施加的光敏感表面(26)可以被成像。 此外,提供了用于引入的浸没液体(34)到所述投射物镜的像侧最后光学元件(L5)和感光表面(26)之间的浸没空间(50)的浸入设备。 浸渍装置包括装置(44; 66),通过该能够防止在浸没液体(34)的成像质量损害气泡(48)的发生和/或可能已经被移除时发生气泡(48)。 这些装置可以是,例如 超声波源(66)或一个脱气装置(44)的行为。
    • 8. 发明申请
    • IMAGING OPTICAL SYSTEM FOR MICROLITHOGRAPHY
    • 成像光学系统的微观算法
    • WO2012041459A3
    • 2012-08-30
    • PCT/EP2011004744
    • 2011-09-22
    • ZEISS CARL SMT GMBHROGALSKY OLAFSCHNEIDER SONJABITTNER BORISKUGLER JENSGELLRICH BERNHARDFREIMANN ROLF
    • ROGALSKY OLAFSCHNEIDER SONJABITTNER BORISKUGLER JENSGELLRICH BERNHARDFREIMANN ROLF
    • G03F7/20G02B27/00
    • G02B17/06G02B17/0663G02B27/0012G03F7/70258G03F7/70308G03F7/70891
    • An imaging optical system (10), in particular a projection objective, for microlithography, comprises optical elements (M1-M6) configured to guide electromagnetic radiation (19) with a wavelength ? in an imaging beam path for imaging an object field (13) into an image plane (14), and a pupil (24), having coordinates (p, q) which, together with the image field (16), having coordinates (x, y), of the optical system (10), spans an extended 4-dimensional pupil space, having coordinates (x, y, p, q) as a function of which a wavefront W(x, y, p, q) of the radiation (19) passing through the optical system is defined. At least a first of the optical elements (M1-M6) has a non-rotationally symmetrical surface (26) having a respective surface deviation in relation to every rotationally symmetrical surface (28), which two-dimensional surface has a difference between its greatest elevation and its deepest valley of at least ?. A sub-aperture ratio of the non- rotationally symmetrical surface deviates at every point (?1, O2) of the object field (13) by at least 0.01 from the sub-aperture ratio of every other surface of the optical elements, which is located in the imaging beam path, at the respective point (O1, O2) of the object field (13). Furthermore, the surface (26) of the first optical element (M4) is configured such that by displacing the first optical element relative to the other optical elements a change to the wavefront of the optical system (10) can be brought about which has a portion with at least 2-fold symmetry, the maximum value of the wavefront change in the extended 4- dimensional pupil space being at least 1 x 10-5 of the wavelength ?.
    • 用于微光刻的成像光学系统(10),特别是投影物镜包括光学元件(M1-M6),其被配置为引导具有波长λ的电磁辐射(19) 在用于将物场(13)成像到图像平面(14)的成像光束路径中,以及具有坐标(p,q)的光瞳(24),其与图像场(16)一起具有坐标(x, (x,y,p,q)的波前W(x,y,p,q)的函数,跨越具有坐标(x,y,p,q)的扩展的4维瞳孔空间, 定义通过光学系统的辐射(19)。 至少第一光学元件(M1-M6)具有相对于每个旋转对称表面(28)具有相应表面偏差的非旋转对称表面(26),该二维表面具有最大的 海拔及其最深的山谷至少? 非旋转对称表面的子孔径比从物体场(13)的每个点(θ1,O 2)偏离光学元件的每个其他表面的子孔径比至少0.01,这是 位于成像光束路径中,位于物场(13)的相应点(O1,O2)处。 此外,第一光学元件(M4)的表面(26)被配置为使得通过相对于其它光学元件移位第一光学元件,可以使光学系统(10)的波前的改变具有 具有至少2倍对称性的部分,扩展的四维光瞳空间中的波前变化的最大值为波长λ的至少1×10 -5。