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    • 6. 发明申请
    • SEMICONDUCTOR LIGHT EMITTING DEVICE UTILISING PUNCH-THROUGH EFFECTS
    • 半导体发光器件利用穿孔效应
    • WO2009093177A1
    • 2009-07-30
    • PCT/IB2009/050209
    • 2009-01-21
    • INSIAVA (PTY) LIMITEDDU PLESSIS, MonukoSNYMAN, Lukas Willem
    • DU PLESSIS, MonukoSNYMAN, Lukas Willem
    • H01L33/00
    • H01L33/0016H01L33/34
    • A light emitting device (10) comprises a body (12) of a semiconductor material. A first junction region (14) is formed in the body between a first region (12.1 ) of the body of a first doping kind and a second region (12.2) of the body of a second doping kind. A second junction region (16) is formed in the body between the second region (12.2) of the body and a third region (12.3) of the body of the first doping kind. A terminal arrangement (18) is connected to the body for, in use, reverse biasing the first junction region (14) into a breakdown mode and for forward biasing at least part (16.1) of the second junction region (16), to inject carriers towards the first junction region (14). The device (10) is configured so that a first depletion region (20) associated with the reverse biased first junction region (14) punches through to a second depletion region associated with the forward biased second junction region (16).
    • 发光器件(10)包括半导体材料的主体(12)。 第一接合区域(14)在第一掺杂类型的主体的第一区域(12.1)和第二掺杂类型的主体的第二区域(12.2)之间的主体中形成。 在本体的第二区域(12.2)和第一掺杂类型的主体的第三区域(12.3)之间的主体中形成第二接合区域(16)。 端子装置(18)连接到主体,用于在使用时将第一接合区域(14)反向偏置成击穿模式并且用于向第二接合区域(16)的至少一部分(16.1)进行偏置,以便将其注入 载体朝向第一接合区域(14)。 器件(10)被配置为使得与反向偏置的第一接合区域(14)相关联的第一耗尽区域(20)穿过与正向偏置的第二接合区域(16)相关联的第二耗尽区域。
    • 7. 发明申请
    • SILICON LIGHT EMITTING DEVICE WITH CARRIER INJECTION
    • 具有载体注射的硅光发射装置
    • WO2009047716A1
    • 2009-04-16
    • PCT/IB2008/054122
    • 2008-10-08
    • INSIAVA (PTY) LIMITEDDU PLESSIS, Monuko
    • DU PLESSIS, Monuko
    • H01L33/00H01L27/15
    • H01L33/34H01L27/15H01L33/0008H01L33/0016H01L33/54
    • A light emitting device (10) comprises a first body (12) of an indirect bandgap semiconductor material. A first junction region (18) in the body is formed between a first region (12.1 ) of the body of a first doping kind and a second region (12.2) of the body of a second doping kind. A second junction (20) region in the body is formed between the second region of the body and a third region of the body of the first doping kind. The first and second junction regions being spaced from one another by not further than a minority carrier diffusion length. A terminal arrangement is connected to the first, second and third regions of the body for, in use, reverse biasing the first junction region into avalanche or field emission mode and for forward biasing the second junction region to inject carriers into the first junction region. A second body (22) of an isolation material is located immediately adjacent at least one wall of the third region, thereby to reduce parasitic injection from the third region.
    • 发光器件(10)包括间接带隙半导体材料的第一本体(12)。 主体中的第一接合区域(18)形成在第一掺杂类型的主体的第一区域(12.1)和第二掺杂类型的主体的第二区域(12.2)之间。 主体的第二结区(20)区域形成在主体的第二区域和第一掺杂类型的主体的第三区域之间。 第一和第二结区彼此间隔不超过少数载流子扩散长度。 端子装置连接到主体的第一,第二和第三区域,用于在使用时将第一接合区域反向偏置成雪崩或场致发射模式,并且用于向前偏置第二接合区域以将载流子注入第一接合区域。 隔离材料的第二主体(22)紧邻第三区域的至少一个壁,从而减少从第三区域的寄生注入。
    • 9. 发明申请
    • LIGHT EMITTING DEVICE WITH ENCAPSULATED REACH-THROUGH REGION
    • 具有穿透区域的发光装置
    • WO2010070509A1
    • 2010-06-24
    • PCT/IB2009/055362
    • 2009-11-26
    • INSIAVA (PTY) LIMITEDDU PLESSIS, Monuko
    • DU PLESSIS, Monuko
    • H01L33/34H01L33/00
    • H01L33/0016H01L33/20H01L33/34
    • A light emitting device (10) comprises an elongate first body (12) of a semiconductor material. A transverse junction (18) is formed in the first body between a first n+-type region ( 12.1 ) of the first body and a second p-type region (12.2). A third p + -type region (1 2.3) is spaced from the first region by the second region. A second body (22) of an isolation material is provided immediately adjacent at least part of the second region to at least partially encapsulate the first body. A terminal arrangement (28) is connected to the first body and is arranged to reverse bias the junction (18) into a breakdown mode. The device is configured such that a depletion region associated with the junction (18) extends through the second region ( 12.2) and reaches the third region (12.3) before the junction (18) enters the breakdown mode.
    • 发光器件(10)包括半导体材料的细长第一体(12)。 在第一主体中,在第一主体的第一n +型区域(12.1)和第二p型区域(12.2)之间形成横向结(18)。 第三p +型区域(13.3)与第一区域间隔第二区域。 隔离材料的第二主体(22)紧邻第二区域的至少一部分提供,以至少部分地封装第一主体。 端子装置(28)连接到第一主体并且被布置成将接合部(18)反向偏置成击穿模式。 器件被配置为使得与结(18)相关联的耗尽区在结(18)进入击穿模式之前延伸穿过第二区(12.2)并到达第三区(12.3)。
    • 10. 发明申请
    • SEMICONDUCTOR LIGHT EMITTING DEVICE COMPRISING HETEROJUNCTION
    • 包含异常的半导体发光器件
    • WO2009095886A2
    • 2009-08-06
    • PCT/IB2009/050378
    • 2009-01-30
    • INSIAVA (PTY) LIMITEDSNYMAN, Lukas, WillemDU PLESSIS, Monuko
    • SNYMAN, Lukas, WillemDU PLESSIS, Monuko
    • H01L33/00
    • H01L33/34H01L33/0016H01L33/02
    • A semiconductor light emitting device (10) comprises a semiconductor structure (12) comprising a first body (14) of a first semiconductor material (in this case Ge) comprising a first region of a first doping kind (in this case n) and a second body (18) of a second semiconductor material (in this case Si) comprising a first region of a second doping kind (in this case p). The structure comprises a junction region (15) comprising a first heterojunction (16) formed between the first body (14) and the second body (18) and a pn junction (17) formed between regions of the structure of the first and second doping kinds respectively. A biasing arrangement (20) is connected to the structure for, in use, reverse biasing the pn junction, thereby to cause emission of light.
    • 半导体发光器件(10)包括半导体结构(12),其包括第一半导体材料(在这种情况下为Ge)的第一主体(14),该第一半导体本体(14)包括第一掺杂类型(在这种情况下为n)的第一区域和 第二半导体材料(在这种情况下为Si)的第二主体(18)包括第二掺杂类型(在这种情况下为p)的第一区域。 该结构包括连接区域(15),其包括形成在第一主体(14)和第二主体(18)之间的第一异质结(16)和形成在第一和第二掺杂结构的区域之间的pn结(17) 种类。 偏置装置(20)连接到结构,在使用中反向偏置pn结,从而引起光的发射。