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    • 7. 发明申请
    • STRUCTURED GAP FOR A MEMS PRESSURE SENSOR
    • MEMS压力传感器的结构差距
    • WO2014088976A1
    • 2014-06-12
    • PCT/US2013/072694
    • 2013-12-02
    • ROBERT BOSCH GMBHGRAHAM, Andrew, B.YAMA, GaryO'BRIEN, Gary
    • GRAHAM, Andrew, B.YAMA, GaryO'BRIEN, Gary
    • G01L9/00B81C1/00
    • B81C1/00642B81B3/0021G01L9/0047G01L9/0073
    • A method of fabricating a pressure sensor (30) includes performing a chemical vapor deposition (CVD) process to deposit a first sacrificial layer having a first thickness onto a substrate (12). A portion of the first sacrificial layer is then removed down to the substrate to form a central region of bare silicon. One of a thermal oxidation process and an atomic layer deposition process is then performed to form a second sacrificial layer on the substrate having a second thickness in the central region that is less than the first thickness. A cap layer(14) is then deposited over the first and second sacrificial layers. The second sacrificial layer is removed from the central region, and the first and second sacrificial layers are removed from a perimeter region that at least partially surrounds the central region on the substrate to form a contiguous, structured gap between the cap layer and the substrate, the structured gap having a first width in the central region and a second width in the perimeter region with the second width being greater than the first width.
    • 制造压力传感器(30)的方法包括进行化学气相沉积(CVD)工艺以将具有第一厚度的第一牺牲层沉积到衬底(12)上。 然后将第一牺牲层的一部分下移到衬底以形成裸硅的中心区域。 然后执行热氧化工艺和原子层沉积工艺之一,以在衬底上形成第二牺牲层,其中心区域的第二厚度小于第一厚度。 然后在第一和第二牺牲层上沉积覆盖层(14)。 从中心区域去除第二牺牲层,并且从周边区域去除第一和第二牺牲层,周边区域至少部分地围绕衬底上的中心区域,以在盖层和衬底之间形成连续的,结构化的间隙, 所述结构化间隙在所述中心区域具有第一宽度,并且所述周边区域中的第二宽度具有大于所述第一宽度的所述第二宽度。