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    • 2. 发明申请
    • ADJUSTING CLOCK ERROR ACROSS A CIRCUIT INTERFACE
    • 通过电路接口调整时钟错误
    • WO2008153645A2
    • 2008-12-18
    • PCT/US2008/005858
    • 2008-05-02
    • RAMBUS, INC.CHIU, Glenn
    • CHIU, Glenn
    • H03L1/00
    • G11C7/1072G11C7/222G11C2207/2254
    • A system is provided with clock skew measurement and correction technology. A first circuit or memory controller 4 includes measuring circuits to measure relative timing or phase offsets of multiple clock signals of a second circuit or memory 6. One measuring circuit is configured for incremental changing of the phase of a transmitted test data sequence to measure and correct timing of a memory receiver circuit's quadrature clocks based on results of a data comparison of transmitted and received test data. Another measuring circuit is configured to scan a received test data sequence for data transitions to measure and correct timing of a memory transmitter circuit ' s quadrature clocks based on spacing or timing between detected transitions. Individual memory clock generators 30 are controlled with adjustable delay circuits 47 for changing phase of different clock signals of the memory to set the clock signals based on the measurements of the controller.
    • 系统提供时钟偏差测量和校正技术。 第一电路或存储器控制器4包括用于测量第二电路或存储器6的多个时钟信号的相对定时或相位偏移的测量电路。一个测量电路被配置为用于逐渐改变发送的测试数据序列的相位以测量和校正 基于发送和接收的测试数据的数据比较的结果,存储器接收器电路的正交时钟的定时。 另一测量电路被配置为扫描接收到的测试数据序列用于数据转换,以基于检测到的转换之间的间隔或定时来测量和校正存储器发射器电路的正交时钟的定时。 单个存储器时钟发生器30由可调延迟电路47控制,用于改变存储器的不同时钟信号的相位,以基于控制器的测量值设置时钟信号。