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    • 2. 发明申请
    • APPARATUSES AND METHODS FOR STUDYING MATERIAL PROPERTIES
    • 用于研究材料性质的装置和方法
    • WO2007107636A1
    • 2007-09-27
    • PCT/FI2007/050147
    • 2007-03-19
    • OY KESKUSLABORATORIO - CENTRALLABORATORIUM ABPUUKKO, PasiMAIJALA, JuhaHELLÉN, ErkkiSALMINEN, LauriALAVA, Mikko
    • PUUKKO, PasiMAIJALA, JuhaHELLÉN, ErkkiSALMINEN, LauriALAVA, Mikko
    • G01R29/12G01N33/34G01N27/60G01R19/145
    • G01N33/346G01N27/60
    • The invention relates to a method and devices for measuring the electrical properties of a planar base material, and a new use. In the method the surface potential of the base material (20) is altered locally, and the surface potential is measured with the aid of a measuring element (200), which is located in the vicinity of the surface of the base material (20). According to the invention, a measuring head, which comprises a measuring edge (29) and a sensor electrode (21) located at a distance from the measuring edge (29) and a counter electrode (23) located in turn at a distance from the sensor electrode (21), is used as the measuring element (200), the sensor electrode being at least partly surrounded with an insulator material (22) with a high permittivity. During measurement, the measuring edge (29) of the measuring head is arranged to be essentially in contact with the base material (20). With the aid of the invention the electrical non-homogeneity of paper, for example, can be detected more accurately, for example, during printing processes.
    • 本发明涉及一种用于测量平面基材的电性能的方法和装置,以及新的用途。 在该方法中,基体材料(20)的表面电位局部改变,借助于位于基材(20)表面附近的测量元件(200)来测量表面电位, 。 根据本发明,测量头包括位于与测量边缘(29)一定距离的测量边缘(29)和传感器电极(21)以及反向电极(23) 传感器电极(21)用作测量元件(200),传感器电极至少部分地被具有高介电常数的绝缘材料(22)包围。 在测量期间,测量头的测量边缘(29)布置成基本上与基底材料(20)接触。 借助于本发明,例如在打印过程中,可以更准确地检测纸的电非均匀性。