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    • 8. 发明申请
    • METHOD AND APPARATUS FOR IDENTIFYING LEAD-RELATED CONDITIONS USING LEAD IMPEDANCE MEASUREMENTS
    • 使用铅阻抗测量来识别铅相关条件的方法和设备
    • WO2004028617A3
    • 2004-05-21
    • PCT/US0331043
    • 2003-09-30
    • MEDTRONIC INC
    • GUNDERSON BRUCE DBONDS CHAD APATEL AMISHA SDUFFIN EDWIN G
    • A61B5/0424A61N1/08A61N1/39A61N1/37
    • A61N1/3925A61B5/0424A61N2001/083
    • A method and apparatus for automatically detecting and diagnosing lead-related conditions is provided. Specifically, relatively short-term and relatively long-term impedance parameters are determined for detecting an impedance trend indicative of a lead-related condition such as an open circuit, which may be due to a conductor fracture or poor connection to an associated implantable medical device, or a short circuit due to an insulation breach. Monitoring of multiple lead impedance parameters is performed to diagnose a lead-related condition based on a number of diagnostic criteria. Supplementary analysis of multiple lead impedance parameter trends may be performed to identify lead-specific conditions, such as metal ion oxidation induced insulation degradation. A lead-related condition diagnosis and supporting data are stored in memory for uplinking to an external device for review by a clinician. A recommended corrective action and/or a patient notification signal for a lead-related condition may optionally be provided.
    • 提供了用于自动检测和诊断引线相关状况的方法和设备。 具体而言,确定相对短期和相对长期的阻抗参数,以用于检测指示与引线相关的状况(例如开路)的阻抗趋势,这可能是由于导体断裂或与相关联的可植入医疗设备 ,或由于绝缘破坏而导致的短路。 执行多个导联阻抗参数的监测以基于多个诊断标准诊断导联相关状况。 可以执行对多个铅阻抗参数趋势的补充分析以识别铅特定条件,例如金属离子氧化引起的绝缘劣化。 引导相关的状况诊断和支持数据被存储在存储器中用于上传到外部设备以供临床医生审查。 可以可选地提供用于铅相关病症的推荐校正动作和/或患者通知信号。