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    • 4. 发明申请
    • TEST STRIP ANALYSIS APPARATUS
    • 测试条分析装置
    • WO2003044500A1
    • 2003-05-30
    • PCT/US2002/037179
    • 2002-11-18
    • QUIDEL CORPORATIONZIEGLER, Walter
    • ZIEGLER, Walter
    • G01N21/47
    • G01N21/8483G01N35/04G01N2035/00108G01N2035/0465G01N2035/0484Y10T436/110833Y10T436/113332
    • A test strip analysis apparatus comprising a housing, an insertion station for receiving a test strip to be inspected, an optical measuring unit for measuring the test strip, a transport device for transporting the test strip from said insertion station to the optical measuring unit within the reaction period required for the test strip, and an analyzing unit for evaluating the measurement of the strip, wherein the transport device comprises first and second transport sections which are interconnected through a connecting region and can be driven independently of one another, with the first transport section being capable of transporting the test strip at a higher first transport speed from the insertion station to the connecting region, and the second transport section being capable of transporting the test strip at a slower second transport speed from the connecting region to the optical measuring unit.
    • 一种测试条分析装置,包括壳体,用于接收待检查的测试条的插入台,用于测量测试条的光学测量单元,用于将测试条从所述插入台传送到光学测量单元内的传送装置 测试条所需的反应时间段和用于评估条的测量的分析单元,其中所述输送装置包括通过连接区域互连并且可以彼此独立地驱动的第一和第二输送部分,其中第一输送 能够以较高的第一输送速度将所述试纸条从所述插入台传送到所述连接区域,并且所述第二输送部能够以较慢的第二输送速度从所述连接区域向所述光学测量单元输送所述测试条 。