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1. 发明申请

WO2008002865A2 WIRE STABILIZATION 审中-公开
标题翻译：电线稳定
公开(公告)号：WO2008002865A2
公开(公告)日：2008-01-03
申请号：PCT/US2007/072011
申请日：2007-06-25
申请人： BOSTON SCIENTIFIC SCIMED, INC. , JONES, Lloyd , STIVLAND, Timothy , SANTOS, Jason Delos , MENDOZA, Herbert , RYAN, Ari
发明人： JONES, Lloyd , STIVLAND, Timothy , SANTOS, Jason Delos , MENDOZA, Herbert , RYAN, Ari
IPC分类号： A61F2/01 , A61M25/09 , A61B17/00 , A61B17/22
CPC分类号： A61F2/013 , A61B2017/00469 , A61B2017/00876 , A61B2017/22049 , A61B2017/22069 , A61F2002/015 , A61F2002/018 , A61F2230/0006 , A61F2230/008 , A61M25/09041 , A61M2025/09125
摘要： Devices constrain a distal portion or region of a wire, such as a guidewire or a filterwire, from movement at or near a proximal portion or region of the wire. A magnetic field may be used to constrain a wire passing through a hub. A clamping apparatus may include first and second clamps that, when used in combination, restrain wire movement while advancing an exchange device. A guide catheter may include an anchor movable between an open configuration and a closed configuration.
摘要翻译：装置限制线的远端部分或区域，例如导丝或过滤丝，不受线的近端部分或区域附近的移动。可以使用磁场来约束穿过轮毂的线。夹紧装置可以包括第一和第二夹具，当组合使用时，限制线移动同时推进交换装置。引导导管可以包括可在打开构型和闭合构型之间移动的锚固件。

2. 发明申请

WO2009143237A1 ENHANCEMENT OF DETECTION OF DEFECTS ON DISPLAY PANELS USING FRONT LIGHTING 审中-公开
标题翻译：使用前照灯检测显示面板缺陷的增强
公开(公告)号：WO2009143237A1
公开(公告)日：2009-11-26
申请号：PCT/US2009/044667
申请日：2009-05-20
申请人： PHOTON DYNAMICS INC. , TOET, Daniel , JONES, Lloyd , ERSAHIN, Atila , MYUNGCHUL, Jun , PHAM, Savier , JUNG, Sam Soo
发明人： TOET, Daniel , JONES, Lloyd , ERSAHIN, Atila , MYUNGCHUL, Jun , PHAM, Savier , JUNG, Sam Soo
IPC分类号： G01R31/308
CPC分类号： G01R31/308 , G09G3/006
摘要： Front-side illumination apparatus and methods are provided to enable, in general, detection of a-Si residue defects at the array test step well before the cell step. a-Si has high resistivity without exposure to light making it difficult to detect in conventional TFT-array test procedures. On the other hand, when the a-Si residue is illuminated with a light, its resistivity decreases, which, in turn, changes the electrical properties of the TFT array cell, which may be detected using the voltage imaging optical system (VIOS). In one implementation, the TFT array cell is exposed to illuminating light pulses, impacting the top side of the TFT panel during the testing performed using the VIOS. In one implementation, the front side illumination is traveling along the same path as the illumination used for voltage imaging in the VIOS. In another implementation, light source(s) for front side illumination are located in the close proximity to the VIOS modulator.
摘要翻译：提供了前侧照明装置和方法，以使得通常能够在阵列测试步骤之前，在电池步骤之前检测a-Si残留缺陷。 a-Si在不暴露于光的情况下具有高电阻，使得在常规TFT阵列测试程序中难以检测。另一方面，当用光照射a-Si残留物时，其电阻率降低，这反过来改变了可以使用电压成像光学系统（VIOS）检测的TFT阵列电池的电性能。在一个实现中，在使用VIOS进行的测试期间，TFT阵列单元暴露于照明光脉冲，从而影响TFT面板的顶侧。在一个实施方案中，前侧照明沿着与用于VIOS中的电压成像的照明相同的路径行进。在另一实施方式中，用于前侧照明的光源位于与VIOS调制器非常接近的位置。

3. 发明申请

WO2007027960A3 SUBSTRATE ALIGNMENT USING LINEAR ARRAY SENSOR 审中-公开
公开(公告)号：WO2007027960A3
公开(公告)日：2007-03-08
申请号：PCT/US2006/034129
申请日：2006-08-29
申请人： PHOTON DYNAMICS, INC. , MCGINLEY, Barry , JONES, Lloyd , PUN, Digby , BARNETT, Robert
发明人： MCGINLEY, Barry , JONES, Lloyd , PUN, Digby , BARNETT, Robert
IPC分类号： H01L27/00
摘要： The position of a substrate's edge is detected using a substrate alignment system that includes, in part, a light source, an optical module adapted to receive a light emanating from the light source to form a multi-dimensional light beam; and an array sensor positioned at a focal plane of the optical module and oriented substantially perpendicular to the sample's edge. The substrate alignment system detects the substrate's edge position as soon as the substrate is loaded and placed within the capture range of the linear array sensor. As long as the substrate's edge position is within the capture range, the substrate does not have to be moved to determine its position relative to the tool's coordinate space. The capture range is substantially larger than the position accuracy required. The sensor array includes a multitude of sensors disposed along one or more rows.

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