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    • 6. 发明申请
    • MICROELECTROMECHANICAL DEVICES AND FABRICATION METHODS
    • 微电子机械装置和制造方法
    • WO2007021396A2
    • 2007-02-22
    • PCT/US2006/026531
    • 2006-07-07
    • ROBERT BOSCH GMBHYAMA, Gary
    • YAMA, Gary
    • B81C5/00
    • B81C1/00333
    • There are many inventions described and illustrated herein. In one aspect, the present invention is directed to a MEMS device, and technique of fabricating or manufacturing a MEMS device, having mechanical structures encapsulated in a chamber prior to final packaging. An embodiment further includes a buried polysilicon layer and a "protective layer" deposited over the buried polysilicon layer to prevent possible erosion of, or damage to the buried polysilicon layer during processing steps. The material that encapsulates the mechanical structures, when deposited, includes one or more of the following attributes: low tensile stress, good step coverage, maintains its integrity when subjected to subsequent processing, does not significantly and/or adversely impact the performance characteristics of the mechanical structures in the chamber (if coated with the material during deposition), and/or facilitates integration with high-performance integrated circuits. In one embodiment, the material that encapsulates the mechanical structures is, for example, silicon (polycrystalline, amorphous or porous, whether doped or undoped), silicon carbide, silicon-germanium, germanium, or gallium-arsenide.
    • 这里描述和说明了许多发明。 在一个方面,本发明涉及MEMS器件以及制造或制造MEMS器件的技术,其具有在最终封装之前封装在室中的机械结构。 一个实施例还包括埋入式多晶硅层和“保护层” 沉积在掩埋的多晶硅层上方以防止在处理步骤期间可能侵蚀或损害掩埋的多晶硅层。 当沉积时,封装机械结构的材料包括以下属性中的一个或多个:低拉伸应力,良好的阶梯覆盖率,在进行后续处理时保持其完整性,不会显着和/或不利地影响机械结构的性能特性 腔室中的机械结构(如果在沉积期间涂覆有材料),和/或促进与高性能集成电路的集成。 在一个实施例中,封装机械结构的材料例如是硅(多晶硅,非晶硅或多孔硅,无论是掺杂的还是未掺杂的),碳化硅,硅 - 锗,锗或砷化镓。
    • 10. 发明申请
    • RESISTIVE MEMS HUMIDITY SENSOR
    • 电阻式MEMS湿度传感器
    • WO2014099915A1
    • 2014-06-26
    • PCT/US2013/075677
    • 2013-12-17
    • ROBERT BOSCH GMBHFEYH, AndoGRAHAM, AndrewSAMARAO, AshwinYAMA, GaryO'BRIEN, Gary
    • FEYH, AndoGRAHAM, AndrewSAMARAO, AshwinYAMA, GaryO'BRIEN, Gary
    • G01N27/12
    • G01N27/121
    • A semiconductor device includes a substrate, an insulating film provided on a surface of the substrate, and a sensing film formed of a conductive material deposited on top of the insulating film. The sensing film defines at least one conductive path between a first position and a second position on the insulating film. A first circuit connection is electrically connected to the sensing film at the first position on the insulating layer, and a second circuit connection is electrically connected to the sensing film at the second position. A control circuit is operatively connected to the first circuit connection and the second circuit connection for measuring an electrical resistance of the sensing film. The sensing film has a thickness that enables a resistivity of the sensing film to be altered predictably in a manner that is dependent on ambient moisture content.
    • 半导体器件包括衬底,设置在衬底的表面上的绝缘膜和由沉积在绝缘膜的顶部上的导电材料形成的感测膜。 感测膜在绝缘膜上的第一位置和第二位置之间限定至少一个导电路径。 第一电路连接在绝缘层上的第一位置处电连接到感测膜,并且第二电路连接在第二位置电连接到感测膜。 控制电路可操作地连接到第一电路连接和用于测量感测膜的电阻的第二电路连接。 感测膜具有能够以取决于环境水分含量的方式预测地改变感测膜的电阻率的厚度。