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1. 发明申请

WO2013155256A1 WIRING SUBSTRATE WITH FILLED VIAS TO ACCOMMODATE CUSTOM TERMINALS 审中-公开
标题翻译：具有填充六角形的接线基座，用于调节定制端子
公开(公告)号：WO2013155256A1
公开(公告)日：2013-10-17
申请号：PCT/US2013/036092
申请日：2013-04-11
申请人： FORMFACTOR, INC. , POWELL, Shawn
发明人： POWELL, Shawn
IPC分类号： H01L23/48
CPC分类号： G01R1/07378 , G01R1/07342 , G01R3/00 , H01L21/486 , H01L23/49827 , H01L23/49838 , H01L2224/16225 , H05K1/0268 , H05K1/115 , H05K3/4038
摘要： A probe card assembly and associated processes of forming them may include a wiring substrate with a first surface and an opposite surface, an electrically conductive first via comprising electrically conductive material extending into the wiring substrate from the opposite surface and ending before reaching the first surface, and a plurality of electrically conductive second vias, and a custom electrically conductive terminal disposed on the first surface such that said custom terminal covers the first via and contacts one of the second vias adjacent to said first via without electrically contacting the first via. Each of the second vias may be electrically conductive from the first surface to the opposite surface. The first via may include electrically insulating material disposed within a hole in the first via.
摘要翻译：探针卡组件及其相关联的工艺可以包括具有第一表面和相对表面的布线基板，导电的第一通孔包括从相对表面延伸到布线基板中并在到达第一表面之前结束的导电材料，以及多个导电的第二通孔以及设置在所述第一表面上的定制导电端子，使得所述定制端子覆盖所述第一通孔，并接触与所述第一通孔相邻的所述第二通孔中的一个，而不与所述第一通孔电接触。每个第二通孔可以从第一表面到相对表面是导电的。第一通孔可以包括设置在第一通孔中的孔内的电绝缘材料。

2. 发明申请

WO2008051773A2 PROBE CARD ASSEMBLY WITH A MECHANICALLY DECOUPLED WIRING SUBSTRATE 审中-公开
标题翻译：探头卡组件与机械分解接线基板
公开(公告)号：WO2008051773A2
公开(公告)日：2008-05-02
申请号：PCT/US2007/081706
申请日：2007-10-18
申请人： FORMFACTOR, INC. , HOBBS, Eric D. , SLOCUM, Alexander H. , ELDRIDGE, Benjamin, N. , BREINLINGER, Keith J. , POWELL, Shawn
发明人： HOBBS, Eric D. , SLOCUM, Alexander H. , ELDRIDGE, Benjamin, N. , BREINLINGER, Keith J. , POWELL, Shawn
IPC分类号： G01R31/02
CPC分类号： G01R31/2893
摘要： A probe card assembly can comprise a probe head assembly and a wiring substrate. The probe head assembly can comprise a plurality of probes disposed to contact an electronic device disposed on a holder in a test housing. The wiring substrate can include an electrical interface to a test controller and a plurality of electrical wiring composing electrical paths between the electrical interface and ones of the probes, and the wiring substrate can comprise a first portion on which the electrical interface is disposed and a second portion composing the probe head assembly. The second portion of the wiring substrate can be moveable with respect to the first portion of the wiring substrate.
摘要翻译：探针卡组件可以包括探针头组件和布线衬底。探针头组件可以包括多个探针，其设置成接触设置在测试壳体中的保持器上的电子设备。布线基板可以包括与测试控制器的电接口以及构成电接口和探针之间的电路径的多个电线，并且布线基板可以包括其上设置有电接口的第一部分和第二部分组成探头组件的部分。布线基板的第二部分能够相对于布线基板的第一部分移动。

3. 发明申请

WO2019173400A1 CONVERTIBLE BRIEFCASE AND GARMENT CASE WITH ADJUSTABLE SADDLEBAG ATTACHMENT 审中-公开
公开(公告)号：WO2019173400A1
公开(公告)日：2019-09-12
申请号：PCT/US2019/020835
申请日：2019-03-05
申请人： POWELL, Shawn
发明人： POWELL, Shawn
IPC分类号： B62J9/00 , A45C13/30 , A45C3/00 , A45F3/02 , A45F3/04
摘要： A luggage assembly includes a first bag and a second bag, each bag having a rear side with a number of fasteners that engage the rear sides of the other bag to attach them together. The rear sides also have an open slot near the top end to receive a dual bag strap extending between the bags, such that the bags may be used as saddlebags. The bags may further include bag handles near the top end of the bags, and an assembly handle extending between the bag handles such that the luggage assembly may be conveniently carried as a single unit. The luggage assembly also includes an individual bag strap that may attach to the fasteners on the rear sides such that the bags may be used and carried individually.

4. 发明申请

WO2008051773A3 PROBE CARD ASSEMBLY WITH A MECHANICALLY DECOUPLED WIRING SUBSTRATE 审中-公开
标题翻译：具有机械去耦线路基板的探针卡组件
公开(公告)号：WO2008051773A3
公开(公告)日：2008-10-30
申请号：PCT/US2007081706
申请日：2007-10-18
申请人： FORMFACTOR INC , HOBBS ERIC D , SLOCUM ALEXANDER H , ELDRIDGE BENJAMIN N , BREINLINGER KEITH J , POWELL SHAWN
发明人： HOBBS ERIC D , SLOCUM ALEXANDER H , ELDRIDGE BENJAMIN N , BREINLINGER KEITH J , POWELL SHAWN
IPC分类号： G01R31/02
CPC分类号： G01R31/2893
摘要： A probe card assembly can comprise a probe head assembly and a wiring substrate. The probe head assembly can comprise a plurality of probes disposed to contact an electronic device disposed on a holder in a test housing. The wiring substrate can include an electrical interface to a test controller and a plurality of electrical wiring composing electrical paths between the electrical interface and ones of the probes, and the wiring substrate can comprise a first portion on which the electrical interface is disposed and a second portion composing the probe head assembly. The second portion of the wiring substrate can be moveable with respect to the first portion of the wiring substrate.
摘要翻译：探针卡组件可以包括探针头组件和布线衬底。探针头组件可以包括多个探针，所述多个探针被设置为接触设置在测试外壳中的保持器上的电子器件。布线基板可以包括到测试控制器的电接口以及构成电接口和其中一个探头之间的电路径的多个电布线，并且布线基板可以包括布置有电接口的第一部分和布置在第一部分上的第二部分构成探头组件的部分。布线衬底的第二部分可以相对于布线衬底的第一部分移动。

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