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    • 3. 发明申请
    • APPARATUS AND METHOD TO TEST NON-VOLATILE MEMORY
    • 测试非易失性存储器的装置和方法
    • WO2008124094A1
    • 2008-10-16
    • PCT/US2008/004446
    • 2008-04-04
    • ATMEL CORPORATIONSURICO, StefanoSIVERO, StefanoBARTOLI, SimonePASSERINI, Marco
    • SURICO, StefanoSIVERO, StefanoBARTOLI, SimonePASSERINI, Marco
    • G06F11/00
    • G11C16/10
    • Some embodiments disclosed comprise apparatus and methods relating to a nonvolatile memory comprising an input output buffer; a latch circuit coupled to the input/output buffers; a memory array having nonvolatile memory cells coupled to an input/output buffer; a command user interface coupled to the input/output buffer and the latch circuit; a microcontroller coupled to the command user interface; a read-only memory storing instructions to be executed by the microcontroller; and a switch-instruction circuitry coupled to the latch circuit, the read-only memory and the digital control circuitry to selectively provide instructions to the microcontroller from the read-only memory and to selectively provide substitute instructions under control of the command user interface, the substitute instructions received at the input/output buffer from an external source. Other embodiments and methods are disclosed.
    • 公开的一些实施例包括涉及包括输入输出缓冲器的非易失性存储器的装置和方法; 耦合到输入/输出缓冲器的锁存电路; 具有耦合到输入/输出缓冲器的非易失性存储单元的存储器阵列; 耦合到输入/输出缓冲器和锁存电路的命令用户界面; 耦合到命令用户界面的微控制器; 存储由微控制器执行的指令的只读存储器; 以及耦合到所述锁存电路,所述只读存储器和所述数字控制电路的开关指令电路,用于从所述只读存储器选择性地向所述微控制器提供指令,并且在所述命令用户界面的控制下选择性地提供替代指令, 从外部源代替在输入/输出缓冲器处接收的指令。 公开了其他实施例和方法。