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1. 发明申请

WO2016179186A1 INSPECTION PROGRAM EDITING ENVIRONMENT PROVIDING USER DEFINED COLLISION AVOIDANCE VOLUMES 审中-公开
标题翻译：检验程序编辑环境提供用户定义的冲突避免量
公开(公告)号：WO2016179186A1
公开(公告)日：2016-11-10
申请号：PCT/US2016/030591
申请日：2016-05-03
申请人： MITUTOYO CORPORATION , MITUTOYO EUROPE GMBH , YU, Dahai
发明人： YU, Dahai , TSEO, Eric, Yeh-Wei , DE VLIEGHERE, Bart , PETER, Michael
IPC分类号： B65H1/00 , G01B5/008 , G01B5/20 , G06F3/048 , G06F15/00
CPC分类号： G01B21/047 , G01B7/008 , G01B21/04 , G05B19/4061 , G05B19/4097 , G05B19/4099 , G05B2219/35134 , G06F3/048 , G06F15/00 , Y02P90/265
摘要： A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer aided design (CAD) file processing portion, an inspection motion path generation portion and a user interface. The user interface includes a workpiece inspection program simulation portion and auxiliary collision avoidance volume creation elements. The workpiece inspection program simulation portion displays a 3D view and the auxiliary collision avoidance volume creation elements are operable to create or define auxiliary collision avoidance volumes that are displayed in the 3D view. In various implementations, rather than requiring a user to model a physical object (e.g., as part of a workpiece or CMM) in a CAD file, the user may instead create and position an auxiliary collision avoidance volume at a location where the physical object is expected to be, so as to prevent collisions that could occur with the physical object.
摘要翻译：提供了一种用于对坐标测量机的工件特征检查操作进行编程的系统。该系统包括计算机辅助设计（CAD）文件处理部分，检查运动路径生成部分和用户界面。用户界面包括工件检查程序模拟部分和辅助冲突避免体积创建元件。工件检查程序模拟部分显示3D视图，辅助碰撞避免卷创建元件可操作以创建或定义在3D视图中显示的辅助碰撞避免体积。在各种实现中，用户可以在CAD文件中建立物理对象（例如，作为工件或CMM的一部分）来建模和定位辅助冲突避免体积，而不是在物理对象预期是为了防止物理对象可能发生的冲突。

2. 发明申请

WO2005114100A1 DISPLACEMENT TRANSDUCER WITH SELECTABLE DETECTOR AREA 审中-公开
标题翻译：具有选择性探测器区域的位移传感器
公开(公告)号：WO2005114100A1
公开(公告)日：2005-12-01
申请号：PCT/US2004/014705
申请日：2004-05-12
申请人： MITUTOYO CORPORATION , EMTMAN, Casey, Edward , PATZWALD, Andrew, Michael , JONES, Benjamin, Keith
发明人： EMTMAN, Casey, Edward , PATZWALD, Andrew, Michael , JONES, Benjamin, Keith
IPC分类号： G01B11/16
CPC分类号： G01B11/16 , G01B11/002
摘要： A displacement measurement device has a detector area which is larger than the area of the beam spot reflected from the measurement surface. The detector area is made larger than the size of the beam spot on the detector area, in order to accommodate shifts in the location of the beam spot due to changes in the precise locations of the components of the displacement measurement device. The subset of pixels in the detector area having advantageous correlation characteristics, is then selected to perform the correlation calculation, thereby reducing data processing time requirements.
摘要翻译：位移测量装置具有大于从测量表面反射的束斑的面积的检测器面积。检测器区域大于检测器区域上的光束点的尺寸，以便由于位移测量装置的部件的精确位置的变化而适应波束点位置的偏移。然后选择具有有利相关特性的检测器区域中的像素子集以执行相关计算，从而减少数据处理时间要求。

3. 发明申请

WO1998019822A1 METHOD AND APPRATATUS FOR SIMULATION OF NC MACHINING 审中-公开
标题翻译：数控加工仿真的方法与设计
公开(公告)号：WO1998019822A1
公开(公告)日：1998-05-14
申请号：PCT/JP1996003266
申请日：1996-11-07
申请人： OKUMA CORPORATION , KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , MITUTOYO CORPORATION , YAMAZAKI, Kazuo
发明人： OKUMA CORPORATION , KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , MITUTOYO CORPORATION
IPC分类号： B23Q15/00
CPC分类号： G05B19/4069 , G05B2219/35145 , G05B2219/41426 , G05B2219/43124 , G05B2219/50321
摘要： A method of simulation of NC machining, wherein machining simulation is carried out according to blank shape data, tool shape data and an NC program to modify the NC program itself or interpolation data by feedforward control so that optimum cutting conditions can be obtained. The simulation result can be used for correcting the NC program and the interpolation data at the next stage. Further, a record of tools used can be generated on the basis of this simulation result.
摘要翻译：一种数控加工的模拟方法，其中根据坯料形状数据，刀具形状数据和NC程序进行加工模拟，以通过前馈控制修改NC程序本身或插值数据，从而可以获得最佳的切削条件。仿真结果可用于校正NC程序和下一阶段的插值数据。此外，可以基于该仿真结果生成使用的工具的记录。

4. 发明申请

WO1993021639A1 X-Y TABLE APPARATUS 审中-公开
标题翻译： X-Y表装置
公开(公告)号：WO1993021639A1
公开(公告)日：1993-10-28
申请号：PCT/JP1993000420
申请日：1993-04-01
申请人： MITUTOYO CORPORATION , TENG, Hongchun; , ISHIBASHI, Wataru;
发明人： MITUTOYO CORPORATION
IPC分类号： G12B05/00
CPC分类号： G01D5/34715 , G12B5/00 , Y10S33/03 , Y10S248/913
摘要： An X-Y table apparatus provided with a base (12), a member (14) capable of being moved in an X-direction with respect to the base, a member (18) capable of being moved in a Y-direction with respect to the X-direction-movable member and supporting an object placed thereon, and a means (20) for detecting an amount of movement of the object support member with respect to the base, the movement amount detecting means including a main scale (24) which is provided at the central portion of a lower surface of the object support member so that the main scale can be operated in accordance with the movement of the object support member, and which has a matrix type island-like first lattice, and an index scale (26) which is provided on the base so that it can be moved relatively and two dimensionally with respect to and extends in parallel with the main scale, and which has a second grid-ironed lattice (80) and a third grid-ironed lattice (82). This apparatus has a simple construction, and, moreover, it is capable of detecting the displacement of an object in the X- and Y-directions with a high accuracy. A block (100) attached unitarily to the object support member (18) is provided with a mounting hole (101). A free end portion (102) of a detecting shaft (22) of an X-Y encoder is inserted into this mounting hole and three-line-supported on three parallel pins (103a-103c). The relative position of angle of rotation of a table with respect to the X-Y encoder are finely regulated by turning the detecting shaft by a regulating lever (105) directly under the object support member.
摘要翻译：一种具有基座（12）的XY台面装置，能够相对于基座在X方向上移动的构件（14），能够相对于所述基座沿Y方向移动的构件（18） X方向可动构件，并支撑放置在其上的物体，以及用于检测物体支撑构件相对于基座的移动量的装置（20），移动量检测装置包括主秤（24）设置在物体支撑构件的下表面的中心部分，使得主标尺可以根据物体支撑构件的移动而被操作，并且具有矩阵型岛状第一格子和指标（ 26），其设置在基座上，使得其可以相对于主刻度相对并相对于并平行地移动并且与主刻度平行地移动，并且具有第二格栅格（80）和第三格栅格（ 82）。该装置结构简单，而且能够高精度地检测物体在X方向和Y方向上的位移。一体地安装在物体支撑部件（18）上的块（100）设置有安装孔（101）。 X-Y编码器的检测轴（22）的自由端部（102）被插入到该安装孔中，并且三线支撑在三个平行的销（103a-103c）上。台面相对于X-Y编码器的旋转角度的相对位置通过直接在对象支撑构件正下方的调节杆（105）转动检测轴来进行微调节。

5. 发明申请

WO2018006032A1 POWER TRANSFER CONFIGURATION FOR SUPPLYING POWER TO A DETACHABLE PROBE FOR A COORDINATE MEASUREMENT MACHINE 审中-公开
标题翻译：用于向坐标测量机的可拆卸探针提供电力的电力传输配置
公开(公告)号：WO2018006032A1
公开(公告)日：2018-01-04
申请号：PCT/US2017/040404
申请日：2017-06-30
申请人： MITUTOYO CORPORATION
发明人： ATHERTON, Kim
IPC分类号： G01B5/004 , G01B1/00 , G01B3/30 , G01P21/00
摘要： A power transfer configuration is disclosed for providing power to a stored coordinate measurement machine (CMM) probe. A storage rack comprising at least one CMM probe receptacle is mounted proximate to a CMM. The CMM may automatically attach and detach from the CMM probe and insert and remove it from the storage rack probe receptacle. The power transfer configuration comprises a primary electromagnetic winding mounted to the storage rack proximate to the probe receptacle, and a secondary electromagnetic winding located internal to and proximate to the CMM probe housing. When the CMM probe is in the probe receptacle, the primary electromagnetic winding receives alternating current and generates a changing electromagnetic field proximate to the CMM probe housing. The secondary electromagnetic winding generates power in the CMM probe in response to receiving the changing electromagnetic field. The CMM probe may be internally heated while stored, using the generated power.
摘要翻译：公开了一种用于向存储的坐标测量机（CMM）探测器提供功率的功率传输配置。包括至少一个CMM探针容器的储存架安装在CMM附近。 CMM可以自动连接并从CMM探针分离，并将其从存储机架探针插座中插入并从中取出。该功率传输配置包括安装到存储机架上靠近探头插座的主电磁绕组以及位于CMM探头壳体内部和靠近CMM探头壳体的次级电磁线圈。当CMM探头位于探头插座中时，主电磁线圈接收交流电流并在CMM探头壳体附近产生变化的电磁场。次级电磁线圈响应于接收到变化的电磁场而在CMM探头中产生功率。使用产生的功率，CMM探头可以在储存期间内部加热。

6. 发明申请

WO2017112774A1 SENSOR SIGNAL OFFSET COMPENSATION SYSTEM FOR A CMM TOUCH PROBE 审中-公开
标题翻译： CMM触摸探头的传感器信号失调补偿系统
公开(公告)号：WO2017112774A1
公开(公告)日：2017-06-29
申请号：PCT/US2016/068029
申请日：2016-12-21
申请人： MITUTOYO CORPORATION
发明人： JANSSON, Bjorn, E.B.
IPC分类号： G01B11/00 , G01B11/14
CPC分类号： G01B3/22 , G01B5/012 , G01B21/045
摘要： A touch probe circuit comprises a displacement sensor having a sensor signal responsive to touch probe stylus displacement, an offset compensation controller, and a difference amplifier. The offset compensation controller provides a varying offset compensation signal to compensate drift in a rest-state signal component of the sensor signal. The difference amplifier inputs the offset compensation signal and the sensor signal and amplifies the difference therebetween to provide an offset compensated displacement signal, which is output to a touch trigger signal generating circuit that provides a touch signal when the stylus touches a workpiece, and is also output to the offset compensation controller. The offset compensation controller portion provides a feedback loop that inputs the offset compensated displacement signal and outputs a responsive low pass filtered offset compensation signal to the difference amplifier, in order to provide the offset compensated displacement signal.
摘要翻译：触摸探针电路包括具有响应于触摸探针触针位移的传感器信号的位移传感器，偏移补偿控制器和差分放大器。偏移补偿控制器提供变化的偏移补偿信号以补偿传感器信号的静止状态信号分量中的漂移。差分放大器输入偏移补偿信号和传感器信号并放大它们之间的差值以提供偏移补偿位移信号，其被输出到当触控笔接触工件时提供触摸信号的触摸触发信号生成电路，并且也是输出到偏移补偿控制器。偏移补偿控制器部分提供输入偏移补偿位移信号的反馈回路，并向差分放大器输出响应低通滤波偏移补偿信号，以提供偏移补偿位移信号。

7. 发明申请

WO2013126909A1 METHOD FOR IDENTIFYING ABNORMAL SPECTRAL PROFILES MEASURED BY A CHROMATIC CONFOCAL RANGE SENSOR 审中-公开
标题翻译：用于识别由色度范围传感器测量的异常光谱分布的方法
公开(公告)号：WO2013126909A1
公开(公告)日：2013-08-29
申请号：PCT/US2013/027687
申请日：2013-02-25
申请人： MITUTOYO CORPORATION , PATZWALD, Andrew, Michael
发明人： PATZWALD, Andrew, Michael
IPC分类号： G01B11/24 , G01C3/08
CPC分类号： G01B11/0608 , G01B11/303 , G01B2210/50
摘要： A method for operating a chromatic range sensor (CRS) system to identify abnormal spectral profiles arising from light reflected from more than one portion of a workpiece surface is provided. The method comprises: providing a CRS system comprising: an optical element, a light source, and CRS electronics comprising a CRS wavelength detector; operating the CRS system to receive an output spectral profile from a measurement point on a workpiece surface and provide corresponding output spectral profile data; analyzing the output spectral profile data to provide a peak region asymmetry characterization; and providing a corresponding abnormality indicator if the peak region asymmetry characterization indicates that the peak region is abnormally asymmetric.
摘要翻译：提供了一种用于操作色度范围传感器（CRS）系统以识别由从工件表面的多于一个部分反射的光产生的异常光谱分布的方法。该方法包括：提供CRS系统，包括：光学元件，光源和包括CRS波长检测器的CRS电子器件; 操作CRS系统以从工件表面上的测量点接收输出光谱轮廓，并提供相应的输出光谱分布数据; 分析输出光谱分布数据以提供峰值区域不对称表征; 并且如果峰值区域不对称表征表明峰值区域异常不对称，则提供相应的异常指示符。

8. 发明申请

WO1991012585A1 EDGE INFORMATION EXTRACTING DEVICE AND METHOD THEREOF 审中-公开
标题翻译：边缘信息提取装置及其方法
公开(公告)号：WO1991012585A1
公开(公告)日：1991-08-22
申请号：PCT/JP1991000189
申请日：1991-02-15
申请人： MITUTOYO CORPORATION , KOMATSU, Kouichi , AKAGI, Keiji , UEYAMA, Takashi
发明人： MITUTOYO CORPORATION
IPC分类号： G06F15/70
CPC分类号： G06T7/12
摘要： An edge information extracting device and the method thereof in which threshold levels are determined referring to only multivalued pictures which are included in one or more windows provided in a multivalued image and the binarizing is performed. The desired edge information in windows can be extracted reliably and precisely.
摘要翻译：一种边缘信息提取装置及其方法，其中仅参考包括在多值图像中提供的一个或多个窗口中的多值图像来确定阈值水平，并且执行二值化。可以可靠且精确地提取窗口中的所需边缘信息。

9. 发明申请

WO1991003711A1 PHOTOELECTRIC ENCODER 审中-公开
标题翻译：光电编码器
公开(公告)号：WO1991003711A1
公开(公告)日：1991-03-21
申请号：PCT/JP1990001138
申请日：1990-09-05
申请人： MITUTOYO CORPORATION , KABAYA, Yosihiko
发明人： MITUTOYO CORPORATION
IPC分类号： G01D05/36
CPC分类号： G01D5/36
摘要： This invention provides a photoelectric encoder characterized in that a reference grid substrate on a light emission side is formed of a sheet-like light emission device and thin film-like light-shielding materials are arranged at regular gaps on a surface facing the reference grid. Since the light emission device and the grid substrate on the light emission side are formed integrally, the size and weight of the encoder can be reduced and the number of components can be decreased.

10. 发明申请

WO1990013791A1 THREE-DIMENSIONAL MEASURING INSTRUMENT 审中-公开
标题翻译：三维测量仪器
公开(公告)号：WO1990013791A1
公开(公告)日：1990-11-15
申请号：PCT/JP1990000551
申请日：1990-04-27
申请人： MITUTOYO CORPORATION , TAKAHASHI, Keizo , MATSUMOTO, Masakasu
发明人： MITUTOYO CORPORATION
IPC分类号： G01B21/20
CPC分类号： G01B3/002 , G01B21/047
摘要： This invention relates to a three-dimensional measuring instrument capable of setting an origin of measurement arbitrarily by reference point blocks. When dust is deposited on the reference point block, the origin of measurement deviates by a distance corresponding to the thickness of the dust, so that the object measuring accuracy decreases. In order to prevent this inconvenience, covers (40A, 40B, 80) enclosing the reference point blocks (50A, 50B, 70) are provided so that the covers can be opened and closed with respect to the reference point blocks. If these covers are opened only when an origin of measurement is set, the deposition of dust on the reference point blocks can be prevented or reduced extremely, and an origin of measurement can be set accurately, this enabling an object to be measured precisely. This invention can be applied to a three-dimensional measuring instrument adapted to set an origin of measurement by origin ball-carrying reference point blocks and carry out precision measurement of the order of microns.
摘要翻译：本发明涉及能够通过参考点块任意设定测量原点的三维测量仪器。当灰尘沉积在参考点块上时，测量原点偏离与灰尘厚度相对应的距离，从而物体测量精度降低。为了防止这种不便，设置包围参考点块（50A，50B，70）的盖（40A，40B，80），使得盖可以相对于参考点块打开和关闭。如果这些盖仅在设定测量原点时才打开，则可以极大地防止或减少灰尘沉积在基准点块上，并且可以准确地设置测量的原点，从而能够精确地测量物体。本发明可以应用于三维测量仪器，其适用于通过原始球携带参考点块设置测量原点，并执行微米数量级的精密测量。

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