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1. 发明申请

WO1998019820A1 METHOD AND DEVICE FOR ANALYZING NC PROGRAM FOR NC MACHINING 审中-公开
标题翻译：用于分析NC加工NC程序的方法和装置
公开(公告)号：WO1998019820A1
公开(公告)日：1998-05-14
申请号：PCT/JP1996003264
申请日：1996-11-07
申请人： KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , MITUTOYO CORPORATION , OKUMA CORPORATION , YAMAZAKI, Kazuo
发明人： KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , MITUTOYO CORPORATION , OKUMA CORPORATION
IPC分类号： B23Q15/00
CPC分类号： G05B19/40937 , G05B2219/35528 , G05B2219/36304 , Y02P90/265
摘要： A device for analyzing NC program is provided with a machining method analyzing means (34) which extracts machining conditions for every machining work element by analyzing an actual NC machining program, and data base creating means (35). The device extracts necessary machining information from the actual NC machining program and allows the data bases (21, 22, 23 and 24) to reflect the information.
摘要翻译：提供了一种用于分析NC程序的装置，其具有通过分析实际的NC加工程序来提取每个加工零件的加工条件的加工方法分析装置（34）和数据库生成装置（35）。该设备从实际的NC加工程序中提取必要的加工信息，并允许数据库（21,22,23和24）反映信息。

2. 发明申请

WO1998019822A1 METHOD AND APPRATATUS FOR SIMULATION OF NC MACHINING 审中-公开
标题翻译：数控加工仿真的方法与设计
公开(公告)号：WO1998019822A1
公开(公告)日：1998-05-14
申请号：PCT/JP1996003266
申请日：1996-11-07
申请人： OKUMA CORPORATION , KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , MITUTOYO CORPORATION , YAMAZAKI, Kazuo
发明人： OKUMA CORPORATION , KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , MITUTOYO CORPORATION
IPC分类号： B23Q15/00
CPC分类号： G05B19/4069 , G05B2219/35145 , G05B2219/41426 , G05B2219/43124 , G05B2219/50321
摘要： A method of simulation of NC machining, wherein machining simulation is carried out according to blank shape data, tool shape data and an NC program to modify the NC program itself or interpolation data by feedforward control so that optimum cutting conditions can be obtained. The simulation result can be used for correcting the NC program and the interpolation data at the next stage. Further, a record of tools used can be generated on the basis of this simulation result.
摘要翻译：一种数控加工的模拟方法，其中根据坯料形状数据，刀具形状数据和NC程序进行加工模拟，以通过前馈控制修改NC程序本身或插值数据，从而可以获得最佳的切削条件。仿真结果可用于校正NC程序和下一阶段的插值数据。此外，可以基于该仿真结果生成使用的工具的记录。

3. 发明申请

WO1998019824A1 ERROR CORRECTION APPARATUS FOR NC MACHINE TOOL 审中-公开
标题翻译： NC机床用错误校正装置
公开(公告)号：WO1998019824A1
公开(公告)日：1998-05-14
申请号：PCT/JP1996003268
申请日：1996-11-07
申请人： OKUMA CORPORATION , MITUTOYO CORPORATION , KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , YAMAZAKI, Kazuo
发明人： OKUMA CORPORATION , MITUTOYO CORPORATION , KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO
IPC分类号： B23Q15/20
CPC分类号： G05B19/404 , Y10T408/16
摘要： A motion error correction apparatus of a moving body such as a slider of an NC machine tool. A laser beam is emitted in the direction of slider motion from a reference position beam generator disposed on a fixed table. The slider is provided with a beam detector, which detects the deviation of the laser beam on a Y-Z plane. To correctly detect the direction of the laser beam, a beam detector is provided at the end of the slider stroke on the fixed table.
摘要翻译：诸如NC机床的滑块的移动体的运动误差校正装置。激光束从设置在固定台上的基准位置光束发生器沿滑块运动的方向发射。滑块设有一个光束检测器，用于检测激光束在Y-Z平面上的偏差。为了正确地检测激光束的方向，在固定台上的滑块行程结束处提供了一个光束检测器。

4. 发明申请

WO1998019823A1 NUMERIC CONTROL COMMAND GENERATOR AND METHOD 审中-公开
标题翻译：数字控制命令发生器和方法
公开(公告)号：WO1998019823A1
公开(公告)日：1998-05-14
申请号：PCT/JP1996003267
申请日：1996-11-07
申请人： OKUMA CORPORATION , KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , MITUTOYO CORPORATION , YAMAZAKI, Kazuo
发明人： OKUMA CORPORATION , KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , MITUTOYO CORPORATION
IPC分类号： B23Q15/00
CPC分类号： G05B19/40937 , Y02P90/265
摘要： An apparatus for, and a method of, generating an orientation operation command of an NC machine tool, wherein a machining surface of a workpiece is classified into groups in accordance with its inclination on the basis of machining information. An optimum orientation angle is determined for each group, and a numeric control command is generated on the basis of the angle.
摘要翻译：一种用于产生NC机床的定向操作指令的装置和方法，其中根据加工信息将工件的加工表面根据其倾斜度分为几组。确定每个组的最佳定向角度，并且基于该角度生成数字控制命令。

5. 发明申请

WO1998019821A1 GENERATION OF MEASUREMENT PROGRAM IN NC MACHINING AND MACHINING MANAGEMENT BASED ON THE MEASUREMENT PROGRAM 审中-公开
标题翻译：基于测量程序的数控加工和加工管理中的测量程序的生成
公开(公告)号：WO1998019821A1
公开(公告)日：1998-05-14
申请号：PCT/JP1996003265
申请日：1996-11-07
申请人： MITUTOYO CORPORATION , KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , OKUMA CORPORATION , YAMAZAKI, Kazuo
发明人： MITUTOYO CORPORATION , KABUSHIKI KAISHA MORI SEIKI SEISAKUSHO , OKUMA CORPORATION
IPC分类号： B23Q15/00
CPC分类号： G05B19/4068 , G05B19/401 , G05B2219/37492
摘要： A method and apparatus for NC machining management based on a measurement program, wherein a machining shape at an arbitrary machining stage is determined by an NC program, a geometric element or a geometric model is generated, and a measurement program is generated on the basis of the geometric model. The measurement program is executed when at least one of the steps of the NC program is completed, and the results of measurement are used as control information for machining management.
摘要翻译：一种基于测量程序进行数控加工管理的方法和装置，其中通过NC程序确定任意加工阶段的加工形状，生成几何要素或几何模型，并且基于几何模型。当NC程序的至少一个步骤完成时，执行测量程序，并且将测量结果用作用于加工管理的控制信息。

6. 发明申请

WO1993021639A1 X-Y TABLE APPARATUS 审中-公开
标题翻译： X-Y表装置
公开(公告)号：WO1993021639A1
公开(公告)日：1993-10-28
申请号：PCT/JP1993000420
申请日：1993-04-01
申请人： MITUTOYO CORPORATION , TENG, Hongchun; , ISHIBASHI, Wataru;
发明人： MITUTOYO CORPORATION
IPC分类号： G12B05/00
CPC分类号： G01D5/34715 , G12B5/00 , Y10S33/03 , Y10S248/913
摘要： An X-Y table apparatus provided with a base (12), a member (14) capable of being moved in an X-direction with respect to the base, a member (18) capable of being moved in a Y-direction with respect to the X-direction-movable member and supporting an object placed thereon, and a means (20) for detecting an amount of movement of the object support member with respect to the base, the movement amount detecting means including a main scale (24) which is provided at the central portion of a lower surface of the object support member so that the main scale can be operated in accordance with the movement of the object support member, and which has a matrix type island-like first lattice, and an index scale (26) which is provided on the base so that it can be moved relatively and two dimensionally with respect to and extends in parallel with the main scale, and which has a second grid-ironed lattice (80) and a third grid-ironed lattice (82). This apparatus has a simple construction, and, moreover, it is capable of detecting the displacement of an object in the X- and Y-directions with a high accuracy. A block (100) attached unitarily to the object support member (18) is provided with a mounting hole (101). A free end portion (102) of a detecting shaft (22) of an X-Y encoder is inserted into this mounting hole and three-line-supported on three parallel pins (103a-103c). The relative position of angle of rotation of a table with respect to the X-Y encoder are finely regulated by turning the detecting shaft by a regulating lever (105) directly under the object support member.
摘要翻译：一种具有基座（12）的XY台面装置，能够相对于基座在X方向上移动的构件（14），能够相对于所述基座沿Y方向移动的构件（18） X方向可动构件，并支撑放置在其上的物体，以及用于检测物体支撑构件相对于基座的移动量的装置（20），移动量检测装置包括主秤（24）设置在物体支撑构件的下表面的中心部分，使得主标尺可以根据物体支撑构件的移动而被操作，并且具有矩阵型岛状第一格子和指标（ 26），其设置在基座上，使得其可以相对于主刻度相对并相对于并平行地移动并且与主刻度平行地移动，并且具有第二格栅格（80）和第三格栅格（ 82）。该装置结构简单，而且能够高精度地检测物体在X方向和Y方向上的位移。一体地安装在物体支撑部件（18）上的块（100）设置有安装孔（101）。 X-Y编码器的检测轴（22）的自由端部（102）被插入到该安装孔中，并且三线支撑在三个平行的销（103a-103c）上。台面相对于X-Y编码器的旋转角度的相对位置通过直接在对象支撑构件正下方的调节杆（105）转动检测轴来进行微调节。

7. 发明申请

WO1991012585A1 EDGE INFORMATION EXTRACTING DEVICE AND METHOD THEREOF 审中-公开
标题翻译：边缘信息提取装置及其方法
公开(公告)号：WO1991012585A1
公开(公告)日：1991-08-22
申请号：PCT/JP1991000189
申请日：1991-02-15
申请人： MITUTOYO CORPORATION , KOMATSU, Kouichi , AKAGI, Keiji , UEYAMA, Takashi
发明人： MITUTOYO CORPORATION
IPC分类号： G06F15/70
CPC分类号： G06T7/12
摘要： An edge information extracting device and the method thereof in which threshold levels are determined referring to only multivalued pictures which are included in one or more windows provided in a multivalued image and the binarizing is performed. The desired edge information in windows can be extracted reliably and precisely.
摘要翻译：一种边缘信息提取装置及其方法，其中仅参考包括在多值图像中提供的一个或多个窗口中的多值图像来确定阈值水平，并且执行二值化。可以可靠且精确地提取窗口中的所需边缘信息。

8. 发明申请

WO1991003711A1 PHOTOELECTRIC ENCODER 审中-公开
标题翻译：光电编码器
公开(公告)号：WO1991003711A1
公开(公告)日：1991-03-21
申请号：PCT/JP1990001138
申请日：1990-09-05
申请人： MITUTOYO CORPORATION , KABAYA, Yosihiko
发明人： MITUTOYO CORPORATION
IPC分类号： G01D05/36
CPC分类号： G01D5/36
摘要： This invention provides a photoelectric encoder characterized in that a reference grid substrate on a light emission side is formed of a sheet-like light emission device and thin film-like light-shielding materials are arranged at regular gaps on a surface facing the reference grid. Since the light emission device and the grid substrate on the light emission side are formed integrally, the size and weight of the encoder can be reduced and the number of components can be decreased.

9. 发明申请

WO1990013791A1 THREE-DIMENSIONAL MEASURING INSTRUMENT 审中-公开
标题翻译：三维测量仪器
公开(公告)号：WO1990013791A1
公开(公告)日：1990-11-15
申请号：PCT/JP1990000551
申请日：1990-04-27
申请人： MITUTOYO CORPORATION , TAKAHASHI, Keizo , MATSUMOTO, Masakasu
发明人： MITUTOYO CORPORATION
IPC分类号： G01B21/20
CPC分类号： G01B3/002 , G01B21/047
摘要： This invention relates to a three-dimensional measuring instrument capable of setting an origin of measurement arbitrarily by reference point blocks. When dust is deposited on the reference point block, the origin of measurement deviates by a distance corresponding to the thickness of the dust, so that the object measuring accuracy decreases. In order to prevent this inconvenience, covers (40A, 40B, 80) enclosing the reference point blocks (50A, 50B, 70) are provided so that the covers can be opened and closed with respect to the reference point blocks. If these covers are opened only when an origin of measurement is set, the deposition of dust on the reference point blocks can be prevented or reduced extremely, and an origin of measurement can be set accurately, this enabling an object to be measured precisely. This invention can be applied to a three-dimensional measuring instrument adapted to set an origin of measurement by origin ball-carrying reference point blocks and carry out precision measurement of the order of microns.
摘要翻译：本发明涉及能够通过参考点块任意设定测量原点的三维测量仪器。当灰尘沉积在参考点块上时，测量原点偏离与灰尘厚度相对应的距离，从而物体测量精度降低。为了防止这种不便，设置包围参考点块（50A，50B，70）的盖（40A，40B，80），使得盖可以相对于参考点块打开和关闭。如果这些盖仅在设定测量原点时才打开，则可以极大地防止或减少灰尘沉积在基准点块上，并且可以准确地设置测量的原点，从而能够精确地测量物体。本发明可以应用于三维测量仪器，其适用于通过原始球携带参考点块设置测量原点，并执行微米数量级的精密测量。

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