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    • 2. 发明申请
    • SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR SUBSTRATE
    • 半导体衬底,半导体器件及制造半导体衬底的方法
    • WO2006064081A1
    • 2006-06-22
    • PCT/FI2005/000233
    • 2005-05-19
    • OPTOGAN OYODNOBLYUDOV, MaximBOUGROV, VladislavROMANOV, AlexeiLANG, Teemu
    • ODNOBLYUDOV, MaximBOUGROV, VladislavROMANOV, AlexeiLANG, Teemu
    • H01L21/205
    • H01L29/045H01L21/0242H01L21/02458H01L21/02505H01L21/0254H01L29/2003
    • A semiconductor substrate (1) of the present invention is made of nitrides of group III metals having wurtzite crystal structure and is grown in vapor phase either on a (0001) oriented foreign substrate (2), lattice mismatched to the semiconductor substrate materials, or on existing (0001) oriented highly dislocated layer (3) of the semiconductor substrate materials and has a highly reduced dislocation density. According to the present invention, a structure is utilized for the dislocation density reduction, which comprises a dislocation redirection layer (4) providing intentional inclination of threading dislocations (6) towards high index crystallographic planes having crystallographic indexes other than (0001) and those of the type {1100}, in order to enhance the probability for dislocation reactions; and a dislocation reaction layer (5) positioned above said dislocation layer (4), in which the threading dislocations (6) coalesce with each other resulting in reduced threading dislocation density at the semiconductor substrate surface (7).
    • 本发明的半导体衬底(1)由具有纤锌矿晶体结构的III族金属的氮化物制成,并且在(0001)取向的异质衬底(2)上的气相中生长,晶格与半导体衬底材料失配,或 在半导体衬底材料的现有(0001)取向的高位错层(3)上,并且具有高度降低的位错密度。 根据本发明,利用了一种用于位错密度降低的结构,其包括位错重定向层(4),其提供穿透位错(6)有意倾斜于具有(0001)以外的结晶指数的高折射率结晶平面, 类型{1100},以增加错位反应的可能性; 以及位于所述位错层(4)上方的位错反应层(5),其中所述穿透位错(6)彼此结合,导致在半导体衬底表面(7)处的穿透位错密度降低。
    • 5. 发明申请
    • DIAPHRAGM VALVE FOR ATOMIC LAYER DEPOSITION
    • 用于原子层沉积的膜片阀
    • WO2005003605A2
    • 2005-01-13
    • PCT/US2004020916
    • 2004-06-28
    • PLANAR SYSTEMS INCMAULA JARMO ILMARILESKINEN HANNULANG TEEMUKUOSMANEN PEKKAHAERKOENEN KARIAITCHISON BRADLEY J
    • MAULA JARMO ILMARILESKINEN HANNULANG TEEMUKUOSMANEN PEKKAHAERKOENEN KARIAITCHISON BRADLEY J
    • F16K7/14F16K31/06F16K49/00F16K
    • F16K31/0693F16K7/14F16K49/002
    • Diaphragm valves (200) for use in an atomic layer deposition (ALD) system are disclosed. In one embodiment, a heating body (290) forms a thermally conductive pathway between the diaphragm (220) and the valve body (210) to help maintain an operating temperature at the diaphragm and inhibit condensation or freezing of high-temperature ALD precursor gases in the valve passage (214). In another embodiment, a pressure vent (302, 306, 310) communicating with an enclosed space (296) behind the diaphragm reduces resistance to transitioning of the diaphragm between the open and closed positions. In some implementations, a pump or other source of suction (316) is coupled to the pressure vent to reduce fluid pressure in the enclosed space. In yet another embodiment, a valve seat (230) includes an annular seating surface that surrounds an inlet (216) of the valve and contacts a substantial portion of one side of the diaphragm when closed, to facilitate heat transfer and counteract dissipative cooling of the diaphragm.
    • 公开了用于原子层沉积(ALD)系统的隔膜阀(200)。 在一个实施例中,加热体(290)在隔膜(220)和阀体(210)之间形成导热通路,以帮助保持隔膜处的工作温度并且抑制高温ALD前体气体的冷凝或冷冻 阀通道(214)。 在另一个实施例中,与隔膜后面的封闭空间(296)连通的压力通风口(302,306,310)减小了隔膜在打开位置和关闭位置之间的过渡的阻力。 在一些实施方案中,泵或其它吸入源(316)联接到压力通风口以减少封闭空间中的流体压力。 在另一个实施例中,阀座(230)包括环形座表面,环形座表面围绕阀的入口(216)并且在关闭时与隔膜的一侧的大部分接触,以便于传热并抵消散热 隔膜。