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1. 发明申请

WO2015138388A3 WAFER LEVEL INTEGRATED CIRCUIT PROBE ARRAY AND METHOD OF CONSTRUCTION 审中-公开
标题翻译：晶片级集成电路探测阵列及其构建方法
公开(公告)号：WO2015138388A3
公开(公告)日：2015-11-19
申请号：PCT/US2015019602
申请日：2015-03-10
申请人： JOHNSTECH INT CORP
发明人： EDWARDS JATHAN , MARKS CHARLES , HALVORSON BRIAN
IPC分类号： G01R1/067 , G01R1/073 , H01R12/71 , H01R13/24
CPC分类号： G01R1/0466
摘要： A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). To prevent rotation of the pins in the pin guide, a walled recess in the bottom of the pin guide engages flanges on the pins. In another embodiment, the pin guide maintains rotational alignment by being fitted around the pin profile or having projections abutting the pin. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.
摘要翻译：公开了一种用于IC电路的晶片级测试的测试设备。上部和下部销（22,62）构造成相对于彼此滑动并且通过弹性体（80）保持电偏置接触。为了防止销钉在销钉导向装置中旋转，销钉导向装置底部的一个有壁凹槽与销钉上的凸缘接合。在另一个实施例中，销引导件通过围绕销轮廓配合或具有邻接销的突起而保持旋转对齐。通过建立对齐角（506）并且通过至少一个对角相对角处的弹性体将引导件驱动到角中，销引导件（12）保持与保持器14对齐。

2. 发明申请

WO2012033802A3 ELECTRICALLY CONDUCTIVE PINS FOR MICROCIRCUIT TESTER 审中-公开
标题翻译：用于微型测试仪的导电引线
公开(公告)号：WO2012033802A3
公开(公告)日：2012-05-18
申请号：PCT/US2011050634
申请日：2011-09-07
申请人： JOHNSTECH INT CORP , NELSON JOHN E , SHERRY JEFFREY C , ALLADIO PATRICK J , OBERG RUSSELL F , WARWICK BRIAN , MICHALKO GARY W
发明人： NELSON JOHN E , SHERRY JEFFREY C , ALLADIO PATRICK J , OBERG RUSSELL F , WARWICK BRIAN , MICHALKO GARY W
IPC分类号： G01R31/00
CPC分类号： G01R31/2891 , G01R1/0416 , G01R1/06738 , G01R1/06744 , G01R1/0735 , G01R3/00 , G01R31/2887 , G01R31/2889 , Y10T29/49204
摘要： The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.
摘要翻译：被测器件的端子通过一系列导电引脚对临时电连接到负载板上的相应接触焊盘。销对通过插入器膜保持在适当的位置，该插入器膜包括面向被测器件的顶部接触板，面向负载板的底部接触板以及顶部和底部接触板之间的垂直弹性的非导电部件。每个销对包括顶部和底部销，其分别延伸超过顶部和底部接触板，朝向被测设备和负载板。顶部和底部销在相对于膜表面正常倾斜的界面处彼此接触。当纵向压缩时，销沿着界面滑动朝向彼此平移。滑动主要是纵向的，具有由界面的倾斜度确定的小而理想的横向分量。

3. 发明申请

WO2015006624A2 ON-CENTER ELECTRICALLY CONDUCTIVE PINS FOR INTEGRATED TESTING 审中-公开
标题翻译：用于集成测试的中心电导体引脚
公开(公告)号：WO2015006624A2
公开(公告)日：2015-01-15
申请号：PCT/US2014046248
申请日：2014-07-10
申请人： JOHNSTECH INT CORP , JOHNSON DAVID , NELSON JOHN C , PATEL SAROSH , ANDRES MICHAEL
发明人： JOHNSON DAVID , NELSON JOHN C , PATEL SAROSH , ANDRES MICHAEL
IPC分类号： G01R1/073
CPC分类号： G01R1/0466
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a. In an alternate embodiment, the lower section includes a leg extension 320 and a sliding contact land 360 which slides against an aperture in the housing. A spacer 342 provides space for decoupling components on the load board. The hinge may include a truncated cylinder 40b which is configured to permit remove of the upper pin without removal of the lower.
摘要翻译：公开了一种用于在被测器件（DUT）和提供轴向对准的上接触点和下接触点的负载板之间提供接触针的结构和方法。销具有上部（30）和下部（32）部分，并且铰链之间允许上部和下部接触（24/26）的弯曲，但是轴向对准可以直接替代POGO引脚，但具有更大的可靠性。它还包括通过使用改进的铰链244a去除上销230的结构和方法。在一个替代实施例中，下部包括一个腿部延伸部分320和一个抵靠壳体中的一个孔滑动的滑动接触平台360。间隔件342提供用于在装载板上去耦组件的空间。铰链可以包括截头圆筒40b，其被构造成允许去除上销而不移除下销。

4. 发明申请

WO2010123991A3 ELECTRICALLY CONDUCTIVE KELVIN CONTACTS FOR MICROCIRCUIT TESTER 审中-公开
标题翻译： MICROCIRCUIT测试仪的电导式KELVIN触点
公开(公告)号：WO2010123991A3
公开(公告)日：2012-02-02
申请号：PCT/US2010031896
申请日：2010-04-21
申请人： JOHNSTECH INT CORP , ERDMAN JOEL N , SHERRY JEFFREY C , MICHALKO GARY W
发明人： ERDMAN JOEL N , SHERRY JEFFREY C , MICHALKO GARY W
IPC分类号： G01R31/02
CPC分类号： G01R1/067 , G01R1/0466 , G01R1/07378
摘要： Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a "force" contact and a "sense" contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.
摘要翻译：被测器件的端子通过一系列导电触点连接到对应的接触焊盘或引线。每个终端测试都与“强制”接触和“感觉”联系。在一个实施例中，感测触头部分或完全横向地围绕力接触，使得其不需要具有其自身的弹性。感觉触点具有分叉端部，其分叉延伸到力接触件的相对侧。或者，感测触头围绕力接触并且横向滑动以匹配力接触件的纵向压缩期间力接触件的横向横截面的横向平移部件。或者，感测触点包括在力接触的相对侧上具有端部并且平行延伸的杆。

5. 发明申请

WO2015006625A2 TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TESTING 审中-公开
标题翻译：微波和水平测试仪的测试设备和方法
公开(公告)号：WO2015006625A2
公开(公告)日：2015-01-15
申请号：PCT/US2014046249
申请日：2014-07-10
申请人： JOHNSTECH INT CORP , DEBAUCHE JOHN , CAMPION DAN , ANDRES MICHAEL , ROTT STEVE , SHERRY JEFFREY , HALVORSON BRIAN , ESHULT BRIAN
发明人： DEBAUCHE JOHN , CAMPION DAN , ANDRES MICHAEL , ROTT STEVE , SHERRY JEFFREY , HALVORSON BRIAN , ESHULT BRIAN
IPC分类号： G01R31/28 , G01R3/00
CPC分类号： G01R3/00 , G01R1/06733 , G01R1/06738 , G01R1/06772 , G01R1/07314 , G01R1/07371 , Y10T29/49126 , Y10T29/49826
摘要： The test system provides an array of test probes having a cross beam. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. The probes are biased upwardly through the retainer by an elastomeric block having a similar array of slots. The elastomer is then capped at its bottom by a second or lower retainer with like slots to form a sandwich with the elastomer therebetween. The bottom ends of the probes are group by probe height. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and take continue the circuits to a probe card where test signals originate.
摘要翻译：测试系统提供具有横梁的测试探针阵列。探针穿过第一或上部探针引导保持器，该保持器具有多个狭槽，其尺寸设计成以不能旋转的方式接收探针。探针通过具有类似阵列槽的弹性块向上偏压保持器。然后弹性体在其底部被具有相似狭缝的第二或更下部的保持器盖住以形成三明治，其间具有弹性体。探针的底端按探针高度分组。在不同高度处的多个柔性电路在它们各自的高度水平处接合底部探针端，并且将电路继续到测试信号源的探针卡。

6. 发明申请

WO2013192322A3 WAFER LEVEL INTEGRATED CIRCUIT CONTACTOR AND METHOD OF CONSTRUCTION 审中-公开
标题翻译： WAFER LEVEL集成电路接触器及其构造方法
公开(公告)号：WO2013192322A3
公开(公告)日：2014-02-20
申请号：PCT/US2013046604
申请日：2013-06-19
申请人： JOHNSTECH INT CORP , EDWARDS JATHAN , MARKS CHARLES , HALVORSON BRIAN
发明人： EDWARDS JATHAN , MARKS CHARLES , HALVORSON BRIAN
IPC分类号： G01R1/067
CPC分类号： G01R1/06733 , G01R1/07307 , G01R3/00 , G01R31/2601 , Y10T29/49204
摘要： A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). The elastomer is precompressed from its natural rest state between a top (22) plate and a bottom (70). Pre compression improves the resilient response of the pins. The pin crows (40) are maintained relatively coplanar by the engagement of at least one flang (44a-b) against an up-stop surface 90 of plate 20, thereby insuring coplanarity of the crowns. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.
摘要翻译：公开了一种用于IC电路的晶片级测试的测试装置。上销和下销（22,62）构造成彼此相对滑动并且被弹性体（80）保持电偏压接触。弹性体从顶部（22）板和底部（70）之间的自然静止状态预压缩。预压缩提高了引脚的弹性响应。销鸦（40）通过至少一个凸缘（44a-b）与板20的上止止表面90的接合而保持相对共面，从而确保冠的共面性。销引导件（12）通过建立配准角（506）而与保持器14保持对准，并且通过至少一个对角相对的拐角处的弹性体将引导件驱动到拐角中。

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