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    • 1. 发明申请
    • ON-CENTER ELECTRICALLY CONDUCTIVE PINS FOR INTEGRATED TESTING
    • 用于集成测试的中心电导体引脚
    • WO2015006624A2
    • 2015-01-15
    • PCT/US2014046248
    • 2014-07-10
    • JOHNSTECH INT CORPJOHNSON DAVIDNELSON JOHN CPATEL SAROSHANDRES MICHAEL
    • JOHNSON DAVIDNELSON JOHN CPATEL SAROSHANDRES MICHAEL
    • G01R1/073
    • G01R1/0466
    • A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a. In an alternate embodiment, the lower section includes a leg extension 320 and a sliding contact land 360 which slides against an aperture in the housing. A spacer 342 provides space for decoupling components on the load board. The hinge may include a truncated cylinder 40b which is configured to permit remove of the upper pin without removal of the lower.
    • 公开了一种用于在被测器件(DUT)和提供轴向对准的上接触点和下接触点的负载板之间提供接触针的结构和方法。 销具有上部(30)和下部(32)部分,并且铰链之间允许上部和下部接触(24/26)的弯曲,但是轴向对准可以直接替代POGO引脚,但具有更大的 可靠性。 它还包括通过使用改进的铰链244a去除上销230的结构和方法。 在一个替代实施例中,下部包括一个腿部延伸部分320和一个抵靠壳体中的一个孔滑动的滑动接触平台360。 间隔件342提供用于在装载板上去耦组件的空间。 铰链可以包括截头圆筒40b,其被构造成允许去除上销而不移除下销。