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    • 1. 发明申请
    • ELECTRICALLY CONDUCTIVE KELVIN CONTACTS FOR MICROCIRCUIT TESTER
    • MICROCIRCUIT测试仪的电导式KELVIN触点
    • WO2010123991A3
    • 2012-02-02
    • PCT/US2010031896
    • 2010-04-21
    • JOHNSTECH INT CORPERDMAN JOEL NSHERRY JEFFREY CMICHALKO GARY W
    • ERDMAN JOEL NSHERRY JEFFREY CMICHALKO GARY W
    • G01R31/02
    • G01R1/067G01R1/0466G01R1/07378
    • Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a "force" contact and a "sense" contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.
    • 被测器件的端子通过一系列导电触点连接到对应的接触焊盘或引线。 每个终端测试都与“强制”接触和“感觉”联系。 在一个实施例中,感测触头部分或完全横向地围绕力接触,使得其不需要具有其自身的弹性。 感觉触点具有分叉端部,其分叉延伸到力接触件的相对侧。 或者,感测触头围绕力接触并且横向滑动以匹配力接触件的纵向压缩期间力接触件的横向横截面的横向平移部件。 或者,感测触点包括在力接触的相对侧上具有端部并且平行延伸的杆。