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    • 45. 发明申请
    • METHOD FOR THERMOGRAPHIC LUMP SEPARATION OF RAW MATERIAL (VARIANTS) AND DEVICE FOR CARRYING OUT SAID METHOD (VARIANTS)
    • 原材料(变体)的热分解分离方法和实施方法(变量)的装置
    • WO2005118148A1
    • 2005-12-15
    • PCT/UA2004/000036
    • 2004-06-03
    • B03B13/04
    • B07C5/3425B03B13/04B07C5/344B07C5/366
    • The interrelated group of inventions relates to methods and devices for raw material lump separation and can be used for dressing ferrous and non-ferrous metal ores, mining chemical feedstock, secondary raw material and technogenic waste. The essence of the inventive method and device lies in that a useful component containing lump and a barren rock is irradiated by an ultrahigh frequency electromagnetic field (UHF). Said radiation frequency is selected in such a way that the electromagnetic wave penetration depth dependent of lump material properties is greater than the lump maximum linear dimension at the peak attenuation of the electromagnetic wave. UHF electromagnetic radiation energy absorbed by the lump material initiates the heating of the components thereof, wherein the component exhibiting a greater electrical conductivity absorbs the greater amount of UHF energy than the component exhibiting a lower electric conductivity during the same time, whereby the heating temperatures of the useful component and the barren stock measured after irradiation are different. The temperature law depends on the mass ratio of the lump components exhibiting different properties and is recorded by a thermographic system. Said invention makes it possible, under the same conditions, to increase the useful component content from 6-10 % to 18-25 %, the increment of the useful component mass ratio by 4.5 %, to reduce the useful component tailing up to 3 % and the energy consumption by 5 % by decreasing the raw material dilution during the processing thereof.
    • 相关发明的一组涉及原料块分离的方法和装置,可用于黑色金属和有色金属矿石,采矿化学原料,二次原料和技术废料的修整。 本发明的方法和装置的本质在于,通过超高频电磁场(UHF)照射含有块状物和贫瘠岩石的有用成分。 选择所述辐射频率使得根据块状材料特性的电磁波穿透深度大于电磁波峰值衰减时的块最大线性尺寸。 由块状材料吸收的UHF电磁辐射能量引发其组分的加热,其中表现出更大电导率的组分吸收比在同一时间内表现出较低电导率的组分更大量的UHF能量,由此, 照射后测量的有用成分和贫瘠度不同。 温度定律取决于具有不同性质的块状组分的质量比,并且由热成像系统记录。 所述发明使相同条件下有用成分含量从6-10%增加到18-25%,有用成分质量比增加4.5%成为可能,将有用成分减少至3% 并且在处理期间通过减少原料稀释而将能量消耗减少5%。
    • 46. 发明申请
    • INSPECTION MACHINE FOR SURFACE MOUNT PASSIVE COMPONENT
    • 表面安装被动部件检查机
    • WO01089725A1
    • 2001-11-29
    • PCT/US2000/014235
    • 2000-05-23
    • B07C5/342B07C5/344B07C5/00
    • B07C5/365B07C5/344Y10S209/919
    • A visual inspection machine (1) for a surface mount passive component (3) having a rotating circular loader wheel (5) including an upper surface (7) which an inventory of component is placed and a rim (9) having a plurality of cavities (23) to accept a single component therein, a first vacuum means (49, 51) connecting to the loader wheel (5) for retaining each component in the cavity (23), a first inspection (55) external the loader wheel (5) for viewing a first side surface of the component, a transfer wheel (65) arranging planar to the loader wheel (5) for receiving the component from the loader wheel (5), a second inspection means (93) external the transfer wheel (65) for viewing the external surfaces of the component, computer/processor means (63) for tracking the positions of the component that have passed or failed inspection by the first and second inspection means, and a first removal means (101) and a second removal means (125) for removing the component that have failed and passed inspection, respectively, from the transfer wheel (65).
    • 一种用于表面安装无源部件(3)的目视检查机(1),其具有旋转的圆形装载机轮(5),所述旋转圆形装载机轮(5)包括上部表面(7),所述上表面(7) (23)接纳单个部件;第一真空装置(49,51),连接到所述装载轮(5),用于将每个部件保持在所述空腔(23)中;第一检查(55)在所述装载轮(5) ),用于观察所述部件的第一侧表面的传送轮(65),平面布置到所述装载轮(5)上,用于从所述装载轮(5)接收所述部件;第二检查装置(93),在所述传送轮( 65),用于观察组件的外表面,计算机/处理器装置(63),用于跟踪由第一和第二检查装置检查的通过或失败的部件的位置,以及第一移除装置(101)和第二 去除装置(125),用于去除已经发生故障的部件和p 分别从传动轮(65)检查。
    • 47. 发明申请
    • ELECTRONIC COMPONENT HANDLER
    • 电子组件处理器
    • WO01000334A1
    • 2001-01-04
    • PCT/US2000/011144
    • 2000-04-24
    • G01R31/26B07C5/344B65G47/86G01R11/04G01R31/00G01R31/01G06T9/00H04N7/50
    • G01R31/01B07C5/344H04N19/115H04N19/124H04N19/132H04N19/149H04N19/152H04N19/172H04N19/61Y10S209/919Y10S209/932
    • A handler for testing and sorting randomly oriented parallel piped-shaped ceramic components (2), each component (2) having at leas one set of metal terminations (6) located on opposite edges, comprising a rotating feed wheel (16) mounting on a central shaft and including an upper surface to receive randomly oriented components (2), a plurality of radially-pointing, spaced-apart bosses (28) extending upward and outward terminating at component-sized cavities (30) to receive a component (2), a rotating carrier plate (10) having an upwardly extending circular peripheral wall (12) which has test seat notches (14) in spaced-apart arrangement with the cavities in the feed wheel (16), first vacuum pressure device (36) to draw the component (2) into the seat notch and a second vacuum pressure device (86) to hold the component therein, a device (22) for testing including at least one roller assembly (62) arranged to contact the component terminals (6), and a device (26) for separately ejecting the components from the notches (14).
    • 一种用于测试和分类随机取向的平行管状陶瓷部件(2)的处理器,每个部件(2)具有位于相对边缘上的一组金属端子(6),包括安装在 中心轴并且包括上表面以容纳随机取向的部件(2),多个径向指向的间隔开的凸起(28),其向上和向外延伸,终止于部件尺寸的空腔(30),以接收部件(2) ,具有向上延伸的圆形周壁(12)的旋转载板(10),其具有与所述进给轮(16)中的空腔间隔布置的测试座凹口(14),第一真空压力装置(36) 将部件(2)拉入座部凹口和第二真空压力装置(86)以将部件保持在其中,用于测试的装置(22)包括布置成接触部件端子(6)的至少一个滚子组件(62) ,以及用于单独排出的装置(26) 来自凹口(14)的组件。
    • 48. 发明申请
    • ELECTRONIC DEVICE TEST HANDLER
    • 电子设备测试处理器
    • WO1992004989A1
    • 1992-04-02
    • PCT/US1991006948
    • 1991-09-24
    • SYM-TEK SYSTEMS, INC.
    • SYM-TEK SYSTEMS, INC.TWIGG, Ray, G.HAWKES, Malcolm, V.SANTINO, MarroneKLUG, Mark, W.
    • B07C05/344
    • G01R31/2867B07C5/344G01R31/2808G01R31/2862G01R31/2893
    • A device (16) for automatically presenting electronic devices (2) to a tester for testing. A plurality of carriers (12), each for carrying a set of electronic devices (2) are cyclically conveyed in a close loop from a loading stage where electronic devices (2) are loaded onto the carriers, through a pre-test chamber, such as a "soak" chamber, from the pre-test chamber to a test stage where the devices (2) are preferably lifted from the carrier (12) to come into contact with a test head contactor for testing, from the test stage to a post-test chamber, such as "un-soak" chamber, through the post-test chamber to an unloading stage where the carriers (12) are unloaded of the tested electronic devices, and then from the unloading stage back to the loading stage to receive a new set of untested electronic devices. Optionally, each carrier (12) comprises a set of secondary carriers (12) which ride in a like number of seats (4) defined by a primary carrier and sets of electronic devices are loaded onto and unloaded from the secondary carriers. Among other uses, the secondary carriers serve as adapters between the various forms of electronic devices (2) and a standard form of primary carrier (12).
    • 一种用于自动将电子设备(2)呈现给测试仪进行测试的设备(16)。 每个用于承载一组电子设备(2)的多个载体(12)在电子装置(2)被装载到载体上的装载阶段通过预试验室以闭环方式循环地传送, 作为“浸泡”室,从预试验室到测试阶段,其中装置(2)优选地从载体(12)提升以与测试头接触器接触以进行测试,从测试阶段到 后试验室,例如“不浸泡”室,通过后试验室到卸载阶段,其中载体(12)被卸载被测试的电子装置,然后从卸载阶段返回到装载阶段 接收一组未经测试的电子设备。 可选地,每个载体(12)包括一组二次载体(12),该副载体(12)骑在由主载体限定的相同数量的座(4)中,并且一组电子装置被载载到次载体上并从载体上卸载。 在其他用途​​中,辅助载体用作各种形式的电子装置(2)和标准形式的主载体(12)之间的适配器。
    • 50. 发明申请
    • FOOD INSPECTION SYSTEMS AND METHODS
    • 食品检验系统和方法
    • WO2018044327A1
    • 2018-03-08
    • PCT/US2016/050272
    • 2016-09-02
    • EMPIRE TECHNOLOGY DEVELOPMENT LLC
    • MAXWELL, Ian, Andrew
    • G01N21/64B07C5/344
    • B07C5/344B07C5/342G01N21/6456G01N21/8851G01N33/02G01N2021/646G01N2021/8861G01N2201/127
    • A food product inspection system includes a radiation source that emits high power electromagnetic radiation having a wavelength suitable to illuminate a food product and to generate a photoluminescence response therefrom. An imaging sensor detects the photoluminescence response and generates a photoluminescence image of the food product. A quality detection processor analyzes the photoluminescence images to detect food quality properties of the food product. A sorting system for sorts food products based on a spatial position of the food product in dependence on the detected food quality properties. The system may effectively and efficiently determine the quality of the food product by identifying, for example defective food, thereby reducing labor costs associated with inspecting food products. The use of a processor to process the photoluminescence image allows the use of calibration standards to ensure that food products after inspection all have the same characteristics.
    • 食品检验系统包括辐射源,该辐射源发射具有适合于照射食品并且由此产生光致发光响应的波长的高功率电磁辐射。 成像传感器检测光致发光响应并产生食品的光致发光图像。 质量检测处理器分析光致发光图像以检测食品的食品质量特性。 根据检测到的食品质量特性基于食品的空间位置对食品分类的分类系统。 该系统可以通过识别例如有缺陷的食物来有效且高效地确定食品的质量,从而减少与检查食品相关的劳动力成本。 使用处理器来处理光致发光图像允许使用校准标准来确保检测后的食品具有相同的特征。