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    • 1. 发明申请
    • ELECTRONIC DEVICE TEST HANDLER
    • 电子设备测试处理器
    • WO1992004989A1
    • 1992-04-02
    • PCT/US1991006948
    • 1991-09-24
    • SYM-TEK SYSTEMS, INC.
    • SYM-TEK SYSTEMS, INC.TWIGG, Ray, G.HAWKES, Malcolm, V.SANTINO, MarroneKLUG, Mark, W.
    • B07C05/344
    • G01R31/2867B07C5/344G01R31/2808G01R31/2862G01R31/2893
    • A device (16) for automatically presenting electronic devices (2) to a tester for testing. A plurality of carriers (12), each for carrying a set of electronic devices (2) are cyclically conveyed in a close loop from a loading stage where electronic devices (2) are loaded onto the carriers, through a pre-test chamber, such as a "soak" chamber, from the pre-test chamber to a test stage where the devices (2) are preferably lifted from the carrier (12) to come into contact with a test head contactor for testing, from the test stage to a post-test chamber, such as "un-soak" chamber, through the post-test chamber to an unloading stage where the carriers (12) are unloaded of the tested electronic devices, and then from the unloading stage back to the loading stage to receive a new set of untested electronic devices. Optionally, each carrier (12) comprises a set of secondary carriers (12) which ride in a like number of seats (4) defined by a primary carrier and sets of electronic devices are loaded onto and unloaded from the secondary carriers. Among other uses, the secondary carriers serve as adapters between the various forms of electronic devices (2) and a standard form of primary carrier (12).
    • 一种用于自动将电子设备(2)呈现给测试仪进行测试的设备(16)。 每个用于承载一组电子设备(2)的多个载体(12)在电子装置(2)被装载到载体上的装载阶段通过预试验室以闭环方式循环地传送, 作为“浸泡”室,从预试验室到测试阶段,其中装置(2)优选地从载体(12)提升以与测试头接触器接触以进行测试,从测试阶段到 后试验室,例如“不浸泡”室,通过后试验室到卸载阶段,其中载体(12)被卸载被测试的电子装置,然后从卸载阶段返回到装载阶段 接收一组未经测试的电子设备。 可选地,每个载体(12)包括一组二次载体(12),该副载体(12)骑在由主载体限定的相同数量的座(4)中,并且一组电子装置被载载到次载体上并从载体上卸载。 在其他用途​​中,辅助载体用作各种形式的电子装置(2)和标准形式的主载体(12)之间的适配器。