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    • 48. 发明申请
    • ASYMMETRICALLY SELECTING MEMORY ELEMENTS
    • 非对称地选择存储元素
    • WO2016014089A1
    • 2016-01-28
    • PCT/US2014/048306
    • 2014-07-25
    • HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
    • KIM, Kyung MinYANG, JianhuaLI, Zhiyong
    • G11C11/16G11C7/10
    • G11C13/003G11C2013/0073G11C2213/72
    • A system for asymmetrically selecting a memory element is described. The system includes a number of memory cells in a crossbar array. Each memory cell includes a memory element to store information. The memory element is defined as an intersection between a column electrode and a row electrode of the crossbar array. Each memory cell also includes a selector to select a target memory element by relaying a first selecting voltage to a column electrode that corresponds to the target memory element and relaying a second selecting voltage to a row electrode that corresponds to the target memory element. The system also includes a controller to pass a first standing voltage to column electrodes of the crossbar array and to pass a second standing voltage to row electrodes of the crossbar array. The first standing voltage is different than the second standing voltage.
    • 描述用于非对称地选择存储元件的系统。 该系统包括交叉开关阵列中的多个存储单元。 每个存储单元包括存储信息的存储元件。 存储元件被定义为交叉开关阵列的列电极和行电极之间的交点。 每个存储单元还包括选择器,通过将第一选择电压中继到与目标存储器元件对应的列电极并将第二选择电压中继到与目标存储元件对应的行电极来选择目标存储器元件。 该系统还包括控制器,用于将第一直立电压传递到交叉开关阵列的列电极,并将第二直立电压传递到交叉开关阵列的行电极。 第一直立电压不同于第二直立电压。