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    • 11. 发明申请
    • 記憶装置、およびその制御方法
    • 存储装置及其控制方法
    • WO2006080065A1
    • 2006-08-03
    • PCT/JP2005/001094
    • 2005-01-27
    • スパンション エルエルシーSpansion Japan株式会社新林 幸司
    • 新林 幸司
    • G11C11/407
    • G11C7/1051G11C7/106G11C7/1063G11C7/1066
    •  SDRモードの際(S/D=H)、データ状態先行確定信号RDYOの論理レベルの遷移が内部クロックCKIに応じて出力端子(O)に出力される。データ状態先行確定信号RDYOの論理レベル遷移に引き続く内部クロックCKIに同期して、レディ信号RDYが出力される。また、DDRモードの際(S/D=L)、データ状態先行確定信号RDYOの論理レベルの遷移に引き続く内部クロックCKIに応じて出力端子(O)にトグル信号が出力される。データ状態先行確定信号RDYOの論理レベル遷移に引き続く内部クロックCKI以降、内部クロックCKIに同期して、ストローブ信号DQSが出力される。データ状態報知端子(X)から、SDRモードでレディ信号RDYが出力され、DDRモードでストローブ信号DQSが出力される。
    • 在SDR模式(S / D = H)中,根据内部时钟(CKI)将数据状态优先确定信号(RDYO)的逻辑电平转换输出到输出端子(O)。 准备信号(RDY)与数据状态优先确定信号(RDYO)的逻辑电平转换之后的内部时钟(CKI)同步输出。 在DDR模式(S / D = L)中,根据数据状态优先判定信号(RDYO)的逻辑电平转换后的内部时钟(CKI)将触发信号输出到输出端子(O)。 与数据状态优先确定信号(RDYO)的逻辑电平转换之后的内部时钟(CKI)之后的内部时钟(CKI)同步输出选通信号(DQS)。 从数据状态通知终端(X)输出SDR模式中的就绪信号(RDY)和DDR模式中的选通信号(DQS)。
    • 12. 发明申请
    • 半導体記憶装置
    • 半导体存储设备
    • WO2003038832A1
    • 2003-05-08
    • PCT/JP2002/010764
    • 2002-10-16
    • 日本電気株式会社高橋 弘行中川 敦
    • 高橋 弘行中川 敦
    • G11C11/407
    • G11C11/40615G11C7/20G11C11/406G11C11/4072G11C11/4074G11C11/4076G11C2207/2227G11C2211/4067G11C2211/4068
    • An operation control circuit for use in a pseudo−SRAM apparatus in which a deep standby mode and a standby mode are set, so as to reduce the time required for returning from the deep standby mode to the standby mode. When the deep standby mode is switched to the standby mode, first and second timer circuits (12, 14) are started and each of them outputs a timer output TN of a constant cycle required for self refresh and a timing signal TR of a cycle shorter than the self refresh cycle. A counter circuit (15) counts the output TR of the second timer circuit (14) from immediately after the deep standby mode is switched to the standby mode. When the count is matched with a set value, an operation mode switching signal C is output. A selection circuit (17) composed of a multiplexer is switched/controlled by the output of the counter circuit (15) so that it selects the TR until the count value is matched with the set value and the TN afterward for output.
    • 一种用于伪SRAM装置的操作控制电路,其中设置了深待机模式和待机模式,以便减少从深待机模式返回到待机模式所需的时间。 当深度待机模式切换到待机模式时,启动第一和第二定时器电路(12,14),并且每个定时器电路都输出自刷新所需的恒定周期的定时器输出TN和周期短的定时信号TR 比自刷新循环。 计数器电路(15)从深度待机模式切换到待机模式之后立即计数第二定时器电路(14)的输出TR。 当计数与设定值相匹配时,输出运转模式切换信号C. 由多路复用器构成的选择电路(17)由计数器电路(15)的输出进行切换/控制,使其选择TR,直到计数值与设定值和TN之后匹配输出。
    • 14. 发明申请
    • PREDICTIVE TIMING CALIBRATION FOR MEMORY DEVICES
    • 用于存储器件的预测时序校准
    • WO0185884A3
    • 2002-05-23
    • PCT/US0114658
    • 2001-05-07
    • MICRON TECHNOLOGY INC
    • KEETH BRENTJOHNSON BRIAN
    • G11C11/407G11C7/10G11C11/4076G06F13/16
    • G11C11/4076G11C7/1072G11C2207/2254
    • The present invention provides a unique way of using a 2 bit synchronization pattern to obtain a faster and more reliable calibration of multiple data paths in a memory system. If the 2 bit synchronization pattern is generated with a known clock phase relationship, then the data-to-clock phase alignment can be determined using simple decode logic to predict the next m-bits from a just-detected m-bits. If the succeeding m-bit pattern does not match the predicted pattern, then the current data-to-clock alignment fails for a particular delay value adjustment in the data path undergoing alignment, and the delay in that data path is adjusted to a new value. The invention also ensures that data alignment will occur to a desired edge of the clock signal, e.g., a positive going edge, by forcing a failure of all predicted m-bit patterns which are associated with an undesired edge, e.g., a negative going edge, of the clock signal.
    • 本发明提供使用2< N>位同步模式以获得存储器系统中的多个数据路径的更快更可靠的校准的独特方式。 如果以已知的时钟相位关系产生2 位同步模式,则可以使用简单的解码逻辑来确定数据到时钟相位对准,以便从刚刚检测到的m位来预测下一个m位。 如果后续的m位模式与预测模式不匹配,则对于经历对准的数据路径中的特定延迟值调整,当前数据对时钟对准失败,并且该数据路径中的延迟被调整到新值 。 本发明还确保通过强制与不期望的边缘相关联的所有预测的m位模式的故障(例如,正向沿),时钟信号的期望边缘(例如,正向边缘)将发生数据对准 的时钟信号。
    • 15. 发明申请
    • A PREFETCH WRITE DRIVER FOR A RANDOM ACCESS MEMORY
    • 用于随机访问存储器的前缀写入驱动器
    • WO0143135A9
    • 2002-05-16
    • PCT/US0032921
    • 2000-12-05
    • INFINEON TECHNOLOGIES CORPIBM
    • HANSON DAVID RKIRIHATA TOSHIAKIMUELLER GERHARD
    • G11C11/409G11C7/10G11C11/407H03K17/22H03K19/0175
    • G11C7/1072G11C7/1078
    • A prefetch input write driver for a random access memory (RAM) and a RAM including the prefetch input write driver. The prefetch input write driver is especially for a synchronous dynamic RAM (SDRAM). The prefetch input write driver includes a data input stage receiving data, an enable stage receiving a corresponding data enable, and a write driver providing received data to a memory array in response to a write signal and the corresponding enable stage state. The data stage and the enable stage may each include two or more series connected three state drivers and a latch at the output of each three state driver. As data passes through the data stage a corresponding enable state is passed through the enable stage. Data is passed to the RAM array if the enable state indicates that data in the data stage is to be written into the array.
    • 用于随机存取存储器(RAM)的预取输入写入驱动器和包括预取输入写入驱动器的RAM。 预取输入写入驱动器特别适用于同步动态RAM(SDRAM)。 预取输入写入驱动器包括数据输入级接收数据,使能级接收对应的数据使能,以及写入驱动器,响应于写入信号和相应的使能级状态向存储器阵列提供接收到的数据。 数据级和使能级可以各自包括两个或更多个串联连接的三状态驱动器和每个三状态驱动器的输出端的锁存器。 当数据通过数据阶段时,相应的使能状态通过使能阶段。 如果使能状态指示要将数据级中的数据写入阵列,则将数据传递到RAM阵列。
    • 17. 发明申请
    • METHOD AND APPARATUS FOR SYNCHRONIZATION OF ROW AND COLUMN ACCESS OPERATIONS
    • 用于同步线和列的访问操作的方法和装置
    • WO02005283A1
    • 2002-01-17
    • PCT/CA2001/000990
    • 2001-07-06
    • G11C11/419G11C7/22G11C8/18G11C11/407G11C11/4076G11C11/408G11C11/409
    • G11C7/1072G11C7/08G11C7/22G11C7/222G11C8/18G11C11/4076G11C11/4087G11C11/4091G11C2207/002G11C2207/065G11C2207/2281
    • A circuit for synchronizing row and column access operations in a semiconductor memory having an array of bit lines pairs, word lines, memory cells, sense amplifiers, and a sense amplifier power supply circuit for powering the sense amplifiers, the circuit comprising, a first delay circuit for delaying a word line timing pulse by a first predetermined period, a first logic circuit for logically combining the word line timing pulse and the delayed word line timing pulse to produce a sense amplifier enable signal, for enabling a sense amplifier power supply circuit, a second delay circuit for delaying the word line timing pulse by a second predetermined period, and a second logic circuit for logically combining the word line timing pulse and the second delayed word line timing pulse to produce a column select enable signal, for enabling selected ones of a plurality of column access devices wherein the second predetermined time period is selected so that ones of a plurality of column access devices are activated after the sense amplifier power supply circuit is enabled.
    • 一种用于在半导体存储器中同步行和列存取操作的电路,该半导体存储器具有阵列的位线对,字线,存储单元,读出放大器和用于为读出放大器供电的读出放大器电源电路,该电路包括第一延迟 用于将字线定时脉冲延迟第一预定周期的电路,用于逻辑地组合字线定时脉冲和延迟字线定时脉冲以产生读出放大器使能信号的第一逻辑电路,用于使读出放大器电源电路, 用于将字线定时脉冲延迟第二预定周期的第二延迟电路和用于逻辑组合字线定时脉冲和第二延迟字线定时脉冲以产生列选择使能信号的第二逻辑电路, 多个列访问装置,其中选择第二预定时间段,使得多个列访问装置中的一个 在读出放大器电源电路使能后,ss器件被激活。
    • 20. 发明申请
    • INTEGRATED MEMORY
    • 集成内存
    • WO00042612A1
    • 2000-07-20
    • PCT/DE2000/000025
    • 2000-01-03
    • G11C11/408G11C7/06G11C7/10G11C11/22G11C11/407G11C11/409
    • G11C7/06G11C7/1048G11C11/22
    • An integrated memory comprising m > 1 bit lines (BL0..3) that are connected to an input of a read-write amplifier (SA) via a switching element (T1) whereby only one switching element (T1) is conductively connected for each read or write access. The memory is provided with a switching unit (C) that influences read or write access occurring by means of the read-write amplifier (SA) and bit lines (BL0..3), whereby said unit is provided with an activation input. A column-end decoder (DEC) comprises a first decoder stage (A) and m second decoder stages (N). The outputs (LCSL0..3) of the second decoder stages (N) are connected to a control input for each of the switching elements (T1). The output (GCSL0) of the first decoder stage (A) is connected to the activation input of the switching unit (C).
    • 集成的存储器包括M> 1条的位线(BL0..3),其经由相应的开关元件(T1)到一读出放大器(SA)的一个输入相连接,仅在每次读或写访问的开关元件中的一个(T1) 已打开。 该存储器包括用于影响在读出放大器(SA)和位线(BL0..3)发生的读取或写入访问,其具有激活输入的电路单元(C)。 列译码器(DEC)包括:第一解码器级(A)和m个第二解码级(N)。 第二解码器级(N)的输出端(LCSL0..3)被连接到各开关元件(T1)的控制输入端。 输出第一解码器级的(GCSL0)(A)被分别连接到(C)的电路单元的激活输入,。