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    • 6. 发明申请
    • OPTICAL DETECTION SYSTEM
    • 光学检测系统
    • US20120250003A1
    • 2012-10-04
    • US13072857
    • 2011-03-28
    • Songping Gao
    • Songping Gao
    • G01J1/58G01J3/44G01N21/00G01J3/30
    • G01N21/65C12Q1/6869G01N21/6452C12Q2535/113C12Q2535/122C12Q2563/107C12Q2565/102C12Q2565/629C12Q2565/632
    • An optical detection system includes a detector configured to detect a signal emitted from a sample carrier and generate an output indicative of the signal detected by the detector. The sample carrier emits the signal in response to the sample carrier being scanned by an excitation source, the emitted signal is indicative of a structural characteristic of the sample carrier, and the sample carrier includes bulk material, at least one material free chamber and a bulk material/chamber interface for each chamber. The optical detection system further includes a data evaluator that identifies the structural characteristic of the sample carrier based on the output of the detector and generates data indicative of the identified structural characteristic.
    • 光学检测系统包括检测器,其被配置为检测从样本载体发射的信号,并产生指示由检测器检测到的信号的输出。 样品载体响应于由激发源扫描的样品载体发射信号,所发射的信号指示样品载体的结构特征,并且样品载体包括散装材料,至少一个材料自由室和体积 每个室的材料/室接口。 光学检测系统还包括基于检测器的输出识别样品载体的结构特征的数据评估器,并产生指示所识别的结构特征的数据。
    • 7. 发明申请
    • METHODS FOR UNIFORM METAL IMPREGNATION INTO A NANOPOROUS MATERIAL
    • 将金属均匀地纳入纳米材料的方法
    • US20100171950A1
    • 2010-07-08
    • US12575369
    • 2009-10-07
    • Selena CHANSunghoon KwonNarayan Sundararajan
    • Selena CHANSunghoon KwonNarayan Sundararajan
    • G01J3/44
    • G01N21/658B01D67/0062B01D67/0086B01D67/0088B01D71/02B82Y15/00B82Y30/00C12Q1/6825G01J3/44G01N21/65G01N2021/6439G01N2021/655G01N2021/656C12Q2565/632C12Q2563/155
    • The methods, systems 400 and apparatus disclosed herein concern metal 150 impregnated porous substrates 110, 210. Certain embodiments of the invention concern methods for producing metal-coated porous silicon substrates 110, 210 that exhibit greatly improved uniformity and depth of penetration of metal 150 deposition. The increased uniformity and depth allow improved and more reproducible Raman detection of analytes. In exemplary embodiments of the invention, the methods may comprise oxidation of porous silicon 110, immersion in a metal salt solution 130, drying and thermal decomposition of the metal salt 140 to form a metal deposit 150. In other exemplary embodiments of the invention, the methods may comprise microfluidic impregnation of porous silicon substrates 210 with one or more metal salt solutions 130. Other embodiments of the invention concern apparatus and/or systems 400 for Raman detection of analytes, comprising metal-coated porous silicon substrates 110, 210 prepared by the disclosed methods.
    • 本文公开的方法,系统400和装置涉及金属150浸渍的多孔基材110,210。本发明的某些实施方案涉及用于制造金属涂覆的多孔硅基板110,210的方法,其显示出显着改善金属150沉积物的均匀性和深度的渗透 。 增加的均匀性和深度允许分析物的改进和更可重复的拉曼检测。 在本发明的示例性实施例中,所述方法可以包括多孔硅110的氧化,浸入金属盐溶液130中,干燥和热分解金属盐140以形成金属沉积物150.在本发明的其它示例性实施方案中, 方法可以包括多孔硅衬底210与一种或多种金属盐溶液130的微流体浸渍。本发明的其它实施方案涉及用于分析物的拉曼检测的装置和/或系统400,包括金属涂覆的多孔硅衬底110,210,由 公开的方法。