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    • 3. 发明授权
    • Method for fabricating narrow magnetic read width TMR/CPP sensors
    • 制造窄磁读宽TMR / CPP传感器的方法
    • US08011084B2
    • 2011-09-06
    • US12184054
    • 2008-07-31
    • Quang LeJui-Lung Li
    • Quang LeJui-Lung Li
    • G11B5/127H04R31/00
    • G11B5/3909B82Y10/00B82Y25/00G01R33/093G01R33/098G11B5/3163G11B5/3932G11B2005/3996Y10T29/49043Y10T29/49044Y10T29/49046Y10T29/49048Y10T29/49052
    • A method for manufacturing a manufacturing a magnetoresistive sensor that allows the sensor to be constructed with a very narrow and well controlled track width. The method includes depositing a layer of diamond like carbon over a series of sensor layers. A first mask is then formed to define a sensor, and an ion milling is performed to remove sensor material not protected by the first mask. Then, a second mask is formed, and a hard bias layer is deposited to the thickness of the sensor layers. The second mask is then lifted off and a CMP is performed to remove the first mask structure. Because all areas other than the area directly over the sensor are substantially planar a quick, gentle CMP can be used to remove the first mask layer even if the first mask is small, such as for definition of a very narrow track-width sensor.
    • 一种用于制造磁阻传感器的方法,该传感器允许传感器被构造成具有非常窄且良好控制的轨道宽度。 该方法包括在一系列传感器层上沉积一层类似金刚石的碳。 然后形成第一掩模以限定传感器,并且执行离子铣削以去除未被第一掩模保护的传感器材料。 然后,形成第二掩模,并且在传感器层的厚度上沉积硬偏置层。 然后将第二掩模剥离并执行CMP以除去第一掩模结构。 由于除传感器正上方的区域以外的所有区域基本上是平面的(由于第二掩模的移除和硬偏置材料的低水平),可以使用快速,温和的CMP来去除第一掩模层,即使 第一个掩模很小,如定义非常窄的轨道宽度传感器。