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    • 3. 发明授权
    • Potential pulse-scan methods of analyzing organic additives in plating baths with multi-component additives
    • 用多组分添加剂分析电镀浴中有机添加剂的潜在脉冲扫描方法
    • US06773569B2
    • 2004-08-10
    • US10142719
    • 2002-05-08
    • Zhi-Wen SunNicolay KovarskyChunman YuGirish Dixit
    • Zhi-Wen SunNicolay KovarskyChunman YuGirish Dixit
    • C25D2112
    • C25D21/12
    • A cyclic voltammetric method for measuring the concentration of additives in a plating solution. The method generally includes providing the plating solution, having an unknown concentration of an additive to be measured therein and cycling the potential of an inert working electrode through a series of measurement steps. The series of measurement steps includes a metal stripping step including pulsing from an open circuit potential to a metal stripping potential between about 0.2 V and about 0.8 V, and holding the metal stripping potential until a corresponding current nears 0 mA/cm. The series of measurement steps further includes a cleaning step including pulsing from the metal stripping potential to a cleaning potential between about 1.2 V and about 1.6 V, and holding the cleaning potential for about 2 seconds to about 10 seconds. The series of measurement steps then includes a pre-plating step including pulsing from the cleaning potential to a pre-plating potential between about −0.2 V and about −0.5 V, and holding the pre-plating potential for about 2 seconds to about 10 seconds. The series of measurement steps additionally includes an equilibration step including pulsing from the pre-plating potential to the open circuit potential, and holding the open circuit potential for a predetermined time period, and a metal deposition step including scanning from the open circuit potential of the equilibration step to an additive sensitive potential, holding the additive sensitive potential for about 1 second to about 30 seconds, and scanning back to the open circuit potential. The method further includes plotting a profile of a deposition current resulting from the metal deposition potential as a function of time and integrating the deposition current to determine the concentration of the additive to be measured.
    • 一种用于测量电镀溶液中添加剂浓度的循环伏安法。 该方法通常包括提供具有未测量的待测量添加剂浓度的电镀溶液,并通过一系列测量步骤循环惰性工作电极的电位。 一系列测量步骤包括金属剥离步骤,其包括从约0.2V至约0.8V之间的开路电位脉冲至金属剥离电势,并保持金属剥离电位,直到相应的电流接近0mA / cm。 一系列测量步骤还包括清洁步骤,其包括从金属剥离电位脉冲至约1.2V至约1.6V之间的清洁电势,并将清洁电位保持约2秒至约10秒。 所述一系列测量步骤包括预镀步骤,包括从清洁电势脉冲至约-0.2V至约-0.5V之间的预镀电势,并将预镀电位保持约2秒至约10秒 。 一系列测量步骤还包括平衡步骤,包括从预镀电位脉冲到开路电位,并将开路电位保持预定时间段,以及金属沉积步骤,包括从开路电位扫描 平衡步骤到加性敏感电位,保持添加剂敏感电位约1秒至约30秒,并扫描回开路电位。 该方法还包括绘制由金属沉积电势产生的沉积电流的轮廓作为时间的函数,并且积分沉积电流以确定待测量的添加剂的浓度。
    • 8. 发明申请
    • ANOLYTE FOR COPPER PLATING
    • 铜镀层
    • US20070175752A1
    • 2007-08-02
    • US11539477
    • 2006-10-06
    • Michael YangNicolay Kovarsky
    • Michael YangNicolay Kovarsky
    • C25B13/04
    • C25D17/002A23D7/00A23D7/005A23D7/01A23J7/00C07F9/103C25D7/123C25D17/001C25D21/22H01L21/2885H01L21/76877
    • Embodiments of the invention provide a method for plating copper into features formed on a semiconductor substrate. The method includes positioning the substrate in a plating cell, wherein the plating cell includes a catholyte volume containing a catholyte solution, an anolyte volume containing an anolyte solution, an ionic membrane positioned to separate the anolyte volume from the catholyte volume, and an anode positioned in the anolyte volume. The method further includes applying a plating bias between the anode and the substrate, plating copper ions onto the substrate from the catholyte solution, and replenishing the copper ions plated onto the substrate from the catholyte solution with copper ions transported from the anolyte solution via the ionic membrane, wherein the catholyte solution has a copper concentration of greater than about 51 g/L.
    • 本发明的实施例提供了一种将铜电镀到形成在半导体衬底上的特征的方法。 该方法包括将基板定位在电镀槽中,其中镀覆电池包括含有阴极电解液的阴极电解液体积,含有阳极电解液的阳极电解液体,将阳极电解液体积与阴极电解液容积分离的离子膜, 在阳极电解液中。 该方法还包括在阳极和衬底之间施加电镀偏压,从阴极电解液将铜离子镀覆到衬底上,并从阴极电解液中补充镀在衬底上的铜离子,铜离子从阳极电解液通过离子 膜,其中阴极电解液的铜浓度大于约51g / L。