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    • 1. 发明授权
    • Diamond semiconductor device and method for manufacturing the same
    • 金刚石半导体器件及其制造方法
    • US07064352B2
    • 2006-06-20
    • US11003510
    • 2004-12-06
    • Yoshihiro YokotaNobuyuki KawakamiTakeshi TachibanaKazushi Hayashi
    • Yoshihiro YokotaNobuyuki KawakamiTakeshi TachibanaKazushi Hayashi
    • H01L31/312H01L21/00
    • H01L29/1602H01L29/78
    • A diamond semiconductor device includes a substrate made of single crystal diamond; a first diamond layer, placed on the substrate, containing an impurity; a second diamond layer containing the impurity, the second diamond layer being placed on the substrate and spaced from the first diamond layer; and a third diamond layer which has a impurity content less than that of the first and second diamond layers, which acts as a channel region, and through which charges are transferred from the first diamond layer to the second diamond layer. The first and second diamond layers have a first and a second end portion, respectively, facing each other with a space located therebetween. The first and second end portions have slopes epitaxially formed depending on the orientation of the substrate. The third diamond layer lies over the slopes and a section of the substrate that is located under the space.
    • 金刚石半导体器件包括由单晶金刚石制成的衬底; 第一金刚石层,放置在衬底上,含有杂质; 含有所述杂质的第二金刚石层,所述第二金刚石层被放置在所述基板上并与所述第一金刚石层间隔开; 以及第三金刚石层,其杂质含量小于作为沟道区的第一和第二金刚石层的杂质含量,并且电荷从第一金刚石层转移到第二金刚石层。 第一和第二金刚石层具有彼此面对的第一和第二端部,其间具有空间。 第一和第二端部具有取决于衬底的取向外延形成的斜面。 第三金刚石层位于斜坡上方,并且位于该空间下方的基底部分。
    • 10. 发明申请
    • Beam Detector and Beam Monitor Using The Same
    • 光束检测器和使用它的光束监视器
    • US20100219350A1
    • 2010-09-02
    • US12223074
    • 2007-02-27
    • Koji KobashiTakeshi TachibanaYoshihiro YokotaKazushi Hayashi
    • Koji KobashiTakeshi TachibanaYoshihiro YokotaKazushi Hayashi
    • G01T1/202C09K11/65
    • G01T1/29C23C16/0254C23C16/274C23C16/277
    • A beam detector and a beam monitor using the same are provided, the beam detector being capable of precisely and stably detecting, for a long period of time, the position, the intensity distribution, and the change with time of radiation beams, soft x-ray beams, and the like and being manufactured at a low cost as compared to that of a conventional detection device.In a beam detector 2 for detecting the position and intensity of beams, a beam irradiation portion 6 to be irradiated with beams 7 is formed of a polycrystalline diamond (C) film 4 containing at least one element (X) selected from the group consisting of silicon (Si), nitrogen (N), lithium (Li), beryllium (Be), boron (B), phosphorus (P), sulfur (S), nickel (Ni), and vanadium (V) at an X/C of 0.1 to 1,000 ppm, and this polycrystalline diamond film 4 has a light emission function of performing light emissions 8 and 8a when it is irradiated with the beams 7. By the beam detector 2 as described above and light emission observation means 3 and 3a for observing the above light emission phenomenon, a beam monitor 1 is formed.
    • 提供了一种使用其的光束检测器和光束监视器,该光束检测器能够长时间精确而稳定地检测位置,强度分布以及辐射束随时间的变化, 射线束等,并且与传统的检测装置相比以低成本制造。 在用于检测光束的位置和强度的光束检测器2中,用光束7照射的光束照射部分6由多晶金刚石(C)膜4形成,该多晶金刚石(C)膜4包含至少一种选自以下的元素(X): 在X / C下,硅(Si),氮(N),锂(Li),铍(Be),硼(B),磷(P),硫(S),镍(Ni)和钒 为0.1〜1000ppm,并且该多晶金刚石膜4具有在用光束7照射时进行发光8和8a的发光功能。通过如上所述的光束检测器2和发光观察装置3和3a, 观察上述发光现象,形成光束监视器1。