会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 再颁专利
    • Positioning device having two object holders
    • 具有两个物体支架的定位装置
    • USRE40043E1
    • 2008-02-05
    • US10347491
    • 1998-02-27
    • Yim-Bun Patrick KwanGerrit Maarten BonnemaErik Roelof LoopstraHarmen Klaas Van Der SchootGerjan Peter Veldhuis
    • Yim-Bun Patrick KwanGerrit Maarten BonnemaErik Roelof LoopstraHarmen Klaas Van Der SchootGerjan Peter Veldhuis
    • G03B27/42G03B11/00
    • G03F7/70733B23Q1/621B23Q1/623B23Q11/0032G03F7/70716G03F7/70741G03F7/7075G03F7/709H01L21/682
    • A positioning device has first and second object holders that are guided over a guiding surface extending parallel to an X-direction and parallel to a Y-direction perpendicular to the X-direction and which are displaceable over the guiding surface from a first position into a second position by means of a displacement system. The displacement system includes a first displacement unit and a second displacement unit to which the object holders can be alternately coupled. The first displacement unit is suitable for carrying out a first series of positioning steps of the first object holder in the first position and for displacing the first object holder from the first position into an intermediate position between the first and second positions. The second displacement unit is suitable for carrying out a second series of positioning steps of the second object holder in the second position, simultaneously with and independently of the first displacement unit, and for displacing the second object holder from the second position into the intermediate position. In the intermediate position, the object holders are exchanged, after which the first series of positioning steps can be carried out by the first displacement unit with the second object holder in the first position and the second series of positioning steps can be carried out by the second displacement unit with the first object holder in the second position. The positioning device is suitable for use in a lithographic device to carry out an exposure process with a first semiconductor substrate in an exposure position and, simultaneously therewith and independently thereof, a characterization process with a second semiconductor substrate in a characterization position.
    • 定位装置具有第一和第二物体保持器,所述第一和第二物体保持器被引导到平行于X方向并且平行于与X方向垂直的Y方向延伸的引导表面,并且可以在引导表面上从第一位置移动到 通过位移系统的第二位置。 位移系统包括第一位移单元和第二位移单元,物体保持器可以交替地联接到该位移单元。 第一位移单元适于在第一位置执行第一物体保持器的第一系列定位步骤,并且用于将第一物体保持器从第一位置移动到第一位置和第二位置之间的中间位置。 第二位移单元适于在与第一位移单元同时且独立于第二位置执行第二对象保持器的第二系列定位步骤,并且用于将第二物体保持器从第二位置移动到中间位置 。 在中间位置,更换物体保持器,之后可以通过第一位移单元执行第一系列定位步骤,使第二物体保持器处于第一位置,并且第二系列定位步骤可以由 第二位移单元,其中第一对象保持器处于第二位置。 该定位装置适用于光刻设备,以在曝光位置中与第一半导体衬底进行曝光处理,并且同时进行曝光处理,并且独立于此,具有表征位置的第二半导体衬底的表征过程。
    • 5. 发明授权
    • Optical module for a microlithography objective including holding and supporting devices
    • 用于微光学目标的光学模块,包括保持和支撑装置
    • US08711331B2
    • 2014-04-29
    • US11597297
    • 2005-05-24
    • Jens KuglerFranz SorgYim-Bun Patrick Kwan
    • Jens KuglerFranz SorgYim-Bun Patrick Kwan
    • G03B27/70
    • G02B19/0023G02B7/00G02B7/021G02B7/023G02B7/026G02B7/182G02B17/0605G02B17/0615G03F7/70825
    • There is provided an optical module for an objective. The optical module includes (a) a first holding device with an inner circumference, which extends in a first circumferential direction, (b) at least one first supporting device for supporting a first optical element and being fixed at said inner circumference of said first holding device, (c) an annular circumferential first assembly space being defined by displacing said first supporting device once in a revolving manner along said first circumferential direction, (d) at least one second supporting device being provided for supporting a second optical element and being fixed at said inner circumference of said first holding device, and (e) an annular circumferential second assembly space being defined by displacing said second supporting device once in a revolving manner along said first circumferential direction. The first assembly space intersects the second assembly space.
    • 提供了一种用于物镜的光学模块。 光学模块包括:(a)具有沿第一圆周方向延伸的内圆周的第一保持装置,(b)至少一个第一支撑装置,用于支撑第一光学元件并固定在所述第一保持件的所述内圆周 装置,(c)通过沿着所述第一圆周方向以旋转方式移动所述第一支撑装置来限定环形圆周第一组合空间;(d)至少一个第二支撑装置,用于支撑第二光学元件并被固定 在所述第一保持装置的所述内圆周处,以及(e)通过沿着所述第一圆周方向以旋转方式使所述第二支撑装置移动一次而限定的环形圆周第二组合空间。 第一组装空间与第二组装空间相交。
    • 6. 发明授权
    • Optical imaging device with determination of imaging errors
    • 具有成像误差确定的光学成像装置
    • US08587765B2
    • 2013-11-19
    • US12158340
    • 2006-12-21
    • Yim-Bun Patrick Kwan
    • Yim-Bun Patrick Kwan
    • G03B27/54G03B27/68G03B27/42
    • G03F7/706G03F7/70591
    • In some embodiments, the disclosure provides a system that includes an optical element group including a plurality of optical elements configured to project a pattern of an object in an object plane to an image plane. The system also includes a unit configured to detect an image selected from an image of at least part of the projection the pattern of the object, and an image of a measurement element arranged in the area of the object. The image is created via at least some of the optical elements in the optical element group. The unit is configured to determine an imaging error in the projection of the pattern of the object from the object plane to the image plane. The device is configured to be used in microlithography.
    • 在一些实施例中,本公开提供了一种系统,其包括光学元件组,该光学元件组包括被配置为将物体平面中的物体的图案投影到像平面的多个光学元件。 该系统还包括:被配置为检测从至少部分投影的图像中选择的图像的图像的图像以及布置在对象区域中的测量元素的图像的单元。 通过光学元件组中的至少一些光学元件创建图像。 该单元被配置为确定从对象平面到图像平面的物体的图案的投影中的成像误差。 该器件被配置为用于微光刻。