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    • 6. 发明授权
    • Optical module for a microlithography objective including holding and supporting devices
    • 用于微光学目标的光学模块,包括保持和支撑装置
    • US08711331B2
    • 2014-04-29
    • US11597297
    • 2005-05-24
    • Jens KuglerFranz SorgYim-Bun Patrick Kwan
    • Jens KuglerFranz SorgYim-Bun Patrick Kwan
    • G03B27/70
    • G02B19/0023G02B7/00G02B7/021G02B7/023G02B7/026G02B7/182G02B17/0605G02B17/0615G03F7/70825
    • There is provided an optical module for an objective. The optical module includes (a) a first holding device with an inner circumference, which extends in a first circumferential direction, (b) at least one first supporting device for supporting a first optical element and being fixed at said inner circumference of said first holding device, (c) an annular circumferential first assembly space being defined by displacing said first supporting device once in a revolving manner along said first circumferential direction, (d) at least one second supporting device being provided for supporting a second optical element and being fixed at said inner circumference of said first holding device, and (e) an annular circumferential second assembly space being defined by displacing said second supporting device once in a revolving manner along said first circumferential direction. The first assembly space intersects the second assembly space.
    • 提供了一种用于物镜的光学模块。 光学模块包括:(a)具有沿第一圆周方向延伸的内圆周的第一保持装置,(b)至少一个第一支撑装置,用于支撑第一光学元件并固定在所述第一保持件的所述内圆周 装置,(c)通过沿着所述第一圆周方向以旋转方式移动所述第一支撑装置来限定环形圆周第一组合空间;(d)至少一个第二支撑装置,用于支撑第二光学元件并被固定 在所述第一保持装置的所述内圆周处,以及(e)通过沿着所述第一圆周方向以旋转方式使所述第二支撑装置移动一次而限定的环形圆周第二组合空间。 第一组装空间与第二组装空间相交。
    • 7. 发明授权
    • Optical imaging device with determination of imaging errors
    • 具有成像误差确定的光学成像装置
    • US08587765B2
    • 2013-11-19
    • US12158340
    • 2006-12-21
    • Yim-Bun Patrick Kwan
    • Yim-Bun Patrick Kwan
    • G03B27/54G03B27/68G03B27/42
    • G03F7/706G03F7/70591
    • In some embodiments, the disclosure provides a system that includes an optical element group including a plurality of optical elements configured to project a pattern of an object in an object plane to an image plane. The system also includes a unit configured to detect an image selected from an image of at least part of the projection the pattern of the object, and an image of a measurement element arranged in the area of the object. The image is created via at least some of the optical elements in the optical element group. The unit is configured to determine an imaging error in the projection of the pattern of the object from the object plane to the image plane. The device is configured to be used in microlithography.
    • 在一些实施例中,本公开提供了一种系统,其包括光学元件组,该光学元件组包括被配置为将物体平面中的物体的图案投影到像平面的多个光学元件。 该系统还包括:被配置为检测从至少部分投影的图像中选择的图像的图像的图像以及布置在对象区域中的测量元素的图像的单元。 通过光学元件组中的至少一些光学元件创建图像。 该单元被配置为确定从对象平面到图像平面的物体的图案的投影中的成像误差。 该器件被配置为用于微光刻。