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1. 发明授权

US10793472B2 Anti-sagging gypsum product and a method to manufacture 有权
公开(公告)号：US10793472B2
公开(公告)日：2020-10-06
申请号：US14379730
申请日：2012-12-03
申请人： Xiaotong Gao , Huifen Li , Hao Song , Ke Zhang
发明人： Xiaotong Gao , Huifen Li , Hao Song , Ke Zhang
IPC分类号： B28B1/30 , C04B24/06 , C04B28/14 , B28B17/00 , C04B111/00 , C04B111/40
摘要： The present invention provides a composition, a gypsum board and their preparation method and the use of ascorbic acid as an anti-sagging additive in a gypsum board. Said gypsum board comprises set gypsum prepared from the composition; while said composition comprises hemi-hydrate gypsum, water and a compound comprising group and no carboxylate groups. The set gypsum prepared from the said composition shows better anti-sagging or deformation resisting property. The gypsum board of the present invention is hardly distorted and has stronger stability even in the condition of high humidity, thus improve the quality of the gypsum board to meet the demands of the customer.

2. 发明申请

US20120105624A1 METHOD AND DEVICE FOR DEFECT INSPECTION IN SEPARATED TRANSPARENT AND/OR SEMI-TRANSPARENT BODY 审中-公开
标题翻译：分离透明和/或半透明体内缺陷检查的方法和装置
公开(公告)号：US20120105624A1
公开(公告)日：2012-05-03
申请号：US13381422
申请日：2010-07-02
申请人： Xiaofeng Lin , Jean-Philippe Schweitzer , Huifen Li , Wenhua Deng , Haifeng Chen , Dazhi Chen
发明人： Xiaofeng Lin , Jean-Philippe Schweitzer , Huifen Li , Wenhua Deng , Haifeng Chen , Dazhi Chen
IPC分类号： H04N7/18
CPC分类号： G01N21/958 , G01N21/9009
摘要： An apparatus and a method for detecting a defect of a separated low rigidity transparent or translucent body, wherein an image acquiring device includes: a first conveyer and a second conveyer to convey a separated low rigidity transparent or translucent body; a transparent bridge disposed between a first conveyer and a second conveyer along a transport path of the separated low rigidity transparent or translucent body, the transparent bridge having a top surface; an illuminating unit disposed on one side of the transparent bridge and configured to project diffusive light onto the top surface of the transparent bridge by transmitting through the transparent bridge; and an image pickup unit disposed on the other side of the transparent bridge and configured to receive light projected from the illuminating unit and transmitting through the separated low rigidity transparent or translucent body to form an image when the separated low rigidity transparent or translucent body enters the top surface of the transparent bridge. With the apparatus and the method, it is possible to detect a defect of the separated low rigidity transparent or translucent body.
摘要翻译：一种用于检测分离的低刚性透明或半透明体的缺陷的装置和方法，其中图像获取装置包括：第一传送器和第二传送器，用于传送分离的低刚性透明或半透明体; 透明桥，其沿着分离的低刚性透明或半透明体的输送路径设置在第一输送机和第二输送机之间，透明桥具有顶表面; 照明单元，其设置在所述透明桥的一侧，并且被配置为通过透过所述透明桥将漫射光投射到所述透明桥的顶表面上; 以及图像拾取单元，其设置在所述透明桥的另一侧，并且被配置为接收从所述照明单元投影的光并且在所分离的低刚性透明或半透明体进入所述透明半导体时透过所述分离的低刚性透明体或半透明体形成图像透明桥顶面。利用该装置和方法，可以检测分离的低刚性透明或半透明体的缺陷。

3. 发明申请

US20110310244A1 SYSTEM AND METHOD FOR DETECTING A DEFECT OF A SUBSTRATE 审中-公开
标题翻译：用于检测基板缺陷的系统和方法
公开(公告)号：US20110310244A1
公开(公告)日：2011-12-22
申请号：US13203526
申请日：2010-02-26
申请人： Jean-Philippe Schweitzer , Huifen Li , Xiaofeng Lin , Feng Guo , Xiaofeng Guo
发明人： Jean-Philippe Schweitzer , Huifen Li , Xiaofeng Lin , Feng Guo , Xiaofeng Guo
IPC分类号： H04N7/18
CPC分类号： G01N21/896 , G01N21/898 , G01N2021/8854 , G01N2021/8874 , H02S50/15
摘要： A system and a method for detecting defects of a substrate are provided. The system includes: a first illuminating component, disposed at one side of the substrate and adapted to emit diffused light to the substrate; a first imaging component, disposed at the other side of the substrate and adapted to scan the substrate by sensing light emitted by the first illuminating component and transmitted through the substrate, the first illuminating component and the first imaging component constructing a first detection channel; and a transport module, adapted to produce relative motion between the substrate, and the first illuminating component and the first imaging component.
摘要翻译：提供了一种用于检测基板缺陷的系统和方法。该系统包括：第一照明部件，设置在基板的一侧并适于向基板发射漫射光; 第一成像部件，设置在所述基板的另一侧，并且适于通过感测由所述第一照明部件发射并透射通过所述基板的所述基板扫描所述基板，所述第一照明部件和所述第一成像部件构成第一检测通道; 以及传输模块，其适于在所述基板与所述第一照明部件与所述第一成像部件之间产生相对运动。

4. 发明申请

US20120133762A1 METHOD AND SYSTEM FOR DETECTING AND CLASSIFYING A DEFECT OF A SUBSTRATE 审中-公开
标题翻译：检测和分类基板缺陷的方法和系统
公开(公告)号：US20120133762A1
公开(公告)日：2012-05-31
申请号：US13384909
申请日：2010-02-26
申请人： Jean-Philippe Schweitzer , Huifen Li , Xiaofeng Lin , Xiaofeng Guo , Feng Guo , Xiaowei Sun
发明人： Jean-Philippe Schweitzer , Huifen Li , Xiaofeng Lin , Xiaofeng Guo , Feng Guo , Xiaowei Sun
IPC分类号： H04N7/18
CPC分类号： G01N21/896 , G01N2021/8967
摘要： A method and system for detecting and classifying a defect of a substrate, the system including a first channel, including a first illuminating unit to irradiate a light to a substrate and a first imaging unit to take images by sensing a light from the substrate when it is irradiated; a second channel, including a second illuminating unit to irradiate a light to the substrate and a second imaging unit to take images by sensing a light from the substrate when it is irradiated; an image constructing module to construct two images of the substrate using the images of the first and second imaging units respectively; and an image processing module to detect, when the substrate has a defect, that the defect is a defect on or in the substrate, based on a relationship of positions where the defect of the substrate appears in the two images of the substrate.
摘要翻译：一种用于检测和分类衬底缺陷的方法和系统，所述系统包括第一通道，所述第一通道包括用于将光照射到衬底的第一照明单元和第一成像单元，以通过感测来自所述衬底的光来拍摄图像被照射第二通道，包括用于将光照射到所述基板的第二照明单元和第二成像单元，以在被照射时感测来自所述基板的光来拍摄图像; 图像构造模块，用于分别使用第一和第二成像单元的图像来构造基板的两个图像; 以及图像处理模块，用于基于衬底的缺陷在衬底的两个图像中出现缺陷的位置的关系来检测衬底有缺陷时缺陷是衬底上或衬底中的缺陷。

5. 发明授权

US07619749B2 Methods and apparatus of aligning surfaces 有权
标题翻译：对准表面的方法和装置
公开(公告)号：US07619749B2
公开(公告)日：2009-11-17
申请号：US11511361
申请日：2006-08-29
申请人： Chi-Fai Cheung , Huifen Li , Wing-Bun Lee , Suet To , Lingbao Kong
发明人： Chi-Fai Cheung , Huifen Li , Wing-Bun Lee , Suet To , Lingbao Kong
IPC分类号： G01B11/24 , G06T15/40 , G09G5/00 , G06F17/50 , G06F17/10
CPC分类号： G06T17/30
摘要： Ultra-precision freeform surfaces are important to the development of complex and micro-optical-electro-mechanical devices used in many photonics and telecommunication products such as F-theta lenses for laser printers. These surfaces are complex and large scale surface topologies with shapes that generally possesses no rotational symmetry. Due to the geometrical complexities of these ultra-precision freeform surfaces, it is difficult to characterize the form accuracy and surface quality of freeform optical surfaces. The method of this invention is based on feature-point pre-fixture, and iterative precision alignment algorithm, which can provide sufficient capability of form characterization for ultra-precision freeform surfaces with form accuracy down to below sub-micrometer range
摘要翻译：超精密自由曲面对于许多光子和电信产品（例如用于激光打印机的F-theta透镜）使用的复合和微光学机电装置的开发是重要的。这些表面是具有通常不具有旋转对称性的形状的复杂且大型表面拓扑。由于这些超精密自由曲面的几何复杂性，难以表征自由形状光学表面的形状精度和表面质量。本发明的方法是基于特征点预夹具和迭代精密对准算法，其可以提供足够的形式表征的能力，用于超精度自由曲面，形式精度低于亚微米范围

6. 发明申请

US20070195084A1 Methods and apparatus of aligning surfaces 有权
标题翻译：对准表面的方法和装置
公开(公告)号：US20070195084A1
公开(公告)日：2007-08-23
申请号：US11511361
申请日：2006-08-29
申请人： Chi-Fai Cheung , Huifen Li , Wing-Bun Lee , Suet To , Lingbao Kong
发明人： Chi-Fai Cheung , Huifen Li , Wing-Bun Lee , Suet To , Lingbao Kong
IPC分类号： G06T17/00
CPC分类号： G06T17/30
摘要： Ultra-precision freeform surfaces are important to the development of complex and micro-optical-electro-mechanical devices used in many photonics and telecommunication products such as F-theta lenses for laser printers. These surfaces are complex and large scale surface topologies with shapes that generally possesses no rotational symmetry. Due to the geometrical complexities of these ultra-precision freeform surfaces, it is difficult to characterize the form accuracy and surface quality of freeform optical surfaces. The method of this invention is based on feature-point pre-fixture, and iterative precision alignment algorithm, which can provide sufficient capability of form characterization for ultra-precision freeform surfaces with form accuracy down to below sub-micrometer range
摘要翻译：超精密自由曲面对于许多光子和电信产品（例如用于激光打印机的F-theta透镜）使用的复合和微光学机电装置的开发是重要的。这些表面是具有通常不具有旋转对称性的形状的复杂且大型表面拓扑。由于这些超精密自由曲面的几何复杂性，难以表征自由形状光学表面的形状精度和表面质量。本发明的方法是基于特征点预夹具和迭代精密对准算法，其可以提供足够的形式表征的能力，用于超精度自由曲面，形式精度低于亚微米范围

7. 发明授权

US08958063B2 Illumination system for detecting the defect in a transparent substrate and a detection system including the same 有权
标题翻译：用于检测透明基板中的缺陷的照明系统和包括其的检测系统
公开(公告)号：US08958063B2
公开(公告)日：2015-02-17
申请号：US14369384
申请日：2011-12-31
申请人： Xiaofeng Guo , Huifen Li , Xiaofeng Lin , Xiaowei Sun , Wenhua Deng
发明人： Xiaofeng Guo , Huifen Li , Xiaofeng Lin , Xiaowei Sun , Wenhua Deng
IPC分类号： G01N21/00 , G01N21/88 , G01N21/958 , F21K99/00 , F21Y103/00
CPC分类号： G01N21/8806 , F21K9/27 , F21Y2103/10 , F21Y2115/10 , G01N21/896 , G01N21/958 , G01N2021/8816 , G01N2201/0633 , G01N2201/105
摘要： An illumination device for providing near isotropic illumination, and particularly an illumination system for detecting the defect in a transparent substrate and a detection system including the same are presented. An illumination system includes: an illumination system for detecting the defect in a transparent substrate, including light source receptacle in bar shape; first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle.
摘要翻译：提供一种用于提供近似各向同性照明的照明装置，特别是用于检测透明基板中的缺陷的照明系统和包括该照明装置的检测系统。照明系统包括：用于检测透明基板中的缺陷的照明系统，包括条形光源容器; 第一点光源，每个发射各自的第一光，各个第一光基本上彼此平行，并且第一点光源沿着插座的纵向布置到第一线点光源; 以及第二点光源，每个发射各自的第二光，所述各个第二光基本上彼此平行，并且所述第二点光源沿着所述插座的纵向布置到第二线点光源。

8. 发明申请

US20140347657A1 ILLUMINATION SYSTEM FOR DETECTING THE DEFECT IN A TRANSPARENT SUBSTRATE AND A DETECTION SYSTEM INCLUDING THE SAME 有权
标题翻译：用于检测透明基板中的缺陷的照明系统和包括其的检测系统
公开(公告)号：US20140347657A1
公开(公告)日：2014-11-27
申请号：US14369384
申请日：2011-12-31
申请人： Xiaofeng Guo , Huifen Li , Xiaofeng Lin , Xiaowei Sun , Wenhua Deng
发明人： Xiaofeng Guo , Huifen Li , Xiaofeng Lin , Xiaowei Sun , Wenhua Deng
IPC分类号： G01N21/88 , F21K99/00 , G01N21/958
CPC分类号： G01N21/8806 , F21K9/27 , F21Y2103/10 , F21Y2115/10 , G01N21/896 , G01N21/958 , G01N2021/8816 , G01N2201/0633 , G01N2201/105
摘要： An illumination device for providing near isotropic illumination, and particularly an illumination system for detecting the defect in a transparent substrate and a detection system including the same are presented, An illumination system includes: an illumination system for detecting the defect in a transparent substrate, including light source receptacle in bar shape; first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle.
摘要翻译：一种用于提供近似各向同性照明的照明装置，特别是用于检测透明基板中的缺陷的照明系统和包括其的检测系统。一种照明系统，包括：用于检测透明基板中的缺陷的照明系统，包括光源插座为棒状; 第一点光源，每个发射各自的第一光，各个第一光基本上彼此平行，并且第一点光源沿着插座的纵向布置到第一线点光源; 以及第二点光源，每个发射各自的第二光，所述各个第二光基本上彼此平行，并且所述第二点光源沿着所述插座的纵向布置到第二线点光源。

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