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    • 8. 发明授权
    • Optical sensing system for detecting welds and defects in metal
    • 用于检测金属中的焊缝和缺陷的光学感测系统
    • US06563575B1
    • 2003-05-13
    • US09636482
    • 2000-08-10
    • Randall William NicholsKenneth Wayne Maydew
    • Randall William NicholsKenneth Wayne Maydew
    • G01N2186
    • G01N21/8806G01N2021/8816
    • An optical sensing system for detecting welds and defects in metal brightly illuminates a broad section of the metal and images a swath of the metal onto a multi-element detector array, generating voltage signals representing the reflectivity of the swath of the metal as it passes under the detector. A processor system detects areas of low reflectivity and indicates a defect. A slit mask placed in front of the detector array narrows the imaged swath to reduce false accepts. A color filter in front of the detector array reduces ambient light interference. The processor system incorporates an auto-calibration function to compare the current signal to an averaged reference signal.
    • 用于检测金属中的焊缝和缺陷的光学感测系统明亮地照射金属的宽部分并将金属条映像到多元件检测器阵列上,产生表示金属条在其通过时的反射率的电压信号 检测器。 处理器系统检测低反射率的区域并指示缺陷。 放置在检测器阵列前方的狭缝掩模使成像的条纹变窄,以减少错误接受。 检测器阵列前面的滤色片减少了环境光的干扰。 处理器系统包含自动校准功能,用于将当前信号与平均参考信号进行比较。
    • 9. 发明授权
    • Multiple beam scanner for an inspection system
    • 用于检查系统的多光束扫描仪
    • US06236454B1
    • 2001-05-22
    • US08990462
    • 1997-12-15
    • Gilad Almogy
    • Gilad Almogy
    • G01N2100
    • G01N21/8806G01N21/8903G01N21/9501G01N2021/8816
    • An inspection system using dark field imaging includes a multiple beam laser scanning unit and at least one multiple beam dark field imaging unit. The laser scanning unit generates multiple beams which illuminate multiple spots on a surface to be scanned. The imaging unit separately detects light scattered from the multiple spots. The spots are separated by a separation distance which ensures that scattered light from each associated spot are received only by its associated photodetector. Each imaging unit includes collection optics and multiple photodetectors, one per spot. The collection optics and photodetectors are mounted so as to separate the light scattered from the different scan lines. In one embodiment, this separation is provided by arranging the collection optics and photodetectors according to the principles of Scheimpflug imaging.
    • 使用暗场成像的检查系统包括多光束激光扫描单元和至少一个多光束暗场成像单元。 激光扫描单元产生照射要扫描的表面上的多个点的多个光束。 成像单元分别检测从多个点散射的光。 这些光斑被隔开一段间隔距离,确保来自每个相关光点的散射光仅由其相关联的光电检测器接收。 每个成像单元包括收集光学元件和多个光电检测器,每个点一个。 收集光学元件和光电检测器被安装成分离从不同扫描线散射的光。 在一个实施例中,通过根据Scheimpflug成像的原理布置收集光学元件和光电检测器来提供该分离。