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    • 5. 发明授权
    • Implementation of column redundancy for a flash memory with a high write parallelism
    • 实现具有高写入并行性的闪存的列冗余
    • US07551498B2
    • 2009-06-23
    • US11611452
    • 2006-12-15
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • G11C7/00
    • G11C29/82G11C29/806G11C29/846
    • A redundant memory array has r columns of redundant memory cells, r redundant senses, and a redundant column decoder. Redundant address registers store addresses of defective regular memory cells. Redundant latches are provided in n groups of r latches. Redundancy comparison logic compares addresses of defective regular memory cells with an external input address. If the comparison is true, what is provided is: a DISABLE_LOAD signal to disable the regular senses for one of the n groups of m columns, an ENABLE_LATCH signal to one of the n groups of m columns to disables corresponding regular senses, and one or r REDO signals to a respective one of the r redundant latches in one of the n groups that is disabled. The selected one of the redundant latches activates one of the r redundant senses to access a redundant column.
    • 冗余存储器阵列具有r列的冗余存储器单元,r冗余感测器和冗余列解码器。 冗余地址寄存器存储有缺陷的常规存储单元的地址。 在n组r个锁存器中提供冗余锁存器。 冗余比较逻辑将缺陷常规存储单元的地址与外部输入地址进行比较。 如果比较是真的,提供的是:DISABLE_LOAD信号,用于禁用n列m列中的一个的常规感测,将一个ENABLE_LATCH信号分配给m列的n组中的一组,以禁用相应的常规感官,以及其中之一 r REDO信号到禁用的n个组之一的r个冗余锁存器中的相应一个。 所选的一个冗余锁存器激活r个冗余感测之一以访问冗余列。
    • 6. 发明申请
    • IMPLEMENTATION OF COLUMN REDUNDANCY FOR A FLASH MEMORY WITH A HIGH WRITE PARALLELISM
    • 实现具有高写并发性的闪存存储器的冗余冗余
    • US20080144379A1
    • 2008-06-19
    • US11611452
    • 2006-12-15
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • G11C16/06
    • G11C29/82G11C29/806G11C29/846
    • A redundant memory array has r columns of redundant memory cells, r redundant senses, and a redundant column decoder. Redundant address registers store addresses of defective regular memory cells. Redundant latches are provided in n groups of r latches. Redundancy comparison logic compares addresses of defective regular memory cells with an external input address. If the comparison is true, what is provided is: a DISABLE_LOAD signal to disable the regular senses for one of the n groups of m columns, an ENABLE_LATCH signal to one of the n groups of m columns to disables corresponding regular senses, and one or r REDO signals to a respective one of the r redundant latches in one of the n groups that is disabled. The selected one of the redundant latches activates one of the r redundant senses to access a redundant column.
    • 冗余存储器阵列具有r列的冗余存储器单元,r冗余感测器和冗余列解码器。 冗余地址寄存器存储有缺陷的常规存储单元的地址。 在n组r个锁存器中提供冗余锁存器。 冗余比较逻辑将缺陷常规存储单元的地址与外部输入地址进行比较。 如果比较是真的,提供的是:DISABLE_LOAD信号,用于禁用n列m列中的一个的常规感测,将一个ENABLE_LATCH信号分配给m列的n组中的一组,以禁用相应的常规感官,以及其中之一 r REDO信号到禁用的n个组之一的r个冗余锁存器中的相应一个。 所选的一个冗余锁存器激活r个冗余感测之一以访问冗余列。