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    • 5. 发明授权
    • Method for producing electrically insulated coils
    • 电绝缘线圈的制造方法
    • US5733402A
    • 1998-03-31
    • US636768
    • 1996-04-19
    • Katsuo SugawaraTohru KoyamaSyoichi Maruyama
    • Katsuo SugawaraTohru KoyamaSyoichi Maruyama
    • H01B13/06H01F41/12H02K15/12B32B31/00
    • H01B13/065H01F41/127H02K15/12
    • In the production of electrically insulated coils which make up insulating layers, insulating material is wound around an electric conductor to form an insulating substrate, then impregnating varnish consisting of thermosetting resin is applied to the insulating substrate and hardened. In this electrically insulated coil production method, the impregnating varnish is made up of acid anhydride setting epoxy resin elements that include latent accelerators. These accelerators take more than 30 days to increase their initial viscosity by three times during storage at 25 degrees centigrade. After the insulating substrate is impregnated with the varnish, the substrate is heated at a temperature which will cause the impregnating varnish on the surface of the insulating substrate to lose its fluidity in under 30 minutes in order to preset the varnish. Next, the varnish is set at a heat at least 10 degrees centigrade lower than the presetting temperature and thereby, electrically insulated coils with high reliability are obtained.
    • 在构成绝缘层的电绝缘线圈的制造中,将绝缘材料缠绕在电导体上以形成绝缘基板,然后将由热固性树脂构成的浸渍清漆施加到绝缘基板上并硬化。 在这种电绝缘线圈制造方法中,浸渍清漆由包含潜在促进剂的酸酐固化环氧树脂元素组成。 这些加速器在25摄氏度储存期间需要30多天才能将其初始粘度提高3倍。 在绝缘基板浸渍清漆后,基板在使绝缘基板表面上的浸渍清漆在30分钟内失去其流动性的温度被加热,以便预设清漆。 接下来,将清漆设定在比预设温度低至少10摄氏度的热量,从而获得高可靠性的电绝缘线圈。
    • 10. 发明授权
    • Scanning photoinduced current analyzer capable of detecting photoinduced
current in nonbiased specimen
    • 扫描光电流分析仪能够检测非偏心样本中的光电流
    • US5708371A
    • 1998-01-13
    • US503567
    • 1995-07-18
    • Tohru Koyama
    • Tohru Koyama
    • G01N37/00G01N27/00G01R31/311H01J37/256H01L21/66G01R31/26
    • G01R31/311
    • A sample to be measured having a semiconductor integrated circuit having interconnection lines is set on a scanning photoinduced current analyzer with one end of the interconnection line connected to a ground and the other end connected through a current amplifier to the ground. When a laser beam falls on part having a comparatively low thermal conductivity, such as a part having a void, of the interconnection line while the interconnection line is scanned with the laser beam, temperature distribution in the interconnection line changes at the part. The change in temperature distribution produces spontaneous thermoelectromotive force by the Seebeck effect to induce a current. The current amplifier amplifies the induced current, and then an image date converter converts the amplified current into image information in synchronism with the scanning operation of the laser beam. Since the photoinduced current can be measured without supplying a bias current to the sample to be measured, a current image corresponding to the photoinduced current can be formed to determine the position of a void even if the sample to be measured has a high resistance.
    • 将具有互连线的半导体集成电路的待测样品设置在扫描光致电流分析仪上,其互连线的一端连接到地,而另一端通过电流放大器连接到地。 当激光束在互连线被激光束扫描的同时,当激光束落在部分具有较低导热率的部分(例如具有空隙的部分)上时,互连线中的温度分布在部分变化。 温度分布的变化通过塞贝克效应产生自发的热电动势,以引起电流。 电流放大器放大感应电流,然后图像日期转换器将放大的电流转换成与激光束的扫描操作同步的图像信息。 由于可以测量光诱导电流而不向待测样品提供偏置电流,所以可以形成对应于光诱导电流的当前图像,以便即使待测样品具有高电阻也可以确定空隙的位置。