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    • 1. 发明授权
    • Semiconductor memory with improved memory block switching
    • 半导体存储器具有改进的存储块切换
    • US08050109B2
    • 2011-11-01
    • US12538492
    • 2009-08-10
    • Thomas YanLuca FasoliRoy E Scheuerlein
    • Thomas YanLuca FasoliRoy E Scheuerlein
    • G11C7/10
    • G11C7/18G11C13/004G11C16/24G11C2029/0411G11C2213/71G11C2213/72
    • A non-volatile memory core comprises one or more memory bays. Each memory bay comprises one or more memory blocks that include a grouping of non-volatile storage elements. In one embodiment, memory blocks in a particular memory bay share a group of read/write circuits. During a memory operation, memory blocks are transitioned into active and inactive states. The process of transitioning blocks from an inactive state to an active state includes enabling charge sharing between a memory block entering the active state and another memory block that was previously in the active state. This charge sharing improves performance and/or reduces energy consumption for the memory system.
    • 非易失性存储器核心包括一个或多个存储器空间。 每个存储器托架包括一个或多个存储器块,其包括非易失性存储元件的分组。 在一个实施例中,特定存储器架中的存储器块共享一组读/写电路。 在存储器操作期间,存储器块被转换为活动状态和非活动状态。 将块从非活动状态转换到活动状态的过程包括使得进入活动状态的存储块与先前处于活动状态的另一个存储块之间的电荷共享成为可能。 这种电荷共享提高了存储器系统的性能和/或降低了能量消耗。
    • 4. 发明授权
    • Semiconductor memory with improved block switching
    • 半导体存储器具有改进的块切换
    • US08320196B2
    • 2012-11-27
    • US13233602
    • 2011-09-15
    • Thomas YanLuca FasoliRoy E Scheuerlein
    • Thomas YanLuca FasoliRoy E Scheuerlein
    • G11C7/10
    • G11C7/18G11C13/004G11C16/24G11C2029/0411G11C2213/71G11C2213/72
    • A non-volatile memory core comprises one or more memory bays. Each memory bay comprises one or more memory blocks that include a grouping of non-volatile storage elements. In one embodiment, memory blocks in a particular memory bay share a group of read/write circuits. During a memory operation, memory blocks are transitioned into active and inactive states. The process of transitioning blocks from an inactive state to an active state includes enabling charge sharing between a memory block entering the active state and another memory block that was previously in the active state. This charge sharing improves performance and/or reduces energy consumption for the memory system.
    • 非易失性存储器核心包括一个或多个存储器空间。 每个存储器托架包括一个或多个存储器块,其包括非易失性存储元件的分组。 在一个实施例中,特定存储器架中的存储器块共享一组读/写电路。 在存储器操作期间,存储器块被转换为活动状态和非活动状态。 将块从非活动状态转换到活动状态的过程包括使得进入活动状态的存储块与先前处于活动状态的另一存储块之间的电荷共享成为可能。 这种电荷共享提高了存储器系统的性能和/或降低了能量消耗。
    • 8. 发明申请
    • Rewritable Memory Device with Multi-Level, Write-Once Memory Cells
    • 具有多级,一次写入存储单元的可重写存储器件
    • US20110149631A1
    • 2011-06-23
    • US12643561
    • 2009-12-21
    • Roy E. ScheuerleinLuca Fasoli
    • Roy E. ScheuerleinLuca Fasoli
    • G11C17/00G11C7/00
    • G11C11/5692G11C16/349G11C17/16G11C2211/5641G11C2211/5646
    • The embodiments described herein are directed to a memory device with multi-level, write-once memory cells. In one embodiment, a memory device has a memory array comprising a plurality of multi-level write-once memory cells, wherein each memory cell is programmable to one of a plurality of resistivity levels. The memory device also contains circuitry configured to select a group of memory cells from the memory array, and read a set of flag bits associated with the group of memory cells. The set of flag bits indicate a number of times the group of memory cells has been written to. The circuitry is also configured to select a threshold read level appropriate for the number of times the group of memory cells has been written to, and for each memory cell in the group, read the memory cell as an unprogrammed single-bit memory cell or as a programmed single-bit memory cell based on the selected threshold read level.
    • 这里描述的实施例涉及具有多级,一次写入存储器单元的存储器件。 在一个实施例中,存储器装置具有包括多个多级一次写入存储器单元的存储器阵列,其中每个存储器单元可编程为多个电阻率水平中的一个。 存储器件还包含被配置为从存储器阵列中选择一组存储器单元的电路,并且读取与该组存储器单元相关联的一组标志位。 该组标志位指示存储器单元组被写入的次数。 电路还被配置为选择适合于已经写入存储器单元组的次数的阈值读取电平,并且对于组中的每个存储器单元,读取作为未编程的单位存储器单元的存储器单元或者作为 基于所选择的阈值读取电平的编程的单位存储器单元。
    • 10. 发明授权
    • Multiple twin cell non-volatile memory array and logic block structure and method therefor
    • 多个单元非易失性存储器阵列及其逻辑块结构及其方法
    • US07177183B2
    • 2007-02-13
    • US10675212
    • 2003-09-30
    • Roy E. ScheuerleinLuca FasoliMark G. Johnson
    • Roy E. ScheuerleinLuca FasoliMark G. Johnson
    • G11C16/04
    • G11C15/046G11C8/10G11C8/14G11C16/10G11C16/16
    • Extremely dense memory cell structures provide for new array structures useful for implementing memory and logic functions. An exemplary non-volatile memory array includes a first plurality of X-lines configured to be logically identical in a read mode of operation, and each associated with a first Y-line group numbering at least one Y-line. Each of the first plurality of X-lines may also be associated with a second Y-line group numbering at least one Y-line. In some embodiments, the first and second Y-Line groups are simultaneously selectable in a read mode and, when so selected, are respectively coupled to true and complement inputs of a sense amplifier circuit. Such Y-line groups may number only one Y-line, or may number more than one Y-line. Many types of memory cells may be used, such as various passive element cells and EEPROM cells, in both 2D or 3D memory arrays. Such arrays may be configured as a memory to store data, or configured to perform threshold logic, or configured as a content addressable memory array.
    • 非常密集的存储单元结构提供了用于实现内存和逻辑功能的新数组结构。 示例性非易失性存储器阵列包括被配置为在读取操作模式下在逻辑上相同的第一多个X线,并且每个X线与与至少一个Y线编号的第一Y线组相关联。 第一多个X线中的每一个也可以与编号至少一个Y线的第二Y线组相关联。 在一些实施例中,第一和第二Y线组可以以读取模式同时选择,并且当这样选择时,它们分别耦合到读出放大器电路的真实和补码输入。 这样的Y线组可以仅编号一条Y线,或者可以编号多于一条Y线。 可以在2D或3D存储器阵列中使用许多类型的存储单元,例如各种无源元件单元和EEPROM单元。 这样的阵列可以被配置为存储数据,或被配置为执行阈值逻辑或被配置为内容可寻址存储器阵列的存储器。