会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • VACUUM PROCESSING APPARATUS
    • 真空加工设备
    • US20120014768A1
    • 2012-01-19
    • US13181011
    • 2011-07-12
    • Tetsuya MIYASHITAMasamichi HaraYasushi MizusawaToshiharu Hirata
    • Tetsuya MIYASHITAMasamichi HaraYasushi MizusawaToshiharu Hirata
    • H01L21/677
    • H01L21/67173H01L21/67736
    • In a vacuum processing apparatus, a process station includes processing regions arranged in a row at intervals to perform vacuum processing on substrates, the substrates being sequentially transferred between the processing regions from upstream to downstream; a first transport unit for transferring the substrates in a first preliminary vacuum chamber to the processing region at an upstream end; a second transport unit arranged between the adjacent processing regions; and a third transport unit for transferring the substrates from the processing region at a downstream end to a second preliminary vacuum chamber. The control unit outputs a control signal such that in the transfer operations in which the substrates are respectively transferred to the subsequent downstream processing regions from the first preliminary vacuum chamber to the processing region at the downstream end, time periods of at least two transfer operations partially or totally overlap with each other.
    • 在真空处理装置中,处理站包括间隔地配置成一行的处理区域,对基板进行真空处理,基板从上游到下游依次转印在处理区域之间; 用于将第一预备真空室中的基板转移到上游端的处理区域的第一输送单元; 布置在相邻处理区域之间的第二传送单元; 以及用于将基板从下游端的处理区域转移到第二预备真空室的第三输送单元。 控制单元输出控制信号,使得在将基板分别从第一预备真空室向下游端的处理区转移到后续的下游处理区域的转印操作中,至少两个转印操作的时间段部分地 或完全重叠。
    • 3. 发明授权
    • Integrated substrate processing in a vacuum processing tool
    • 在真空加工工具中集成基板加工
    • US08034406B2
    • 2011-10-11
    • US11526767
    • 2006-09-26
    • Tadahiro IshizakaMasamichi HaraYasushi Mizusawa
    • Tadahiro IshizakaMasamichi HaraYasushi Mizusawa
    • C23C16/00C23C14/00
    • C23C16/54C23C14/566
    • A method and system are provided for integrated substrate processing in Cu metallization. The method includes providing a substrate in a vacuum processing tool containing a plurality of processing systems configured to process the substrate and a substrate transfer system configured to transfer the substrate under vacuum conditions between the plurality of processing systems, and performing an integrated deposition process on the substrate. The plurality of processing systems and the substrate transfer system maintain a base pressure of background gases at 6.8×10−8 Ton or lower, preferably 5×10−8 Torr or lower, during the integrated deposition process. According to one embodiment, the integrated process includes depositing a barrier metal layer on the substrate, and depositing a Cu layer on the barrier metal layer. According to another embodiment, the integrated process further includes depositing a Ru layer on the barrier metal layer, and depositing a Cu layer on the Ru layer.
    • 提供了用于Cu金属化中的集成基板处理的方法和系统。 该方法包括在真空处理工具中提供衬底,该真空处理工具包含配置成处理衬底的多个处理系统和被配置为在多个处理系统之间的真空条件下传送衬底的衬底传送系统,以及对 基质。 在整个沉积过程中,多个处理系统和基板传送系统将背景气体的基础压力保持在6.8×10-8吨或更低,优选5×10-8托或更低。 根据一个实施例,集成工艺包括在衬底上沉积阻挡金属层,以及在阻挡金属层上沉积Cu层。 根据另一实施例,集成工艺还包括在阻挡金属层上沉积Ru层,以及在Ru层上沉积Cu层。
    • 10. 发明授权
    • Method of integrating PEALD Ta-containing films into Cu metallization
    • 将含有PEALD的含Ta的膜整合到Cu金属化中的方法
    • US07959985B2
    • 2011-06-14
    • US11378263
    • 2006-03-20
    • Tadahiro IshizakaTsukasa MatsudaMasamichi HaraJacques FaguetYasushi Mizusawa
    • Tadahiro IshizakaTsukasa MatsudaMasamichi HaraJacques FaguetYasushi Mizusawa
    • C23C16/00H05H1/00
    • C23C16/45542C23C16/32C23C16/36C23C16/509C23C16/56
    • A method for forming a modified TaC or TaCN film that may be utilized as a barrier film for Cu metallization. The method includes disposing a substrate in a process chamber of a plasma enhanced atomic layer deposition (PEALD) system configured to perform a PEALD process, depositing a TaC or TaCN film on the substrate using the PEALD process, and modifying the deposited TaC or TaCN film by exposing the deposited TaC or TaCN film to plasma excited hydrogen or atomic hydrogen or a combination thereof in order to remove carbon from at least the plasma exposed portion of the deposited TaCN film. The method further includes forming a metal film on the modified TaCN film, where the modified TaCN film provides stronger adhesion to the metal film than the deposited TaCN film. According to one embodiment, a TaCN film is deposited from alternating exposures of TAIMATA and plasma excited hydrogen.
    • 用于形成可用作Cu金属化阻挡膜的改性TaC或TaCN膜的方法。 该方法包括将基板设置在等离子体增强原子层沉积(PEALD)系统的处理室中,其被配置为执行PEALD工艺,使用PEALD工艺在基板上沉积TaC或TaCN膜,以及修改沉积的TaC或TaCN膜 通过将沉积的TaC或TaCN膜暴露于等离子体激发的氢或原子氢或其组合,以便从至少沉积的TaCN膜的等离子体暴露部分除去碳。 该方法还包括在改性的TaCN膜上形成金属膜,其中改性的TaCN膜比沉积的TaCN膜提供比金属膜更强的附着力。 根据一个实施方案,通过TAIMATA和等离子体激发氢的交替曝光沉积TaCN膜。