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    • 5. 发明授权
    • Signal quality measurement device, spectrum measurement circuit, and program
    • 信号质量测量装置,频谱测量电路和程序
    • US08355884B2
    • 2013-01-15
    • US12522243
    • 2007-12-18
    • Koichi NoseMasayuki Mizuno
    • Koichi NoseMasayuki Mizuno
    • G01R23/16
    • H04B17/318G01R23/16H04B17/15
    • Spectrum measurement circuit (101) includes: N-(where N is integer equal or greater than 2) phase clock generation circuit (304) for supplying phase-modulated signals in which the phase of a clock signal is shifted by a phase modulation amount each time the settings of the phase modulation amount are switched; mixer circuit (303) for taking the product of a measured signal supplied from a transmitter and the phase-modulated signals supplied from N-phase clock generation circuit (304); average value output circuit (305) for supplying an average voltage value of the output signal of mixer circuit (303); memory (307) for storing the average voltage value supplied from average value output circuit (305) for each phase modulation amount of N-phase clock generation circuit (304); and arithmetic unit (308) for using the average voltage value for each phase modulation amount of N-phase clock generation circuit (304) to calculate the signal strength of the measured signal.
    • 频谱测量电路(101)包括:N个(其中N是等于或大于2的整数)相位时钟产生电路(304),用于提供相位调制信号,其中时钟信号的相位每相位调制量偏移 时间相位调制量的设置被切换; 用于获取从发射机提供的测量信号的乘积和从N相时钟产生电路(304)提供的相位调制信号的混频器电路(303); 平均值输出电路(305),用于提供混频电路(303)的输出信号的平均电压值; 存储器(307),用于存储从N相时钟发生电路(304)的每个相位调制量的平均值输出电路(305)提供的平均电压值; 和运算单元(308),用于使用N相时钟产生电路(304)的每个相位调制量的平均电压值来计算测量信号的信号强度。
    • 7. 发明授权
    • Signal measuring device
    • 信号测量装置
    • US08019560B2
    • 2011-09-13
    • US12088352
    • 2006-09-28
    • Koichi NoseMasayuki Mizuno
    • Koichi NoseMasayuki Mizuno
    • G01R15/00
    • G01R31/31708
    • Small-scale measuring circuits (111-1qum) are arranged in m columns×q rows. The small-scale measuring circuits of each row (111-11m, 121-12m, 1q1-1qm) are connected in series. The respective rows are connected in parallel. Supplying reference signals B having different parameter values to the small-scale measuring circuits (111-11m, . . . ) connected in series makes it possible to improve the measurement range or measurement resolution. Supplying reference signals B having the same parameter to the respective rows can reduce a noise component depending on the transistor size. According to this invention, using a plurality of small-scale measuring circuits in accordance with required measurement performance concerning a measurement range, resolution, noise reduction, or the like can implement the desired performance while minimizing the area of each measuring circuit.
    • 小尺度测量电路(111-1qum)以m列×q行排列。 每行的小尺度测量电路(111-11m,121-12m,1q1-1qm)串联连接。 相应的行并联连接。 将具有不同参数值的参考信号B提供给串联连接的小尺度测量电路(111-11m ...)可以提高测量范围或测量分辨率。 向相应行提供具有相同参数的参考信号B可以根据晶体管尺寸减小噪声分量。 根据本发明,根据关于测量范围,分辨率,降噪等的所需测量性能来使用多个小规模测量电路可以在最小化每个测量电路的面积的同时实现期望的性能。
    • 9. 发明授权
    • Signal measuring device
    • 信号测量装置
    • US08004268B2
    • 2011-08-23
    • US12088411
    • 2006-09-28
    • Koichi NoseMasayuki Mizuno
    • Koichi NoseMasayuki Mizuno
    • G01R25/00G01R19/00
    • G01R19/2509
    • An interpolated signal generating circuit (101) generates interpolated signals (SIG1-SIGN) of two consecutive discrete signals (SIG). N measuring circuits (501) measure interpolated signals. Since the interpolated signals are measurement targets, N-times oversampling measurement can also be performed for the discrete signals. With the oversampling measurement, the frequency spectra of the signal components of the discrete signals are maintained, and only the frequency spectrum of a noise component due to a quantization error increases to a high-frequency band, thereby reducing a noise component per unit frequency. Therefore, removing a high-frequency component from a measurement result from each measuring circuit using a low-pass filter (502) makes it possible to improve the signal-to-noise ratio of the measurement result as compared with a case in which no oversampling is performed.
    • 内插信号生成电路(101)产生两个连续离散信号(SIG)的内插信号(SIG1-SIGN)。 N个测量电路(501)测量内插信号。 由于内插信号是测量目标,所以也可以对离散信号执行N次过采样测量。 通过过采样测量,维持离散信号的信号分量的频谱,并且只有由于量化误差引起的噪声分量的频谱增加到高频带,从而降低每单位频率的噪声分量。 因此,使用低通滤波器(502)从每个测量电路的测量结果中去除高频分量使得与没有过采样的情况相比,可以提高测量结果的信噪比 被执行。