会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • Aging diagnostic device, aging diagnostic method
    • 老化诊断仪,老化诊断方法
    • US08674774B2
    • 2014-03-18
    • US13394542
    • 2010-09-01
    • Eisuke SaneyoshiKoichi NoseMasayuki Mizuno
    • Eisuke SaneyoshiKoichi NoseMasayuki Mizuno
    • H03L7/24G01R31/28
    • G01R31/2856G01R31/2882G01R31/2884H03K5/133
    • There is provided an aging diagnostic device including: a reference ring oscillator (101) that constitutes a ring oscillator using an odd-numbered plurality of logic gates constituted using a CMOS circuit; a test ring oscillator (102) that constitutes a ring oscillator using an odd-numbered plurality of logic gates having the same configuration as that of the logic gate; a load unit (104) that inputs a load signal to the test ring oscillator (102); a control unit (105) that simultaneously inputs a control signal instructing a start of oscillation of the reference ring oscillator (101) and the test ring oscillator (102) to the reference ring oscillator (101) and the test ring oscillator (102); and a comparison unit (103) that compares differences in the amount of movement of pulses within the reference ring oscillator (101) and the test ring oscillator (102), respectively, in the same time.
    • 提供了一种老化诊断装置,包括:构成使用CMOS电路构成的奇数多个逻辑门的环形振荡器的参考环形振荡器(101) 使用具有与逻辑门相同配置的奇数多个逻辑门构成环形振荡器的测试环振荡器(102); 负载单元(104),其向所述测试环形振荡器(102)输入负载信号; 控制单元(105),其同时将参考环形振荡器(101)和测试环形振荡器(102)的振荡开始的控制信号输入到参考环形振荡器(101)和测试环形振荡器(102); 以及比较单元(103),其分别同时比较参考环形振荡器(101)和测试环形振荡器(102)中的脉冲的移动量的差异。
    • 5. 发明申请
    • AGING DIAGNOSTIC DEVICE, AGING DIAGNOSTIC METHOD
    • 老化诊断装置,老化诊断方法
    • US20120161885A1
    • 2012-06-28
    • US13394542
    • 2010-09-01
    • Eisuke SaneyoshiKoichi NoseMasayuki Mizuno
    • Eisuke SaneyoshiKoichi NoseMasayuki Mizuno
    • H03L7/24
    • G01R31/2856G01R31/2882G01R31/2884H03K5/133
    • There is provided an aging diagnostic device including: a reference ring oscillator (101) that constitutes a ring oscillator using an odd-numbered plurality of logic gates constituted using a CMOS circuit; a test ring oscillator (102) that constitutes a ring oscillator using an odd-numbered plurality of logic gates having the same configuration as that of the logic gate; a load unit (104) that inputs a load signal to the test ring oscillator (102); a control unit (105) that simultaneously inputs a control signal instructing a start of oscillation of the reference ring oscillator (101) and the test ring oscillator (102) to the reference ring oscillator (101) and the test ring oscillator (102); and a comparison unit (103) that compares differences in the amount of movement of pulses within the reference ring oscillator (101) and the test ring oscillator (102), respectively, in the same time.
    • 提供了一种老化诊断装置,包括:构成使用CMOS电路构成的奇数多个逻辑门的环形振荡器的参考环形振荡器(101) 使用具有与逻辑门相同配置的奇数多个逻辑门构成环形振荡器的测试环振荡器(102); 负载单元(104),其向所述测试环形振荡器(102)输入负载信号; 控制单元(105),其同时将参考环形振荡器(101)和测试环形振荡器(102)的振荡开始的控制信号输入到参考环形振荡器(101)和测试环形振荡器(102); 以及比较单元(103),其分别同时比较参考环形振荡器(101)和测试环形振荡器(102)中的脉冲的移动量的差异。
    • 6. 发明申请
    • AMPLIFYING APPARATUS, METHOD OF OUTPUT CONTROL AND CONTROL PROGRAM
    • 放大装置,输出控制方法和控制程序
    • US20100052792A1
    • 2010-03-04
    • US12440977
    • 2007-09-13
    • Koichi NoseHaruya IshizakiMasayuki Mizuno
    • Koichi NoseHaruya IshizakiMasayuki Mizuno
    • H03F3/68
    • H03K4/026H03F1/0294H03F1/32H03F3/2171H03F3/2178H03F3/245H03F3/72H03F2200/384H03K4/92
    • [PROBLEMS] To provide, for example, a pulse input type power amplifying apparatus that can be operated at low voltage and low power, effectively suppressing generation of harmonic component.[MEANS FOR SOLVING THE PROBLEMS] The amplifying apparatus includes at least two amplification circuits, one and other amplification circuits, composed of multiple amplifiers whose output sides are connected to each other, driven at the same frequency. The multiple amplifiers forming the one amplification circuit are configured with a first inverting amplifier M12 inputting and amplifying a reference pulse, and a second inverting amplifier M11 to which an inverted pulse formed by shifting and inverting the phase of the reference pulse is inputted. The other amplification circuit is configured with the first inverting amplifier M14 and the second inverting amplifier M13 to each of which other wide pulse with a width greater than that of the reference pulse is commonly inputted.
    • [问题]为了提供例如能够以低电压和低功率工作的脉冲输入型功率放大装置,能有效地抑制谐波分量的产生。 解决问题的手段放大装置包括至少两个放大电路,一个和另外的放大电路,由输出侧相互连接并以相同频率驱动的多个放大器组成。 形成一个放大电路的多个放大器配置有输入和放大参考脉冲的第一反相放大器M12和输入通过移位和反相参考脉冲的相位形成的反相脉冲的第二反相放大器M11。 另一个放大电路配置有第一反相放大器M14和第二反相放大器M13,其中通常输入宽度大于参考脉冲宽度的其它宽脉冲。
    • 7. 发明申请
    • SIGNAL MEASURING DEVICE
    • 信号测量装置
    • US20090189596A1
    • 2009-07-30
    • US12088411
    • 2006-09-28
    • Koichi NoseMasayuki Mizuno
    • Koichi NoseMasayuki Mizuno
    • G01R25/00
    • G01R19/2509
    • An interpolated signal generating circuit (101) generates interpolated signals (SIG1-SIGN) of two consecutive discrete signals (SIG). N measuring circuits (501) measure interpolated signals. Since the interpolated signals are measurement targets, N-times oversampling measurement can also be performed for the discrete signals. With the oversampling measurement, the frequency spectra of the signal components of the discrete signals are maintained, and only the frequency spectrum of a noise component due to a quantization error increases to a high-frequency band, thereby reducing a noise component per unit frequency. Therefore, removing a high-frequency component from a measurement result from each measuring circuit using a low-pass filter (502) makes it possible to improve the signal-to-noise ratio of the measurement result as compared with a case in which no oversampling is performed.
    • 内插信号生成电路(101)产生两个连续离散信号(SIG)的内插信号(SIG1-SIGN)。 N个测量电路(501)测量内插信号。 由于内插信号是测量目标,所以也可以对离散信号执行N次过采样测量。 通过过采样测量,维持离散信号的信号分量的频谱,并且只有由于量化误差引起的噪声分量的频谱增加到高频带,从而降低每单位频率的噪声分量。 因此,使用低通滤波器(502)从每个测量电路的测量结果中去除高频分量使得与没有过采样的情况相比,可以提高测量结果的信噪比 被执行。
    • 10. 发明授权
    • Signal quality measurement device, spectrum measurement circuit, and program
    • 信号质量测量装置,频谱测量电路和程序
    • US08355884B2
    • 2013-01-15
    • US12522243
    • 2007-12-18
    • Koichi NoseMasayuki Mizuno
    • Koichi NoseMasayuki Mizuno
    • G01R23/16
    • H04B17/318G01R23/16H04B17/15
    • Spectrum measurement circuit (101) includes: N-(where N is integer equal or greater than 2) phase clock generation circuit (304) for supplying phase-modulated signals in which the phase of a clock signal is shifted by a phase modulation amount each time the settings of the phase modulation amount are switched; mixer circuit (303) for taking the product of a measured signal supplied from a transmitter and the phase-modulated signals supplied from N-phase clock generation circuit (304); average value output circuit (305) for supplying an average voltage value of the output signal of mixer circuit (303); memory (307) for storing the average voltage value supplied from average value output circuit (305) for each phase modulation amount of N-phase clock generation circuit (304); and arithmetic unit (308) for using the average voltage value for each phase modulation amount of N-phase clock generation circuit (304) to calculate the signal strength of the measured signal.
    • 频谱测量电路(101)包括:N个(其中N是等于或大于2的整数)相位时钟产生电路(304),用于提供相位调制信号,其中时钟信号的相位每相位调制量偏移 时间相位调制量的设置被切换; 用于获取从发射机提供的测量信号的乘积和从N相时钟产生电路(304)提供的相位调制信号的混频器电路(303); 平均值输出电路(305),用于提供混频电路(303)的输出信号的平均电压值; 存储器(307),用于存储从N相时钟发生电路(304)的每个相位调制量的平均值输出电路(305)提供的平均电压值; 和运算单元(308),用于使用N相时钟产生电路(304)的每个相位调制量的平均电压值来计算测量信号的信号强度。