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    • 7. 发明授权
    • Thickness measuring apparatus, substrate processing method, and substrate processing apparatus
    • 厚度测量装置,基板处理方法和基板处理装置
    • US06331890B1
    • 2001-12-18
    • US09474126
    • 1999-12-29
    • Yoshinori MarumoTeruyuki Hayashi
    • Yoshinori MarumoTeruyuki Hayashi
    • G01J400
    • G01B11/0683
    • A film thickness measuring apparatus is provided with a housing which is made up of a base plate and outer cases, and which substantially shuts off the internal region thereof from the outside air, an introduction stage on which a cassette C is mounted, the cassette containing a plurality of substrates which have thin films formed thereon, a measurement stage which is arranged inside the housing and on which the substrate is placed for measuring the film thickness of the thin film, and a conveyance mechanism, arranged inside the housing, for moving the substrates between the inside of the cassette and the measurement stage. A film thickness measuring mechanism is arranged inside the housing. The film thickness measuring mechanism comprises a light emitting mechanism and a detector. The light emitting mechanism includes a laser light source for emitting a laser beam to the thin film on a wafer placed on the measurement stage. The detector detects light reflected from the thin film. On the basis of the information detected by the detector, the film thickness measuring mechanism measures the thickness of the thin film in a non-contact manner. A filter unit is arranged in the housing and located above the measurement stage. Through this filter unit, pure air free of gaseous organic matter is supplied and guided to the region above the measurement stage.
    • 薄膜厚度测量装置设置有由基板和外壳组成的壳体,其基本上从外部空气中切断其内部区域,安装盒C的导入台,所述盒体包含 在其上形成有薄膜的多个基板,布置在壳体内部并且放置基板以测量薄膜的膜厚度的测量台,以及布置在壳体内部的用于移动 盒子内部和测量台之间的衬底。 膜厚测量机构设置在壳体内。 膜厚测量机构包括发光机构和检测器。 发光机构包括用于在放置在测量台上的晶片上向激光束发射激光的激光光源。 检测器检测从薄膜反射的光。 基于由检测器检测到的信息,膜厚测量机构以非接触的方式测量薄膜的厚度。 过滤器单元布置在壳体中并位于测量台的上方。 通过该过滤器单元,将不含气态有机物的纯空气供给并引导到测量台上方的区域。
    • 8. 发明申请
    • Manufacturing method of glass substrate for magnetic disk, and manufacturing method of magnetic disk
    • 磁盘用玻璃基板的制造方法以及磁盘的制造方法
    • US20060070980A1
    • 2006-04-06
    • US11237868
    • 2005-09-29
    • Yoshinori MarumoIntanon Sitalaphruek
    • Yoshinori MarumoIntanon Sitalaphruek
    • C03C15/00
    • C03C23/0075C03C15/00C03C15/02C03C19/00G11B5/7315G11B5/8404
    • A method for manufacturing a glass substrate for a magnetic disk comprises mirror surface polishing and cleaning of a glass substrate, wherein polishing agent of which the principal component is rare-earth oxide with content of fluorine 5% by weight or less, is supplied to the glass substrate, the surface of the glass substrate is subjected to mirror surface polishing by relatively moving the polishing cloth and the glass substrate, then this glass substrate is brought into contact with a cleaning solution including ascorbic acid, fluorine ion, and sulfuric acid of 3% by weight or more, and the polishing agent is dissolved and removed. The concentration of the ascorbic acid included in the cleaning solution is 0.1% by weight or more, and the content of the fluorine ion is 1 ppm to 40 ppm. At least a magnetic layer is formed on the obtained glass substrate to manufacture a magnetic disk.
    • 一种用于制造磁盘用玻璃基板的方法,其特征在于,对所述玻璃基板进行镜面研磨和清洗,将主成分为含氟量为5重量%以下的稀土类氧化物的研磨剂供给到 玻璃基板,通过相对移动抛光布和玻璃基板对玻璃基板的表面进行镜面抛光,然后使该玻璃基板与包含抗坏血酸,氟离子和硫酸的清洗溶液接触3 重量%以上,并且研磨剂溶解并除去。 清洗液中含有的抗坏血酸的浓度为0.1重量%以上,氟离子的含量为1〜40ppm。 在获得的玻璃基板上形成至少一层磁性层以制造磁盘。