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    • 7. 发明授权
    • Plasma processing apparatus and method
    • 等离子体处理装置及方法
    • US06423383B1
    • 2002-07-23
    • US09196141
    • 1998-11-20
    • Naoki HiroseTakashi InujimaToru Takayama
    • Naoki HiroseTakashi InujimaToru Takayama
    • H05H124
    • H01J37/32192C23C16/511H01J37/32623H01J37/32678Y10S427/104
    • A plasma processing apparatus and method is equipped with a reaction chamber, a microwave generator for generating a microwave within the reaction chamber, and main and auxiliary magnets for producing a magnetic filed parallel with microwave propagation direction. The auxiliary magnet is located along the wall of the reaction chamber so as to strengthen the magnetic filed at the periphery of the reaction chamber. A reactive gas containing a carbon compound gas is introduced into the chamber wherein the reactive gas is converted into a plasma by a resonance using the microwaves and the magnetic field. The presence of the auxiliary magnet produces a centrifugal drifting force within the reaction chamber, thereby confining the plasma gas to the center of the chamber. A substrate is then placed within the chamber and a film comprising amorphous carbon is deposited thereon.
    • 等离子体处理装置和方法配备有反应室,用于在反应室内产生微波的微波发生器,以及用于产生与微波传播方向平行的磁场的主磁辅助磁铁。 辅助磁体位于反应室的壁上,以加强反应室周围的磁场。 将含有碳化合物气体的反应性气体引入室中,其中通过使用微波和磁场的共振将反应气体转化为等离子体。 辅助磁体的存在在反应室内产生离心漂移力,从而将等离子体气体限制在室的中心。 然后将衬底放置在室内,并且其上沉积包含无定形碳的膜。
    • 10. 发明授权
    • Microwave plasma etching and deposition method employing first and
second magnetic fields
    • 采用第一和第二磁场的微波等离子体蚀刻和沉积方法
    • US5203959A
    • 1993-04-20
    • US766283
    • 1991-09-27
    • Naoki HiroseTakashi InujimaToru Takayama
    • Naoki HiroseTakashi InujimaToru Takayama
    • C23C16/511H01J37/32
    • H01J37/32192C23C16/511H01J37/32623H01J37/32678
    • A plasma processing apparatus and method is equipped with a vacuum chamber, helmoltz coils, Ioffe bars, a microwave generator and gas feeding systems. An auxiliary magnet is further provided in order to strengthen the magnetic field in the vacuum chamber to produce centrifugal drifting force which confine the plasma gas about the center position of the vacuum chamber. Specifically, the method includes establishing a first magnetic field in the vacuum chamber substantially parallel to the direction of propagation of microwaves emitted in the chamber and establishing a second magnetic field substantially perpendicular to the first magnetic field. A substrate in the chamber for plasma processing is placed so that a surface of the substrate is substantially perpendicular to the direction of the first magnetic field and parallel to the direction of the second.
    • 等离子体处理装置和方法配备有真空室,赫尔兹兹线圈,Ioffe棒,微波发生器和气体供给系统。 进一步提供辅助磁体以加强真空室中的磁场,以产生围绕真空室的中心位置限制等离子体气体的离心漂移力。 具体地,该方法包括在真空室中建立基本上平行于在室中发射的微波的传播方向的第一磁场,并建立基本上垂直于第一磁场的第二磁场。 放置用于等离子体处理的室中的衬底,使得衬底的表面基本上垂直于第一磁场的方向并且平行于第二磁场的方向。