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    • 2. 发明申请
    • QUANTIFICATION METHOD OF FUNCTIONAL GROUPS OF ORGANIC LAYER
    • 有机层功能组数量化方法
    • US20110163228A1
    • 2011-07-07
    • US13063616
    • 2009-09-24
    • Tae Geol LeeDae Won MoonHyegeun Min
    • Tae Geol LeeDae Won MoonHyegeun Min
    • H01J49/40G01N23/225
    • G01N23/2255
    • A quantification method of functional groups in an organic thin layer includes: a) measuring an absolute quantity per unit area of an analysis reference material having functional groups included in a reference organic thin layer by means of MEIS spectroscopy; b) carrying out spectrometry for the same reference organic thin layer as in a) and thereby obtaining peak intensities of the functional groups in the reference organic thin layer; c) carrying out the same spectrometry as in b) for an organic thin layer to be analyzed having the same functional groups and thereby measuring peak intensities of the functional groups with unknown quantity; and d) comparing the peak intensities of the functional groups measured in b) with respect to the absolute quantity of the analysis reference material in a) and thereby determining the absolute quantity per unit area of the functional groups with unknown quantity measured in c).
    • 有机薄层中的官能团的定量方法包括:a)通过MEIS光谱测量具有包括在参考有机薄层中的官能团的分析参考材料的每单位面积的绝对量; b)进行与a)相同的参考有机薄层的光谱测定,从而获得参考有机薄层中的官能团的峰值强度; c)进行与b)相同的光谱测定,对于具有相同官能团的待分析有机薄层,从而测量具有未知量的官能团的峰强度; 和d)比较a)中测定的官能团的峰强度相对于分析参考物质的绝对量,从而确定在c)中测量的具有未知量的官能团的每单位面积的绝对量。
    • 7. 发明授权
    • Quantification method of functional groups of organic layer
    • 有机层官能团的定量方法
    • US08450684B2
    • 2013-05-28
    • US13063616
    • 2009-09-24
    • Tae Geol LeeDae Won MoonHyegeun Min
    • Tae Geol LeeDae Won MoonHyegeun Min
    • G01N23/203
    • G01N23/2255
    • A quantification method of functional groups in an organic thin layer includes: a) measuring an absolute quantity per unit area of an analysis reference material having functional groups included in a reference organic thin layer by means of MEIS spectroscopy; b) carrying out spectrometry for the same reference organic thin layer as in a) and thereby obtaining peak intensities of the functional groups in the reference organic thin layer; c) carrying out the same spectrometry as in b) for an organic thin layer to be analyzed having the same functional groups and thereby measuring peak intensities of the functional groups with unknown quantity; and d) comparing the peak intensities of the functional groups measured in b) with respect to the absolute quantity of the analysis reference material in a) and thereby determining the absolute quantity per unit area of the functional groups with unknown quantity measured in c).
    • 有机薄层中的官能团的定量方法包括:a)通过MEIS光谱测量具有包括在参考有机薄层中的官能团的分析参考材料的每单位面积的绝对量; b)进行与a)相同的参考有机薄层的光谱测定,从而获得参考有机薄层中的官能团的峰值强度; c)进行与b)相同的光谱测定,对于具有相同官能团的待分析有机薄层,从而测量具有未知量的官能团的峰强度; 和d)比较a)中测定的官能团的峰强度相对于分析参考物质的绝对量,从而确定在c)中测量的具有未知量的官能团的每单位面积的绝对量。
    • 10. 发明申请
    • Mass Spectrometric Method for Matrix-Free Laser Desorption/Ionization of Self-Assembled Monolayers
    • 自组装单层无矩阵激光解吸/电离质谱法
    • US20110101217A1
    • 2011-05-05
    • US12988925
    • 2009-04-24
    • Sang Yun HanTae Geol LeeDae Won Moon
    • Sang Yun HanTae Geol LeeDae Won Moon
    • H01J49/00
    • G01N33/6851G01N2610/00H01J49/0418
    • Disclosed is a method for carrying out matrix-free mass spectrometry, which includes subjecting an analyte sample containing a self-assembled monolayer on the surface of a substrate to laser desorption/ionization. The method for carrying out matrix-free mass spectrometry involves simple pretreatment of an analyte sample with a cationic solution without using any solid matrix to cause effective laser desorption/ionization of the analyte sample, and minimizes a biochemical and physiological change in the sample that may occur during the pretreatment of the sample. In addition, the method is applicable to quantitative analysis because it provides high reproducibility of the results by virtue of the uniform treatment with the cationic solution over the whole areas of the sample. Further, the method enables two-dimensional mapping analysis.
    • 公开了一种进行无基质质谱的方法,其包括使含有自组装单层的分析物样品在基板的表面上进行激光解吸/电离。 用于进行无基质质谱的方法包括用阳离子溶液简单地预处理分析物样品,而不使用任何固体基质来引起分析物样品的有效激光解吸/电离,并且最小化样品中的生物化学和生理变化, 在样品的预处理期间发生。 此外,该方法适用于定量分析,因为通过在样品的整个区域上的阳离子溶液的均匀处理,提供了高结果的再现性。 此外,该方法能够进行二维映射分析。