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1. 发明申请

US20110163228A1 QUANTIFICATION METHOD OF FUNCTIONAL GROUPS OF ORGANIC LAYER 有权
标题翻译：有机层功能组数量化方法
公开(公告)号：US20110163228A1
公开(公告)日：2011-07-07
申请号：US13063616
申请日：2009-09-24
申请人： Tae Geol Lee , Dae Won Moon , Hyegeun Min
发明人： Tae Geol Lee , Dae Won Moon , Hyegeun Min
IPC分类号： H01J49/40 , G01N23/225
CPC分类号： G01N23/2255
摘要： A quantification method of functional groups in an organic thin layer includes: a) measuring an absolute quantity per unit area of an analysis reference material having functional groups included in a reference organic thin layer by means of MEIS spectroscopy; b) carrying out spectrometry for the same reference organic thin layer as in a) and thereby obtaining peak intensities of the functional groups in the reference organic thin layer; c) carrying out the same spectrometry as in b) for an organic thin layer to be analyzed having the same functional groups and thereby measuring peak intensities of the functional groups with unknown quantity; and d) comparing the peak intensities of the functional groups measured in b) with respect to the absolute quantity of the analysis reference material in a) and thereby determining the absolute quantity per unit area of the functional groups with unknown quantity measured in c).
摘要翻译：有机薄层中的官能团的定量方法包括：a）通过MEIS光谱测量具有包括在参考有机薄层中的官能团的分析参考材料的每单位面积的绝对量; b）进行与a）相同的参考有机薄层的光谱测定，从而获得参考有机薄层中的官能团的峰值强度; c）进行与b）相同的光谱测定，对于具有相同官能团的待分析有机薄层，从而测量具有未知量的官能团的峰强度; 和d）比较a）中测定的官能团的峰强度相对于分析参考物质的绝对量，从而确定在c）中测量的具有未知量的官能团的每单位面积的绝对量。

2. 发明授权

US08450684B2 Quantification method of functional groups of organic layer 有权
标题翻译：有机层官能团的定量方法
公开(公告)号：US08450684B2
公开(公告)日：2013-05-28
申请号：US13063616
申请日：2009-09-24
申请人： Tae Geol Lee , Dae Won Moon , Hyegeun Min
发明人： Tae Geol Lee , Dae Won Moon , Hyegeun Min
IPC分类号： G01N23/203
CPC分类号： G01N23/2255
摘要： A quantification method of functional groups in an organic thin layer includes: a) measuring an absolute quantity per unit area of an analysis reference material having functional groups included in a reference organic thin layer by means of MEIS spectroscopy; b) carrying out spectrometry for the same reference organic thin layer as in a) and thereby obtaining peak intensities of the functional groups in the reference organic thin layer; c) carrying out the same spectrometry as in b) for an organic thin layer to be analyzed having the same functional groups and thereby measuring peak intensities of the functional groups with unknown quantity; and d) comparing the peak intensities of the functional groups measured in b) with respect to the absolute quantity of the analysis reference material in a) and thereby determining the absolute quantity per unit area of the functional groups with unknown quantity measured in c).
摘要翻译：有机薄层中的官能团的定量方法包括：a）通过MEIS光谱测量具有包括在参考有机薄层中的官能团的分析参考材料的每单位面积的绝对量; b）进行与a）相同的参考有机薄层的光谱测定，从而获得参考有机薄层中的官能团的峰值强度; c）进行与b）相同的光谱测定，对于具有相同官能团的待分析有机薄层，从而测量具有未知量的官能团的峰强度; 和d）比较a）中测定的官能团的峰强度相对于分析参考物质的绝对量，从而确定在c）中测量的具有未知量的官能团的每单位面积的绝对量。

3. 发明授权

US07838257B2 Evaluation method of organic or bio-conjugation on nanoparticles using imaging of time-of-flight secondary ion mass spectrometry 有权
标题翻译：使用飞行时间二次离子质谱的成像技术对纳米粒子进行有机或生物共轭的评估方法
公开(公告)号：US07838257B2
公开(公告)日：2010-11-23
申请号：US12149223
申请日：2008-04-29
申请人： Tea Geol Lee , Hyegeun Min , Dae Won Moon
发明人： Tea Geol Lee , Hyegeun Min , Dae Won Moon
IPC分类号： G01N33/53 , G01N33/543
CPC分类号： G01N33/54346 , G01N33/54353 , H01J49/0004 , Y10T436/143333 , Y10T436/24
摘要： A method of evaluating conjugation between materials using imaging of time-of-flight secondary ion mass spectrometry (TOF-SIMS) according to the present invention is carried out by following the steps, a) forming a spontaneous pattern on a substrate with a mixture containing nanoparticles and a conjugation material selected from organic, bio or inorganic material, b) obtaining an ion detection pattern from the conjugation material and nanoparticles, respectively, depending on their position on the substrate by using time-of-flight secondary ion mass spectrometry, and c) determining whether the conjugation is formed between the conjugation material and nanoparticles by comparing the ion detection pattern of the conjugation material with the ion detection pattern of the nanoparticles.
摘要翻译：使用根据本发明的飞行时间二次离子质谱（TOF-SIMS）成像的材料之间的共轭的方法通过以下步骤进行：a）在基底上形成自发图案，其中含有纳米颗粒和选自有机，生物或无机材料的共轭材料，b）通过使用飞行时间二次离子质谱法分别根据它们在基底上的位置从共轭材料和纳米颗粒获得离子检测图案，以及 c）通过将共轭材料的离子检测图案与纳米颗粒的离子检测图案进行比较来确定共轭材料和纳米颗粒之间是否形成共轭。

4. 发明申请

US20090148862A1 Evaluation method of organic or bio-conjugation on nanoparticles using imaging of time-of-flight secondary ion mass spectrometry 有权
公开(公告)号：US20090148862A1
公开(公告)日：2009-06-11
申请号：US12149223
申请日：2008-04-29
申请人： Tea Geol Lee , Hyegeun Min , Dae Won Moon
发明人： Tea Geol Lee , Hyegeun Min , Dae Won Moon
IPC分类号： G01N33/53 , G01N24/00 , G01N33/68 , G01N33/00
CPC分类号： G01N33/54346 , G01N33/54353 , H01J49/0004 , Y10T436/143333 , Y10T436/24
摘要： A method of evaluating conjugation between materials using imaging of time-of-flight secondary ion mass spectrometry (TOF-SIMS) according to the present invention is carried out by following the steps which comprise, a) forming a spontaneous pattern on a substrate with a mixture comprising nanoparticles and a conjugation material selected from organic, bio or inorganic material, b) obtaining an ion detection pattern from said conjugation material and said nanoparticles, respectively, depending on their position on the substrate by using time-of-flight secondary ion mass spectrometry, and c) determining whether the conjugation is formed between said conjugation material and said nanoparticles by comparing the ion detection pattern of said conjugation material with the ion detection pattern of said nanoparticles.Said method for evaluating conjugation between two materials according to the present invention can be used for determining whether the conjugation is formed between nanoparticles and an organic, bio or inorganic material. In addition, it can be used for determining whether the conjugation is formed between organic and inorganic materials, inorganic and inorganic material, organic and organic materials or organic and bio materials that are conjugated to nanoparticles, respectively. Further, conjugation level and an amount of conjugated material can be determined both quantitatively and qualitatively, and a progress for forming conjugation can be also determined. Most of all, when multi-step conjugation and substitution are accompanied, not only the presence or the absence of a conjugation (or substitution) of a specific material and an identity of the conjugated (or substituted) material can be determined at each step but also the presence or the absence of a material which fell apart from the nanoparticles due to conjugation (or substitution) by other material but remains as an impurity in a solution can be determined. These can be evaluated based on a spatial distribution of conjugation between two materials.

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